DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA. Claim Rejections - 35 USC § 112 The following is a quotation of 35 U.S.C. 112(b): (b ) CONCLUSION.— The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention. The following is a quotation of 35 U.S.C. 112 (pre-AIA), second paragraph: The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the appl icant regards as his invention. Claims 4-6 and 22-24 rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention. Claims 4 and 22 recite “a subgraph embedding based on the first subgraph” after previously defining “a first functional embedding for the first subgraph”. The examiner understands that the terms are referring to 2 different embeddings. However, as presented in the claims it is unclear whether the claims are referring to the same embedding or not. The examiner suggests that the claims be reworded to make the intended meaning more clear . Claims 5-6 and 23-24 are dependent on claims 4 or 22, and are rejected for the same reasons. Allowable Subject Matter Claims 1-3, 7-21, and 25-30 allowed. Claims 4-6 and 22-24 would be allowable if rewritten or amended to overcome the rejection(s) under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA), 2nd paragraph, set forth in this Office action. The following is a statement of reasons for the indication of allowable subject matter: The prior art does not teach or suggest a method or system for circuit analysis having the combination of steps/elements in the claims including, among other elements, the generation of subgraphs and functional embedding for a DG with the properties of the claims, in combination with the other design and analysis elements of the claims. Chakrabarty et al. US 2022/0065926 A1 discloses IC testing including DAG mapping and subgraph analysis, without the same generation of subgraphs and functional embedding for a DG with the properties of the claims. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to FILLIN "Examiner name" \* MERGEFORMAT BRYCE M AISAKA whose telephone number is FILLIN "Phone number" \* MERGEFORMAT (571)270-5808 . The examiner can normally be reached FILLIN "Work Schedule?" \* MERGEFORMAT M-F: 6:30AM-5:00PM PT . Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, FILLIN "SPE Name?" \* MERGEFORMAT Jack Chiang can be reached at FILLIN "SPE Phone?" \* MERGEFORMAT (571)272-7483 . The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /BRYCE M AISAKA/ Primary Examiner, Art Unit 2851