Prosecution Insights
Last updated: July 17, 2026
Application No. 18/194,347

SYSTEMS AND METHODS FOR STACK CONSTRUCTION OF A SEMICONDUCTOR DEVICE HAVING REDISTRIBUTION LAYERS IN A SILICON CARRIER

Final Rejection §102
Filed
Mar 31, 2023
Examiner
TRAN, THANH Y
Art Unit
2817
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Advanced Micro Devices Inc.
OA Round
2 (Final)
86%
Grant Probability
Favorable
3-4
OA Rounds
0m
Est. Remaining
95%
With Interview

Examiner Intelligence

Grants 86% — above average
86%
Career Allowance Rate
797 granted / 925 resolved
+18.2% vs TC avg
Moderate +9% lift
Without
With
+9.0%
Interview Lift
resolved cases with interview
Typical timeline
2y 5m
Avg Prosecution
28 currently pending
Career history
952
Total Applications
across all art units

Statute-Specific Performance

§103
63.1%
+23.1% vs TC avg
§102
22.8%
-17.2% vs TC avg
§112
2.2%
-37.8% vs TC avg
Black line = Tech Center average estimate • Based on career data from 925 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . It should be noted that: claim 20 was not in the latest claim set filed on 01/12/2026. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1-6, and 12-17 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by PARK et al. (US 2022/0165722 A1). As to claim 1, PARK et al. disclose a semiconductor device (see Fig. 5), comprising: a substrate (200) (Fig. 5, para. [0025]-[0027]); a plurality of stacked circuit dies (“semiconductor chips” 500, 550) located above the substrate (200) (Fig. 5, para. [0039], [0068]); a carrier (“second base layer” 610) located above one or more dies (“semiconductor chips” 500, 550) of the plurality of stacked circuit dies (Fig. 5, para. [0055]-[0057]); and a plurality of redistribution layers (a plurality of “circuit patterns” 624, Fig. 5) in the carrier (“second base layer” 610) that provide lateral communication for one or more circuit dies (“semiconductor chips” 500, 550) of the plurality of stacked circuit dies (Fig. 5, para. [0057]-[0059], [0075]). As to claim 2, as applied to claim 1 above, PARK et al. disclose in Fig. 5 all claimed limitations including the semiconductor device further comprising: at least one bump (“second connection terminals” 430) located above the substrate (200) and below the one or more dies (“semiconductor chips” 500, 550) of the plurality of stacked circuit dies (Fig. 5, para. [0043], [0045]), and wherein the plurality of redistribution layers (a plurality of “circuit patterns” 624, Fig. 5) in the carrier (“second base layer” 610) provides lateral communication between two or more circuit dies (“semiconductor chips” 500, 550) of the plurality of stacked circuit dies (Fig. 5, para. [0057]-[0059], [0075]). As to claim 3, as applied to claim 1 above, PARK et al. disclose in Fig. 5 all claimed limitations including the limitation: wherein the plurality of redistribution layers (a plurality of “circuit patterns” 624, Fig. 5) in the carrier (“second base layer” 610) provides lateral communication between two or more channels (“vias” 530 & 580) of a circuit die (“semiconductor chip” 500/550) of the plurality of stacked circuit dies (“semiconductor chips” 500, 550) (Fig. 5, para. [0071], [0073], [0089]-[0090]). As to claim 4, as applied to claim 1 above, PARK et al. disclose in Fig. 5 all claimed limitations including the limitation: wherein the carrier (“second base layer” 610) comprises a passive carrier (“second base layer” 610 may include “silicon (Si)”, para. [0056]) (Fig. 5, para. [0056]). As to claim 5, as applied to claim 1 above, PARK et al. disclose in Fig. 5 all claimed limitations including the limitation: wherein the carrier (“second base layer” 610) is attached to the plurality of stacked circuit dies (“semiconductor chips” 500, 550) by hybrid bonding (Fig. 5, para. [0058], [0073], [0075], [0078]). As to claim 6, as applied to claim 1 above, PARK et al. disclose in Fig. 5 all claimed limitations including the limitation: wherein: the plurality of stacked circuit dies (“semiconductor chips” 500, 550) includes layers of circuit dies (“semiconductor chips” 500, 550) all having a same size (see Fig. 5); and the semiconductor device (Fig. 5) has no bridge dies attached between the carrier (“second base layer” 610) and the plurality of stacked circuit dies (“semiconductor chips” 500, 550) (Fig. 5). As to claim 12, PARK et al. disclose a carrier (Fig. 5) comprising: a first redistribution layer (see a first individual “circuit pattern” 624, Fig. 5) in the carrier (“second base layer” 610) (Fig. 5, para. [0057]-[0059]); and a second redistribution layer (see a second individual “circuit pattern” 624, Fig. 5) in the carrier (“second base layer” 610) (Fig. 5, para. [0057]-[0059]), wherein the first redistribution layer (see a first individual “circuit pattern” 624, Fig. 5) and the second redistribution layer (see a second individual “circuit pattern” 624, Fig. 5) are configured, when positioned above at least one die (“semiconductor chip” 500/550) of upon attachment of the carrier (“second base layer” 610) to a plurality of stacked circuit dies (“semiconductor chips” 500, 550) located above a substrate (200), to provide lateral communication for one or more circuit dies (“semiconductor chips” 500, 550) of the plurality of stacked circuit dies (Fig. 5, para. [0057]-[0059]). As to claim 13, as applied to claim 12 above, PARK et al. disclose in Fig. 5 all claimed limitations including the limitation: wherein the carrier (“second base layer” 610) comprises a passive carrier (“second base layer” 610 may include “silicon (Si)”, para. [0056]) (Fig. 5, para. [0056]). As to claim 14, as applied to claim 12 above, PARK et al. disclose in Fig. 5 all claimed limitations including the limitation: wherein the carrier (“second base layer” 610) is attachable to the plurality of stacked circuit dies (“semiconductor chips” 500, 550) by hybrid bonding (Fig. 5, para. [0058], [0073], [0075], [0078]). As to claim 15, as applied to claim 12 above, PARK et al. disclose in Fig. 5 all claimed limitations including the limitation: wherein the carrier (“second base layer” 610) is directly attachable to the plurality of stacked circuit dies (“semiconductor chips” 500, 550) (Fig. 5). As to claim 16, as applied to claims 12 and 15 above, PARK et al. disclose in Fig. 5 all claimed limitations including the limitation: wherein the first redistribution layer (see a first individual “circuit pattern” 624, Fig. 5) and the second redistribution layer (see a second individual “circuit pattern” 624, Fig. 5) are configured to provide lateral communication between two or more circuit dies (“semiconductor chips” 500, 550) of the plurality of stacked circuit dies without any bridge dies being attached between the carrier (“second base layer” 610) and the plurality of stacked circuit dies (“semiconductor chips” 500, 550) (Fig. 5). As to claim 17, as applied to claims 12 and 15 above, PARK et al. disclose in Fig. 5 all claimed limitations including the limitation: wherein the first redistribution layer (see a first individual “circuit pattern” 624, Fig. 5) and the second redistribution layer (see a second individual “circuit pattern” 624, Fig. 5) are configured to provide lateral communication between two or more channels of a circuit die (“semiconductor chip” 500/550) of the plurality of stacked circuit dies (“semiconductor chips” 500, 550) (Fig. 5, para. [0057]-[0059], [0075]). Response to Arguments Applicant’s arguments with respect to claim(s) 1-6, and 12-17 have been considered but are moot because the new ground of rejection does not rely on any reference applied in the prior rejection of record for any teaching or matter specifically challenged in the argument. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure: Tsai et al. (U.S 2023/0154913 A1) disclose the claimed invention (Fig. 32), and Ye et al. (U.S 2007/0045796 A1) disclose the claimed invention (Fig. 3D). Applicant's amendment necessitated the new ground(s) of rejection presented in this Office action. Accordingly, THIS ACTION IS MADE FINAL. See MPEP § 706.07(a). Applicant is reminded of the extension of time policy as set forth in 37 CFR 1.136(a). A shortened statutory period for reply to this final action is set to expire THREE MONTHS from the mailing date of this action. In the event a first reply is filed within TWO MONTHS of the mailing date of this final action and the advisory action is not mailed until after the end of the THREE-MONTH shortened statutory period, then the shortened statutory period will expire on the date the advisory action is mailed, and any nonprovisional extension fee (37 CFR 1.17(a)) pursuant to 37 CFR 1.136(a) will be calculated from the mailing date of the advisory action. In no event, however, will the statutory period for reply expire later than SIX MONTHS from the mailing date of this final action. Contact Information Any inquiry concerning this communication or earlier communications from the examiner should be directed to THANH Y TRAN whose telephone number is (571)272-2110. The examiner can normally be reached M-F, 10am-10pm (flex) (PST). Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Kretelia Graham can be reached at (571)272-5055. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /Thanh Y. Tran/Primary Examiner, Art Unit 2817 April 30, 2026
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Prosecution Timeline

Mar 31, 2023
Application Filed
Sep 10, 2025
Non-Final Rejection mailed — §102
Nov 12, 2025
Applicant Interview (Telephonic)
Nov 19, 2025
Examiner Interview Summary
Jan 12, 2026
Response Filed
May 05, 2026
Final Rejection mailed — §102 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

3-4
Expected OA Rounds
86%
Grant Probability
95%
With Interview (+9.0%)
2y 5m (~0m remaining)
Median Time to Grant
Moderate
PTA Risk
Based on 925 resolved cases by this examiner. Grant probability derived from career allowance rate.

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