Prosecution Insights
Last updated: April 19, 2026
Application No. 18/198,928

CONTAINER, CONTAINER PARTITION PLATE, SUBSTRATE PROCESSING SYSTEM, AND SUBSTRATE TRANSFER METHOD

Non-Final OA §103
Filed
May 18, 2023
Examiner
HAGEMAN, MARK C
Art Unit
3652
Tech Center
3600 — Transportation & Electronic Commerce
Assignee
Tokyo Electron Limited
OA Round
1 (Non-Final)
74%
Grant Probability
Favorable
1-2
OA Rounds
2y 6m
To Grant
90%
With Interview

Examiner Intelligence

Grants 74% — above average
74%
Career Allow Rate
563 granted / 765 resolved
+21.6% vs TC avg
Strong +16% interview lift
Without
With
+16.0%
Interview Lift
resolved cases with interview
Typical timeline
2y 6m
Avg Prosecution
24 currently pending
Career history
789
Total Applications
across all art units

Statute-Specific Performance

§101
0.6%
-39.4% vs TC avg
§103
35.1%
-4.9% vs TC avg
§102
29.0%
-11.0% vs TC avg
§112
29.8%
-10.2% vs TC avg
Black line = Tech Center average estimate • Based on career data from 765 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 103 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 1, 5 is/are rejected under 35 U.S.C. 103 as being unpatentable over US 9,881,820 to Wong in view of US 8,892,242 to Kimura. Regarding claim 1 Wong discloses a system of processing a substrate comprising; a vacuum processing chamber (104) configured to provide a processing space where a consumable is disposed and the substrate is processed (see e.g., figures and processing modules 112, 114, 116 etc.); a container (108/115) configured to accommodate the consumable or the substrate; an arm (103/105) disposed on a transfer path between the vacuum processing chamber and the container, and configured to transfer the consumable or the substrate; a detector (col. 51 line 64 to col. 52 line 2). Wong discusses a detector/camera for mapping the contents of the pods but does not specifically disclose a detector including a light emitting part disposed at a first end of a pick connected to a tip end of the arm and a light receiving part connected to a second end of the pick; and a controller configured to control the detector to detect a thickness of a component in the container and to stop a transfer of the substrate by the arm when the detected thickness exceeds a threshold. Kimura teaches a wafer handling system including a detector including a light emitting part (13a) disposed at a first end of a pick connected to a tip end of the arm and a light receiving part (13b) connected to a second end of the pick (figure 3); and a controller configured to control the detector to detect a thickness of a component in the container and to stop a transfer of the substrate by the arm when the detected thickness exceeds a threshold (see figure 8 and col. 9 lines 6-12 and lines 22-29, when obliquely stored or overlapping wafers are detected the process stops and notifies the operator for corrective action) to allow an operator to correct any issues and prevent damage to the articles being handled (col 6 lines 12-17). It would have been obvious to one of ordinary skill in the art prior to the effective filing date of Applicants’ claim to have modified Wong to include a detector including a light emitting part disposed at a first end of a pick connected to a tip end of the arm and a light receiving part connected to a second end of the pick; and a controller configured to control the detector to detect a thickness of a component in the container and to stop a transfer of the substrate by the arm when the detected thickness exceeds a threshold, as taught by Kimura, to allow an operator to correct any issues and prevent damage to the articles being handled. Regarding claim 5 the combination discloses the consumable or the substrate is loaded and unloaded in one direction (items are loaded/unloaded through the front opening of the pods). Claim(s) 2-4 and 6-14 is/are rejected under 35 U.S.C. 103 as being unpatentable over Wong and Kimura and further in view of US 9,455,167 to Inoue. Regarding claim 2 Wong and Kimura teach all the limitations except the container comprises a partition plate including a first portion formed to be disposed between the light emitting part and the light receiving part. Inoue teaches an accommodation cassette including a container (1) comprises a partition plate (25, see figure 3) including a first portion formed to be disposed between the light emitting part and the light receiving part (see notched area in figure 3) in order to provide for processing of smaller wafers via attachment tapes (see col. 1 lines 15-20). It would have been obvious to one of ordinary skill in the art prior to the effective filing date of Applicants’ claim to have modified Wong and Kimura to include the container comprises a partition plate including a first portion formed to be disposed between the light emitting part and the light receiving part, as taught by Inoue, in order to provide for processing of smaller wafers via attachment tapes. Regarding claim 3 the combination teaches the container comprises multiple holding portions configured to respectively accommodate the consumable or the substrate (see e.g., Wong figure 11). Regarding claim 4 the combination teaches the partition plate is accommodated in one of the multiple holding portions (see Inoue figures 1-2). Regarding claims 6, 7, 10 it is noted that neither the substrate or the consumable is claimed and that they represent the article/s being handled. The combined system could handle a substrate/consumable meeting these criteria and thus reads on the claim. See MPEP 2114 and 2115. If the Applicant wants to claim the relative thickness of the partition plate and either the substrate or the consumable as a structural limitation of the claim, the substrate/consumable should be positively recited as an element of the claim having a specific thickness. Regarding claim 8 the combination teaches the partition plate is in contact with a wall surface of the container and separates an inner space of the container into a first space including a part of the multiple holding portions and a second space including the other part of the multiple holding portions (see Inoue figure 2, space above and below frame 22a which is in contact with the walls at the sides of the pod). Regarding claims 9, 12 and 14 the combination teaches the first portion is formed to be disposed between two notches (see Inoue figure 3) having shapes corresponding to shapes of the light emitting part and the light receiving part, respectively (see Kimura figure 3). Regarding claims 11 and 13 see claims 3 and 8 above as claims 11 and 13 contain the same limitations of claims 3 and 8. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. Cited prior art includes other pods having partitions as well as various mapping sensors for mapping pod contents and controlling the transfer of items based on the result of the mapping. Any inquiry concerning this communication or earlier communications from the examiner should be directed to MARK C HAGEMAN whose telephone number is (571)272-5547. The examiner can normally be reached Mon-Fri 8:15-4:45 (PST). Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Saul Rodriguez can be reached at 571-272-7097. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /MARK C HAGEMAN/Primary Examiner, Art Unit 3652
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Prosecution Timeline

May 18, 2023
Application Filed
Dec 31, 2025
Non-Final Rejection — §103 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

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TIRE HANDLER HAVING TIRE LAY FLAT CAPABILITY
2y 5m to grant Granted Mar 17, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
74%
Grant Probability
90%
With Interview (+16.0%)
2y 6m
Median Time to Grant
Low
PTA Risk
Based on 765 resolved cases by this examiner. Grant probability derived from career allow rate.

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