Prosecution Insights
Last updated: April 19, 2026
Application No. 18/206,858

SEMICONDUCTOR PACKAGE STRUCTURE, FABRICATING METHOD THEREOF, AND MEMORY SYSTEM

Non-Final OA §102§112§Other
Filed
Jun 07, 2023
Examiner
MENZ, LAURA MARY
Art Unit
2813
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Yangtze Memory Technologies Co. Ltd.
OA Round
1 (Non-Final)
87%
Grant Probability
Favorable
1-2
OA Rounds
2y 6m
To Grant
96%
With Interview

Examiner Intelligence

Grants 87% — above average
87%
Career Allow Rate
805 granted / 922 resolved
+19.3% vs TC avg
Moderate +8% lift
Without
With
+8.2%
Interview Lift
resolved cases with interview
Typical timeline
2y 6m
Avg Prosecution
29 currently pending
Career history
951
Total Applications
across all art units

Statute-Specific Performance

§101
2.3%
-37.7% vs TC avg
§103
27.0%
-13.0% vs TC avg
§102
51.0%
+11.0% vs TC avg
§112
7.9%
-32.1% vs TC avg
Black line = Tech Center average estimate • Based on career data from 922 resolved cases

Office Action

§102 §112 §Other
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Election/Restrictions Applicant’s election without traverse of claims 12-19 in the reply filed on 9/22/25 is acknowledged. Claim Rejections - 35 USC § 112 The following is a quotation of 35 U.S.C. 112(b): (b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention. The following is a quotation of 35 U.S.C. 112 (pre-AIA ), second paragraph: The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention. Claims 12-19 are rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention. Claim 12 is recited below (emphasis is added for purposes of clarity): 12. A semiconductor package structure, comprising: a package substrate; a first package layer formed on the package substrate; and a die package device comprising a second package layer and a die device and in the package layer; wherein the first package layer completely covers the die package device, and the die device is electrically connected with the package substrate. Since Applicant previously recited both a first and second package layer- the package layer renders the claim indefinite. The meets and bounds of the claim cannot be determined- it is unclear whether the Applicant intends for the package layer to pertain to the first or second package layer. Claims 13-19 depend from indefinite claim 12 and therefore are also rendered indefinite. For purposes of examination, the Examiner is interpreting that “the package layer” refers to the first package layer. Moreover, please note that the phrasing: “a die package device comprising a second package layer and a die device and in the package layer;” is a bit awkward. The awkward phrasing does not give rise to a 112 problem (the Examiner can assess the meets/bounds of the language). However, the Examiner recommends (but does not require) that the Applicant revise this awkward phrasing. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 12-14 is/are rejected under 35 U.S.C. 102a1 as being anticipated by Kelly et al (US 2014/0134804). 12. A semiconductor package structure, comprising: a package substrate (Fig.1A (103) and [0023]); a first package layer (Fig.1A (113) and [0023]) formed on the package substrate (Fig.1A (103) and [0023]); and a die package device (Fig.1A (101) and [0023]) comprising a second package layer (Fig.1A (107) and [0023]) and a die device (Fig.1A (101) and [0023]) and in the package layer (Fig.1A (113) and [0023]); wherein the first package layer (Fig.1A (113) and [0023]) completely covers the die package device (Fig.1A (101) and [0023]) , and the die device (Fig.1A (101) and [0023]) is electrically connected with the package substrate (Fig.1A (103) and [0023]). 13. The semiconductor package structure of claim 12, further comprising: first connection lines (Fig.1A (115) and [0025]) embedded in the second package layer (Fig.1A (107) and [0023]) and electrically connected with the die device (Fig.1A (101) and [0023-0024]); and second connection lines (Fig.1A (117/109) and [0024-0025]) and electrically connected between the first connection lines (Fig.1A (115) and [0025]) and the package substrate (Fig.1A (103) and [0023]). 14. The semiconductor package structure of claim 13, wherein the die device comprises: a plurality of dies stacked (Fig.1B-1E (DRAM/122/127) and [0030/0033]) with each other by first adhesive layers (Fig.1C-1E (129) and [0033]); and a plurality of connection pads [Fig.1B-1E (109/131) and 0033-0036]) on each of the plurality of dies and electrically connected with the first connection lines (Fig.1A (115) and [0025]) [see also 0036]. Claim(s) 12-16, 18-19 is/are rejected under 35 U.S.C. 102a1 as being anticipated by Yap (US 2015/0076700). 12. A semiconductor package structure, comprising: a package substrate (Fig.9 (114/118) and [0032]); a first package layer (Fig.9 (112) and [0032]) formed on the package substrate (Fig.9 (114/118) and [0032]); and a die package device (Fig.9 (100/108/120) and [0032]) comprising a second package layer (Fig.9 (106/118) and [0032]) and a die device (Fig.9 (108/120) and [0032]) and in the package layer (Fig.9 (106/118) and [0032]); wherein the first package layer (Fig.9 (112) and [0032]) completely covers the die package device (Fig.9 (100/108/120) and [0032]) , and the die device (Fig.9 (108/120) and [0032]) is electrically connected with the package substrate (Fig.9 (114/118) and [0032]). 13. The semiconductor package structure of claim 12, further comprising: first connection lines (Fig.9 (110) and [0032]) embedded in the second package layer (Fig.9 (106/118) and [0032]) and electrically connected with the die device (Fig.9 (108/120) and [0032]); and second connection lines (Fig.9 (128/126) and [0032-0033]) and electrically connected between the first connection lines (Fig.9 (110) and [0032]) and the package substrate (Fig.9 (114/118) and [0032]). 14. The semiconductor package structure of claim 13, wherein the die device comprises: a plurality of dies stacked (Fig.9 (120/108) and [0032-0033]) with each other by first adhesive layers (Fig.9 (144) and [0034]); and a plurality of connection pads [Fig.9 (26- but unlabeled- see also Fig.1 (26)) and 0017]) on each of the plurality of dies (Fig.9 (120/108) and [0032-0033]) and electrically connected with the first connection lines (Fig.9 (110) and [0032]). 15. The semiconductor package structure of claim 14, wherein: the plurality of connection pads (Fig.9 (26- but unlabeled- see also Fig.1 (26)) and 0017]) face the package substrate (Fig.9 (114/118) and [0032]); the second package layer (Fig.9 (106/118) and [0032]) is attached to package substrate (Fig.9 (114/118) and [0032]) by a second adhesive layer (Fig.9 (144) and [0034]). 16. The semiconductor package structure of claim 15, further comprising: a residual adhesive layer (Fig.1 (24) and Fig. 9 (144) and [0018/0034]) on a first side of the die device (Fig.9 (108/120) and [0032]) away from the package substrate (Fig.9 (114/118) and [0032]), and sandwiched between the first package layer (Fig.9 (112) and [0032]) and the die device (Fig.9 (108/120) and [0032]). 18. The semiconductor package structure of claim 14, further comprising: a residual adhesive layer (Fig.1 (24) and Fig. 9 (144) and [0018/0034]) on a second side of the die device (Fig.9 (108/120) and [0032]) adjacent to the package substrate (Fig.9 (114/118) and [0032]); and a second adhesive layer (Fig. 9 (144) and [0034]) sandwiched between the package substrate (Fig.9 (114/118) and [0032]) and the die device (Fig.9 (108/120) and [0032]); wherein the residual adhesive layer is in contact with the adhesive layer (Fig.1 (24) and Fig. 9 (144) and [0018/0034]). 19. The semiconductor package structure of claim 18, wherein: the second connection lines (Fig.9 (128/126) and [0032-0033]) are embedded in the second adhesive layer (Fig. 9 (144) and [0034]); and the plurality of connection pads (Fig.9 (26- but unlabeled- see also Fig.1 (26)) and 0017]) face away the package substrate (Fig.9 (114/118) and [0032]). Allowable Subject Matter Prior art fails to teach nor suggest the limitations of claims 12, 13, 14, 15, 16 and 17 in combination as required by the dependency of claim 17. The 112 rejection of claim 17 still applies; however Applicant should note the existence of allowable subject matter, in the event that the 112 rejection is successfully resolved. Claim 17 is recited below: 17. The semiconductor package structure of claim 16, wherein: the second connection lines are embedded in the first package layer; the first connection lines and the second connection lines are connected with each other at an interface between the first package layer and the second package layer; and a vertical distance from a highest point of the second connection lines to the package substrate is greater than a thickness of the die package device in a stacking direction. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. Xu (CN 113013021); Iwamoto (US 20170271231) and Yeh et al (US 2022/0367311) teach similar structures. Any inquiry concerning this communication or earlier communications from the examiner should be directed to LAURA M MENZ whose telephone number is (571)272-1697. The examiner can normally be reached Monday-Friday 7:00-3:30. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Steven Gauthier can be reached at 571-270-0373. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /LAURA M MENZ/Primary Examiner, Art Unit 2813 12/11/25
Read full office action

Prosecution Timeline

Jun 07, 2023
Application Filed
Dec 14, 2025
Non-Final Rejection — §102, §112, §Other (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
87%
Grant Probability
96%
With Interview (+8.2%)
2y 6m
Median Time to Grant
Low
PTA Risk
Based on 922 resolved cases by this examiner. Grant probability derived from career allow rate.

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