Prosecution Insights
Last updated: April 19, 2026
Application No. 18/342,754

PHOTOSENSITIVE RESIN COMPOSITION, PROTECTIVE LAYER AND METHOD FOR PATTERN FORMATION

Non-Final OA §102§103
Filed
Jun 28, 2023
Examiner
CHU, JOHN S Y
Art Unit
1737
Tech Center
1700 — Chemical & Materials Engineering
Assignee
Advanced Echem Materials Company Limited
OA Round
1 (Non-Final)
77%
Grant Probability
Favorable
1-2
OA Rounds
3y 1m
To Grant
82%
With Interview

Examiner Intelligence

Grants 77% — above average
77%
Career Allow Rate
740 granted / 959 resolved
+12.2% vs TC avg
Moderate +5% lift
Without
With
+5.1%
Interview Lift
resolved cases with interview
Typical timeline
3y 1m
Avg Prosecution
65 currently pending
Career history
1024
Total Applications
across all art units

Statute-Specific Performance

§101
0.2%
-39.8% vs TC avg
§103
48.2%
+8.2% vs TC avg
§102
29.9%
-10.1% vs TC avg
§112
12.1%
-27.9% vs TC avg
Black line = Tech Center average estimate • Based on career data from 959 resolved cases

Office Action

§102 §103
DETAILED CORRESPONDENCE This Office action is in response to the election received August 29, 2018. Applicant’s election without traverse of Group I, claims 1-13 in the reply filed on August 29, 2018 is acknowledged. Claims 14-15 are withdrawn from further consideration pursuant to 37 CFR 1.142(b) as being drawn to a nonelected invention, there being no allowable generic or linking claim. Election was made without traverse in the reply filed on August 29, 2018. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale or otherwise available to the public before the effective filing date of the claimed invention. (a)(2) the claimed invention was described in a patent issued under section 151, or in an application for patent published or deemed published under section 122(b), in which the patent or application, as the case may be, names another inventor and was effectively filed before the effective filing date of the claimed invention. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. The factual inquiries set forth in Graham v. John Deere Co., 383 U.S. 1, 148 USPQ 459 (1966), that are applied for establishing a background for determining obviousness under 35 U.S.C. 103 are summarized as follows: 1. Determining the scope and contents of the prior art. 2. Ascertaining the differences between the prior art and the claims at issue. 3. Resolving the level of ordinary skill in the pertinent art. 4. Considering objective evidence present in the application indicating obviousness or nonobviousness. Claims 1-12 are rejected under 35 U.S.C. 103 as being unpatentable over the combination of SCHELER et al (5,306,595), WU et al (2015/0293449) and KAWATA et al (6,013,407) The claimed invention recites the following: PNG media_image1.png 900 664 media_image1.png Greyscale SCHELER et al report a positive photosensitive resin composition comprising an alkali-soluble resin, a photoacid, a sensitizer and a surfactant. Examples found in col. 7, lines 17-50 disclose the resin to be a cresol/xylenol novolak formulated with tetrahydroxy benzophenone esterified with 1,2-naphthoquinone 2-diazide sulfonic acid. Applicants are directed to col. 5, lines 18-23 for suitable non-ionic surfactants to include polyethylene glycol-mono-nonyl phenyl ether and mono-octyl phenyl ether. SCHELER et al lacks the claimed sensitizer. WU et al disclose a photosensitive composition comprising a quinone diazide sulfonic acid ester, a sensitizer in para. [0170] to [0176] and can further include surfactants, [0169]. Applicants are directed to page 9, para. [0173] which disclose a polynuclear branched compound as a sensitizer which meets the claimed sensitizer in claim 7, see below: PNG media_image2.png 84 354 media_image2.png Greyscale WU et al lacks the specific surfactant as recited in claim 1. KAWATA et al disclose a positive resist composition comprising a quinone diazide sulfonate compound, an alkali-soluble phenolic resin and additional phenolic compounds (sensitizer) in col. 9, line 29- col. 10, line 6. These phenolic compounds are equivalents to those disclosed in WU et al such as the triphenols highlighted below: PNG media_image3.png 632 386 media_image3.png Greyscale The surfactant is reported col. 11, lines 16-36 such as polyoxyethylene lauryl ether and polyoxyethylene stearyl ether shown below: PNG media_image4.png 402 390 media_image4.png Greyscale Claims 2-4 and 10 are met by the disclosure in KAWATA et al in col. 5, line 54 for the quinone diazide content in the composition. The alkali-soluble resin content is reported in Table 1, Example 3 for the ratio of the resin to the quinone diazide. The solvent content is reported in page 13, Table 2 of WU et al. Claim 5 is met by the disclosure in SCHELER et al col. 5, lines 18-23 wherein up to 10% by weight includes as low as 0.1%. Claim 6 is met by KAWATA et al in col. 10, lines 54-55 for PGMEA. Claim 7 is met by WU et al as disclosed above on page 5, line 7 of the office action. Claim 8 is met by WU et al on page 9, para. [0177] for the amount of sensitizer in the composition at preferably 10 to 35 parts by weight of the resin, which meets the claimed 1 to 20 parts by weight of the100 parts by weight of the resin. Claim 9 is met by KAWATA et al wherein the surfactants can be contained in one or more in the composition so two non-ionic surfactants meet this claim, see col.11, lines 12-15. Claim 11 and 12 are met by Example 1, col. 15, lines 56- col. 16, line 17 in KAWATA et al wherein the photoresist is coated on a substrate (silicon wafer). It would have been prima facie obvious to one of ordinary skill in the art of photosensitive composition having composition such as disclosed in SCHELER et al or KAWATA et al comprising a quinone diazide photosensitive compound, a phenolic resin, a sensitizer, wherein a sensitizer as reported in WU et al is used in the composition and the surfactants as reported in KAWATA et al in a composition for photoresist pattern formation with the reasonable expectation of same or similar results for a resist composition which is excellent in sensitivity, film loss, resolution, thermal stability and storage stability. The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. EP-0831370 A1 (equivalent to KAWATA et al. (6,013,407)) disclose the structures of formula (I) and (II) omitted in the U.S. patent. Any inquiry concerning this communication or earlier communications from the examiner should be directed to JOHN S CHU whose telephone number is (571)272-1329. The examiner can normally be reached M-F, IFP-Flex. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Mark Huff, can be reached at telephone number 571-272-1385. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of an application may be obtained from the Patent Application Information Retrieval (PAIR) system. Status information for published applications may be obtained from either Private PAIR or Public PAIR. Status information for unpublished applications is available through Private PAIR only. For more information about the PAIR system, see http://portal.uspto.gov/external/portal. Should you have questions about access to the Private PAIR system, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. /John S. Chu/ Primary Examiner, Art Unit 1737 J. Chu January 24, 2026
Read full office action

Prosecution Timeline

Jun 28, 2023
Application Filed
Jan 24, 2026
Non-Final Rejection — §102, §103 (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
77%
Grant Probability
82%
With Interview (+5.1%)
3y 1m
Median Time to Grant
Low
PTA Risk
Based on 959 resolved cases by this examiner. Grant probability derived from career allow rate.

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