Prosecution Insights
Last updated: October 01, 2026

Examiner: MENZ, LAURA MARY

Tech Center 2800 • Art Units: 2813

This examiner grants 88% of resolved cases

Analysis

Laura Mary Menz is an examiner in Art Unit 2813 of Tech Center 2800, with 962 resolved cases. The allowance rate is 87.7 percent, and the interview lift is 8.7 percent. These figures indicate a favorable environment for patent applicants. The 8.7 percent lift suggests that interviews are a productive way to resolve any issues that might arise during the 87.7 percent allowance process.

The median time to allowance is 890 days. This 890 day period, combined with the 87.7 percent allowance rate, suggests a predictable and successful prosecution experience. The 8.7 percent interview lift provides a helpful boost for the cases that face initial difficulties. With 962 resolved cases, the examiner has a significant track record of allowing applications in a timely manner. The 890 day timeline is a reliable benchmark for practitioners in Art Unit 2813.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

87.7%
Allow Rate
+19.7% vs TC avg
979
Total Applications
+8.7%
Interview Lift
890
Avg Prosecution Days
Based on 962 resolved cases, 2023–2026

Rejection Statute Breakdown

3.1%
§101 Eligibility
39.9%
§102 Novelty
27.1%
§103 Obviousness
7.4%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18642368 HIGH EFFICIENCY SINGLE-PHOTON AVALANCHE DIODE (SPAD) PIXEL Non-Final OA Samsung Electronics Co., Ltd.
18229446 SEMICONDUCTOR PACKAGE Non-Final OA Samsung Electronics Co., Ltd.
18350405 SEMICONDUCTOR PACKAGE AND METHOD OF MANUFACTURING THE SAME Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
18612089 DISPLAY APPARATUS Non-Final OA Samsung Display Co., Ltd.
18781581 DISPLAY APPARATUS Non-Final OA LG Display Co., Ltd.
18665786 NITRIDE STRUCTURE AND SEMICONDUCTOR DEVICE Non-Final OA TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
18623419 SEMICONDUCTOR DEVICES AND FABRICATING METHODS THEREOF Non-Final OA YANGTZE MEMORY TECHNOLOGIES CO., LTD.
18767665 OXIDE THIN FILM TRANSISTOR Non-Final OA ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
18529060 DISCONNECTED GATE DIELECTRIC FOR TRANSISTORS Non-Final OA International Business Machines Corporation
18529460 CONNECTING FRONTSIDE CONTACT WITH BACKSIDE CONTACT OF A SOURCE/DRAIN Non-Final OA International Business Machines Corporation
18775002 Customized heat dissipation from different types of integrated circuit dies packaged on a common substrate Non-Final OA Marvell Asia Pte Ltd
18544997 LOW PROFILE DIE TERMINAL WITH BALL DROP SOLDER Non-Final OA Texas Instruments Incorporated
17994446 SENSOR PACKAGE WITH LOW ASPECT RATIO THROUGH SILICON VIA Final Rejection Texas Instruments Incorporated
18514763 COOLING SYSTEM FOR A SEMICONDUCTOR DEVICE ASSEMBLY Non-Final OA Micron Technology, Inc.
18410302 SEMICONDUCTOR DEVICE STRUCTURE AND METHOD OF FABRICATING SAME Non-Final OA Taiwan Semiconductor Manufacturing Company, LTD.
18647736 DEEP TRENCH SIDEWALL PASSIVATION USING CONFORMAL PLASMA DOPING AND LOW-TEMPERATURE THERMAL TREATMENTS Non-Final OA Applied Materials, Inc.

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