Prosecution Insights
Last updated: April 19, 2026
Application No. 18/343,817

BASE, VOLTAGE SAMPLING ASSEMBLY, AND VOLTAGE TESTING APPARATUS

Non-Final OA §102§103
Filed
Jun 29, 2023
Examiner
ZENG, LINGWEN R
Art Unit
1723
Tech Center
1700 — Chemical & Materials Engineering
Assignee
CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
OA Round
1 (Non-Final)
76%
Grant Probability
Favorable
1-2
OA Rounds
3y 1m
To Grant
97%
With Interview

Examiner Intelligence

Grants 76% — above average
76%
Career Allow Rate
398 granted / 522 resolved
+11.2% vs TC avg
Strong +21% interview lift
Without
With
+21.1%
Interview Lift
resolved cases with interview
Typical timeline
3y 1m
Avg Prosecution
22 currently pending
Career history
544
Total Applications
across all art units

Statute-Specific Performance

§101
0.5%
-39.5% vs TC avg
§103
61.6%
+21.6% vs TC avg
§102
24.6%
-15.4% vs TC avg
§112
7.5%
-32.5% vs TC avg
Black line = Tech Center average estimate • Based on career data from 522 resolved cases

Office Action

§102 §103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Priority Receipt is acknowledged of certified copies of papers required by 37 CFR 1.55. Information Disclosure Statement The information disclosure statements (IDS) were submitted on 09/18/2024 and 09/13/2023. The submission is in compliance with the provisions of 37 CFR 1.97. Accordingly, the information disclosure statement is being considered by the examiner. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim 1 is rejected under 35 U.S.C. 102 (a) (1) as being anticipated by US Patent Publication 6,168,470 to Ikeda et al. With respect to claim 1, Ikeda et al. teach a base for mounting a voltage sampling member 22 configured to sample a voltage of a battery cell 1, comprising: a body 17 with 20, provided with a through hole at the wire connecting portion 20 for the voltage sampling member 22 to run through; and a pair of clamping members 18c and 18c’, mounted to the body 17 with 20 for clamping a busbar 16 connected to the battery cell 1 (Ikeda et al.: Column 7, Line 34 – Column 8, Line 22; Fig. 4). Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. The factual inquiries for establishing a background for determining obviousness under 35 U.S.C. 103 are summarized as follows: 1. Determining the scope and contents of the prior art. 2. Ascertaining the differences between the prior art and the claims at issue. 3. Resolving the level of ordinary skill in the pertinent art. 4. Considering objective evidence present in the application indicating obviousness or nonobviousness. Claims 2 and 12-14 are rejected under 35 U.S.C. 103 as being unpatentable over US Patent Publication 6,168,470 to Ikeda et al. With respect to claim 2, Ikeda et al. do not specifically teach the base, wherein the pair of clamping members are provided on two opposite sides of the body in a first direction, the first direction being perpendicular to an axial direction of the through hole. However, the particular rearrangement of clamping members was held to be an obvious matter of design choice. In In re Japikse, 181 F.2d 1019, 86 USPQ 70 (CCPA 1950). With respect to claims 12 and 13, Ikeda et al. do not specifically teach a voltage sampling assembly, comprising: the base; and a voltage sampling member, wherein the voltage sampling member is threaded through the through hole; wherein the through hole is provided with internal threads on the inner wall, and the voltage sampling member is provided with external threads matching the internal threads. However, It would have been obvious as of the effective filing dated of the claimed invention to have the voltage sampling member is threaded through the through hole since it was known in the art that threads in a through hole is one of the most common ways to fasten two components in the art. With respect to claim 14, Ikeda et al. teach a voltage testing apparatus, comprising: a voltage detection circuit (a processing module); and two voltage sampling assemblies, wherein voltage sampling members 22 of the two voltage sampling assemblies are all electrically connected to the voltage detection circuit (the processing module) (Ikeda et al.: Column 7, Line 34 – Column 8, Line 22; Fig. 4). Allowable Subject Matter Claims 3-11 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to LINGWEN R ZENG whose telephone number is (571)272-6649. The examiner can normally be reached 8am-5pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Milton I Cano and Tiffany Legette can be reached on (313) 446-4937 and (571) 270-7078, respectively. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /LINGWEN R ZENG/Examiner, Art Unit 1723 2/17/2026
Read full office action

Prosecution Timeline

Jun 29, 2023
Application Filed
Feb 07, 2026
Non-Final Rejection — §102, §103 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12603351
BATTERY MODULE WITH IMPROVED COOLING PERFORMANCE AND BATTERY PACK INCLUDING THE SAME
2y 5m to grant Granted Apr 14, 2026
Patent 12603397
Seam Welding Structure of Battery Can, Current Collecting Plate, and Cap and Battery Cell Using the Same
2y 5m to grant Granted Apr 14, 2026
Patent 12597683
CURRENT COLLECTOR, BATTERY CELL, BATTERY PACK, AND VEHICLE INCLUDING THE SAME
2y 5m to grant Granted Apr 07, 2026
Patent 12592449
ASSEMBLED BATTERY
2y 5m to grant Granted Mar 31, 2026
Patent 12573676
BATTERY UNIT
2y 5m to grant Granted Mar 10, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
76%
Grant Probability
97%
With Interview (+21.1%)
3y 1m
Median Time to Grant
Low
PTA Risk
Based on 522 resolved cases by this examiner. Grant probability derived from career allow rate.

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