Prosecution Insights
Last updated: April 19, 2026
Application No. 18/310,425

PACKAGE SUBSTRATE HAVING ELECTRONIC COMPONENT MOUNTED IN A CAVITY OF A CORE OF THE PACKAGE SUBSTRATE WITH A RESIN

Final Rejection §103
Filed
May 01, 2023
Examiner
RODRIGUEZ VILLANU, SANDRA MILENA
Art Unit
2898
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Qualcomm Incorporated
OA Round
2 (Final)
89%
Grant Probability
Favorable
3-4
OA Rounds
2y 11m
To Grant
99%
With Interview

Examiner Intelligence

Grants 89% — above average
89%
Career Allow Rate
98 granted / 110 resolved
+21.1% vs TC avg
Moderate +10% lift
Without
With
+10.3%
Interview Lift
resolved cases with interview
Typical timeline
2y 11m
Avg Prosecution
36 currently pending
Career history
146
Total Applications
across all art units

Statute-Specific Performance

§103
49.7%
+9.7% vs TC avg
§102
27.4%
-12.6% vs TC avg
§112
21.4%
-18.6% vs TC avg
Black line = Tech Center average estimate • Based on career data from 110 resolved cases

Office Action

§103
DETAILED ACTION General Remarks The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Response to Amendment The Amendment filed on 01/26/2026 has been entered. Applicant's amendment has overcome the Claims 112 (b) rejections previously set forth in the Non-Final Office Action dated on 10/17/2025. Claims 2-4, 10-11,19-22 and 24 are canceled by Applicant. Claims 1,5-9, 12-18,23 and 25-30 are pending. Response to Arguments Applicant's arguments "Applicant Arguments/Remarks Made in an Amendment" with the "Amendment/Req. Reconsideration-After Non-Final Reject" filed on 01/26/2026, have been fully considered, the arguments are not persuasives and some of them are moot because do not apply to new ground of rejections with references of the record, JP 2007067369 A to Yamamoto and US 20240222213 A1 to Boja, being used in the current rejection, see detail below. Election/Restrictions Applicant’s amendment of claims 9 and 23 with its dependent claims 12-13 and 25, respectively, directed to an invention that is independent or distinct from the invention originally claimed for the following reasons: claim 9 has limitations of "a second cured resin layer filling disposed in a third region of the cavity between the first region of the cavity and the second region of the cavity, the second cured resin layer extending between the plurality of exterior sidewalls of the electronic component and the plurality of interior sidewalls of the core, and wherein the first cured resin layer and the second cured resin layer are formed from different resin materials”. Claim 23 has limitations of “a second cured resin layer filling disposed in a third region of the cavity between the first region of the cavity and the second region of the cavity, the second cured resin layer extending between the plurality of exterior sidewalls of the electronic component and the plurality of interior sidewalls of the core, and wherein the first cured resin layer and the second cured resin layer are formed from different resin materials”. These limitations in claims 9 and 23 describe another Species (Fig. 6B) that it is different to Species disclosed in claim 1 (Fig. 4B), then, brings restriction by Species. The requirement is deemed proper, and is therefore made FINAL. Since applicant has received an action on the merits for the originally presented invention, this invention has been constructively elected by original presentation for prosecution on the merits. Accordingly, claims 9,12-13,23 and 25 withdrawn from consideration as being directed to non-elected Species and become an election without traverse. See 37 CFR 1.142(b) and MPEP § 821.03. In view of the above, this office action considers: Claims 1,5-9, 12-18,23 and 25-30 are pending. Claims 9,12-13,23 and 25 are withdrawn, non-elected without traverse. Claim Rejections - 35 USC § 103 The following is a quotation of AIA 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102 of this title, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 1, 5-8, 14-15 and 17-18 is/are rejected under AIA 35 U.S.C. 103 as being unpatentable over Yamamoto et al. (JP 2007067369 A, hereinafter Yamamoto, of the record) in view of Boja (US 20240222213 A1, hereinafter Boja, of the record). Re: Independent Claim 1, Yamamoto teaches an electronic device (Fig. 1), comprising: a substrate (10 a wiring board in [0036], Fig. 1) comprising: a core (11 a substrate core in [0036], Fig. 1) having an upper planar surface and a lower planar surface (Fig. 1), wherein the core (11) includes a cavity (cavity a region including the component 101 in [0036], Fig. 1-Annotated) extending between the upper planar surface of the core (11) and the lower planar surface of the core (11), and wherein the cavity (cavity) is defined by a plurality of interior sidewalls of the core (11); PNG media_image1.png 444 742 media_image1.png Greyscale Yamamoto’s Figure 1-Annotated. an electronic component (101 a ceramic capacitor in [0037], Fig. 1) at least partially disposed (Fig. 1) in the cavity (cavity), wherein the electronic component (101) comprises an upper planar surface having one or more electronic component terminals (116 metallized layers in [0044], Fig. 1), the electronic component (101) further comprising a plurality of exterior sidewalls facing (Fig. 1) the plurality of interior sidewalls of the core (11); a first cured resin layer (first resin-92a a resin filler in [0055], Fig. 1-Annotated), wherein the first cured resin layer (first resin-92a) extends over the upper planar surface of the electronic component (101) and about the electronic component terminals (116), wherein the first cured resin layer (first resin-92a) is further disposed in a first region (Fig. 1-Annotated) of the cavity (cavity) between the plurality of exterior sidewalls of the electronic component (101) and the plurality of interior sidewalls of the core (11); a dielectric fill material (33-f a resin insulating layer filling into the cavity in [0041], Fig. 1-Annotated) disposed in a second region (Fig. 1-Annotated) of the cavity (cavity); and an upper metallization structure disposed (32 a build-up layer including 34,36,38 in [0057], Fig. 1) over the upper planar surface of the core (11), wherein the upper metallization structure (32) is configured to provide one or more conductive paths (Fig. 1-Annotated) from the one or more electronic component terminals (116) to one or more upper metal terminals of the upper metallization structure (32), the upper metallization structure (32) including a lower dielectric layer (34 insulating layer in [0038], Fig. 1), wherein the first cured resin layer (first resin-92a) is further disposed in a region of the cavity (cavity) between (Fig. 1-Annotated) the upper planar surface of the electronic component (101) and a lower surface of the lower dielectric layer (34). Yamamoto does not expressly disclose a dielectric fill material disposed in a second region of the cavity between the plurality of exterior sidewalls of the electronic component and the plurality of interior sidewalls of the core. PNG media_image2.png 314 776 media_image2.png Greyscale Boja’s Figure 1A-Annotated. However, in the same semiconductor device field of endeavor, Boja discloses a dielectric fill material (116c a portion of the first insulation layer 116a in [0035], Fig. 1A) disposed in a second region of the cavity (cavity a region including the component 115a in [0022], Fig. 1A) between (Fig. 1A-Annotated) the plurality of exterior sidewalls of the electronic component (115a active device component in [0022], Fig. 1A) and the plurality of interior sidewalls of the core (102a a monolithic core in [0049], Fig. 1A). It would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to include the Boja’s feature of a dielectric fill material disposed in a second region of the cavity between the plurality of exterior sidewalls of the electronic component and the plurality of interior sidewalls of the core to Yamamoto’s device to facilitate heat dissipation from device components and/or shorten or simply the routing to chiplets and/or further alter the device component's electrical properties ([0020], Boja). Re: Claim 5, Yamamoto modified by Boja discloses the electronic device of claim 1, Yamamoto does not expressly disclose wherein: the electronic component has a height that is greater than or equal to a depth of the core. However, in the same semiconductor device field of endeavor, Boja discloses a wherein: the electronic component (115a active device component in [0022], Fig. 1A) has a height that is greater than or equal (Fig. 1A) to a depth of the core (102a a monolithic core in [0049], Fig. 1A). It would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to include the Boja’s feature wherein: the electronic component has a height that is greater than or equal to a depth of the core to Yamamoto’s device to facilitate heat dissipation from device components and/or shorten or simply the routing to chiplets and/or further alter the device component's electrical properties ([0020], Boja). Re: Claim 6, Yamamoto modified by Boja discloses the electronic device of claim 5, wherein: the core (11, Yamamoto) has a thickness equal to or less than 760 micrometers (a thickness less than of 1mm in [0049], Fig. 1, Yamamoto). Re: Claim 7, Yamamoto modified by Boja discloses the electronic device of claim 1, further comprising: a lower metallization structure (31 a build-up layer including 33,35,37 in [0041], Fig. 1, Yamamoto) disposed below the lower planar surface of the core (11 Yamamoto), wherein the lower metallization structure (31 Yamamoto) is configured to provide one or more conductive paths from a patterned metallization layer (42 conductor layers in [0037], Fig. 1 Yamamoto) disposed over the lower planar surface of the core to one or more lower metal terminals of the lower metallization structure (31 Yamamoto), the lower metallization structure (31 Yamamoto) comprising an upper dielectric layer (33 an insulating layer in [0041], Fig. 1, Yamamoto) disposed over and adjacent the lower planar surface of the core (11, Yamamoto). Re: Claim 8, Yamamoto modified by Boja discloses the electronic device of claim 7, wherein: the dielectric fill material (33f Yamamoto) comprises a same dielectric material (33-f made of the same material of 33, Fig. 1-Annotated) as the upper dielectric layer (33 an insulating layer in [0041], Fig. 1, Yamamoto) of the lower metallization structure (31 Yamamoto). Re: Claim 14, Yamamoto modified by Boja discloses the electronic device of claim 1, further comprising: one or more metal vias (16 through-hole conductors in [0036], Fig. 1, Yamamoto) extending between (Fig. 1, Yamamoto) the upper planar surface of the core (11, Yamamoto) and the lower planar surface of the core (11, Yamamoto). Re: Claim 15, Yamamoto modified by Boja discloses the electronic device of claim 1, further comprising: an electronic circuit package (motherboard, a plurality of solder bumps 49 are arranged on the surface of the BGA pad 48 for electrical connection to a motherboard in [0038], Fig.1, Yamamoto) mounted at the one or more upper metal terminals of the upper metallization structure (32, Yamamoto). Re: Claim 17, Yamamoto modified by Boja discloses the electronic device of claim 1, wherein the electronic device comprises at least one of: a music player, a video player, an entertainment unit, a navigation device, a communications device, a mobile device, a mobile phone, a smartphone, a personal digital assistant, a fixed location terminal, a tablet computer, a computer, a wearable device, a laptop computer, a server, an internet of things (IoT) device, or a device in an automotive vehicle (a computer in [0002] , Yamamoto). Re: Independent Claim 18, Yamamoto teaches a substrate (Fig. 1), comprising: a substrate (10 a wiring board in [0036], Fig. 1) comprising: a core (11 a substrate core in [0036], Fig. 1) having an upper planar surface and a lower planar surface (Fig. 1), wherein the core (11) includes a cavity (cavity a region including the component 101 in [0036], Fig. 1-Annotated) extending between the upper planar surface of the core (11) and the lower planar surface of the core (11), and wherein the cavity (cavity) is defined by a plurality of interior sidewalls of the core (11); an electronic component (101 a ceramic capacitor in [0037], Fig. 1) at least partially disposed (Fig. 1) in the cavity (cavity), wherein the electronic component (101) comprises an upper planar surface having one or more electronic component terminals (116 metallized layers in [0044], Fig. 1), the electronic component (101) further comprising a plurality of exterior sidewalls facing (Fig. 1) the plurality of interior sidewalls of the core (11); a first cured resin layer (first resin-92a a resin filler in [0055], Fig. 1-Annotated), wherein the first cured resin layer (first resin-92a) extends over the upper planar surface of the electronic component (101) and about the electronic component terminals (116), wherein the first cured resin layer (first resin-92a) is further disposed in a first region (Fig. 1-Annotated) of the cavity (cavity) between the plurality of exterior sidewalls of the electronic component (101) and the plurality of interior sidewalls of the core (11); a dielectric fill material (33-f a resin insulating layer filling into the cavity in [0041], Fig. 1-Annotated) disposed in a second region (Fig. 1-Annotated) of the cavity (cavity); and an upper metallization structure disposed (32 a build-up layer including 34,36,38 in [0057], Fig. 1) over the upper planar surface of the core (11), wherein the upper metallization structure (32) is configured to provide one or more conductive paths (Fig. 1-Annotated) from the one or more electronic component terminals (116) to one or more upper metal terminals of the upper metallization structure (32) ), the upper metallization structure (32) including a lower dielectric layer (34 insulating layer in [0038], Fig. 1), wherein the first cured resin layer (first resin-92a) is further disposed in a region of the cavity (cavity) between (Fig. 1-Annotated) the upper planar surface of the electronic component (101) and a lower surface of the lower dielectric layer (34). Yamamoto does not expressly disclose a dielectric fill material disposed in a second region of the cavity between the plurality of exterior sidewalls of the electronic component and the plurality of interior sidewalls of the core. However, in the same semiconductor device field of endeavor, Boja discloses a dielectric fill material (116c a portion of the first insulation layer 116a in [0035], Fig. 1A) disposed in a second region of the cavity (cavity a region including the component 115a in [0022], Fig. 1A) between (Fig. 1A-Annotated) the plurality of exterior sidewalls of the electronic component (115a active device component in [0022], Fig. 1A) and the plurality of interior sidewalls of the core (102a a monolithic core in [0049], Fig. 1A). It would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to include the Boja’s feature of a dielectric fill material disposed in a second region of the cavity between the plurality of exterior sidewalls of the electronic component and the plurality of interior sidewalls of the core to Yamamoto’s device to facilitate heat dissipation from device components and/or shorten or simply the routing to chiplets and/or further alter the device component's electrical properties ([0020], Boja). Claim(s) 16 and 26 is/are rejected under AIA 35 U.S.C. 103 as being unpatentable over Yamamoto in view of Boja and further in view of Hsieh (US 20210159187 A1, hereinafter Hsieh, of the record). Re: Claim 16, Yamamoto discloses the electronic device of claim 1, Yamamoto does not expressly disclose wherein: the electronic component comprises a deep trench capacitor. However, in the same semiconductor device field of endeavor, Hsieh discloses a wherein: the electronic component comprises a deep trench capacitor (30 a deep trench capacitor in [0029], Fig. 1). It would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to include the Hsieh’s feature wherein: the electronic component comprises a deep trench capacitor to Yamamoto’s device to provides a more efficient use of space for the semiconductor device ([0026], Hsieh). Re: Claim 26, Yamamoto discloses the substrate of claim 18, Yamamoto does not expressly disclose wherein: the electronic component comprises a deep trench capacitor. However, in the same semiconductor device field of endeavor, Hsieh discloses a wherein: the electronic component comprises a deep trench capacitor (30 a deep trench capacitor in [0029], Fig. 1). It would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to include the Hsieh’s feature wherein: the electronic component comprises a deep trench capacitor to Yamamoto’s device to provides a more efficient use of space for the semiconductor device ([0026], Hsieh). Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure: Kim et al. (US 20150049445 A1) teaches “METHOD FOR MANUFACTURING ELECTRONIC COMPONENT EMBEDDING SUBSTRATE AND ELECTRONIC COMPONENT EMBEDDING SUBSTRATE”. This document is related to an electronic component embedding substrate and an electronic component embedding substrate. Kiwanami et al. (US 20140360760 A1) teaches “WIRING SUBSTRATE AND MANUFACTURING METHOD OF WIRING SUBSTRATE”. This document is related to a wiring substrate includes a core, a first wiring layer formed on a first surface of the core, a second wiring layer formed on a second surface of the core, and an electronic component partially accommodated in the cavity and including a projected portion projected from the first opening of the core. Applicant's amendment necessitated the new ground(s) of rejection presented in this Office action. Accordingly, THIS ACTION IS MADE FINAL. See MPEP § 706.07(a). Applicant is reminded of the extension of time policy as set forth in 37 CFR 1.136(a). A shortened statutory period for reply to this final action is set to expire THREE MONTHS from the mailing date of this action. In the event a first reply is filed within TWO MONTHS of the mailing date of this final action and the advisory action is not mailed until after the end of the THREE-MONTH shortened statutory period, then the shortened statutory period will expire on the date the advisory action is mailed, and any nonprovisional extension fee (37 CFR 1.17(a)) pursuant to 37 CFR 1.136(a) will be calculated from the mailing date of the advisory action. In no event, however, will the statutory period for reply expire later than SIX MONTHS from the mailing date of this final action. Any inquiry concerning this communication or earlier communications from the examiner should be directed to SANDRA M RODRIGUEZ VILLANUEVA whose telephone number is (571)272-1936. The examiner can normally be reached Monday to Friday 8:00am-5:00pm (EST). Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Jessica Manno can be reached at (571) 272-2339. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /SANDRA MILENA RODRIGUEZ VILLANUEVA/Examiner, Art Unit 2898 /JESSICA S MANNO/SPE, Art Unit 2898
Read full office action

Prosecution Timeline

May 01, 2023
Application Filed
Oct 14, 2025
Non-Final Rejection — §103
Jan 26, 2026
Response Filed
Mar 02, 2026
Final Rejection — §103 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12604785
PACKAGE STRUCTURE AND MANUFACTURING METHOD THEREOF
2y 5m to grant Granted Apr 14, 2026
Patent 12588200
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SEMICONDUCTOR DEVICE
2y 5m to grant Granted Mar 24, 2026
Patent 12588488
INTEGRATED CIRCUIT STRUCTURE
2y 5m to grant Granted Mar 24, 2026
Patent 12557279
THREE-DIMENSIONAL MEMORY AND FABRICATION METHOD FOR THE SAME
2y 5m to grant Granted Feb 17, 2026
Patent 12557437
METHOD OF VERTICAL GROWTH OF A III-V MATERIAL
2y 5m to grant Granted Feb 17, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

AI Strategy Recommendation

Get an AI-powered prosecution strategy using examiner precedents, rejection analysis, and claim mapping.
Powered by AI — typically takes 5-10 seconds

Prosecution Projections

3-4
Expected OA Rounds
89%
Grant Probability
99%
With Interview (+10.3%)
2y 11m
Median Time to Grant
Moderate
PTA Risk
Based on 110 resolved cases by this examiner. Grant probability derived from career allow rate.

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month