Prosecution Insights
Last updated: May 29, 2026
Application No. 18/343,845

METHOD OF MANUFACTURING SEMICONDUCTOR PACKAGE ASSEMBLY AND A SEMICONDUCTOR PACKAGE ASSEMBLY MANUFACTURED USING THIS METHOD

Non-Final OA §102§103
Filed
Jun 29, 2023
Priority
Jun 29, 2022 — EU 22181793.5
Examiner
CHAMBLISS, ALONZO
Art Unit
2897
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Nexperia B V
OA Round
1 (Non-Final)
90%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
65%
With Interview

Examiner Intelligence

Grants 90% — above average
90%
Career Allowance Rate
1059 granted / 1177 resolved
+22.0% vs TC avg
Minimal -25% lift
Without
With
+-25.1%
Interview Lift
resolved cases with interview
Fast prosecutor
2y 0m
Avg Prosecution
17 currently pending
Career history
1195
Total Applications
across all art units

Statute-Specific Performance

§101
4.0%
-36.0% vs TC avg
§103
52.7%
+12.7% vs TC avg
§102
12.5%
-27.5% vs TC avg
§112
8.7%
-31.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1177 resolved cases

Office Action

§102 §103
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Priority Receipt is acknowledged of certified copies of papers required by 37 CFR 1.55. Drawings The formal drawings filed on 6/29/2023 have been approved by the examiner. Specification The title of the invention is not descriptive. A new title is required that is clearly indicative of the invention to which the claims are directed. The following title is suggested: “ METHOD OF FABRICATING MUTIPLE SEMICONDUCTOR PACKAGE ASSEMBLIES ON A LEAD FRAME ”. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1-4, 9-11, 16, and 20 are rejected under 35 U.S.C. 102(a)(1) as being clearly anticipated by Hor et al. (EP 3786857). With respect to Claims 1 and 2, Hor teaches providing a metallic lead frame fabricated from a metal sheet 206 having a first longitudinal dimension and a second longitudinal dimension. The lead frame composed of a plurality of die paddles 218 forming at least one die paddle column oriented in the first longitudinal dimension and a plurality of terminals (i.e. at the leads end 202) forming at least one terminal column oriented in the first longitudinal dimension. Attaching a plurality of semiconductor die components 216 to each of the plurality of die paddles 218 by adhesive bonding. Connecting the semiconductor die components with the plurality of terminals. Encapsulating 212 the plurality of semiconductor die components 216 by covering at least one pair of the at least one die paddle column and the at least one terminal column with the terminal parts at least partly exposed with dielectric material 212. Thereby forming a single encapsulation block 212 after cutting the device into a plurality of packages) for each pair consisting of the at least one die paddle column and the at least one terminal column. Singulating semiconductor packages by cutting the at least one single encapsulation block in the second longitudinal direction into at least two single semiconductor packages. The cutting line 224 lays at least between the at least two semiconductor die components. Trimming (i.e. creating holes 202) the exposed terminal parts (see paragraphs 20-34; 2a, 2b, 3,and 5b-5e). With respect to Claims 3 and 10, Hor teaches adhesive bonding, eutectic bonding and solder bonding (see paragraphs 11 and 12). With respect to Claims 4, 11, and 16, Hor teaches any one of steps a) to f) is preceded with a step selected from the group consisting of: a surface treatment, a coating with tin, a plating, and a galvanizing step (see paragraphs 12 and 15). With respect to Claim 9, Hor teaches step f is performed by a method selected from the group consisting of laser cutting, mechanic sawing, and rotating blade sawing (see paragraph 32). With respect to Claim 20, Hor teaches wherein at least one side wall of the semiconductor package orientated parallel to the second longitudinal dimension has substantially flat surface that is perpendicular to a bottom or a top side of the semiconductor package (see Figs. 2a and 5e). Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. The factual inquiries for establishing a background for determining obviousness under 35 U.S.C. 103 are summarized as follows: 1. Determining the scope and contents of the prior art. 2. Ascertaining the differences between the prior art and the claims at issue. 3. Resolving the level of ordinary skill in the pertinent art. 4. Considering objective evidence present in the application indicating obviousness or nonobviousness. Claims 6-8 and 13-15 are rejected under 35 U.S.C. 103 as being unpatentable over Hor et al. (EP 3736857) as applied to claim 1 above, and further in view of Yoshikawa et al. (US 2011/0080928) and Jin et al. (US 11,450,534). With respect to Claims 6, 7, 13, and 14, Hor discloses the claimed invention except for using injection molding of thermoplastic polymer. However, Yoshikawa discloses using injection molding of thermoplastic polymer or thermos-curable resin for protecting a semiconductor device (see paragraphs 54, 58, and 90). Thus, Hor and Yoshikawa have substantially the same environment of a chip encapsulated and mounted to a lead frame. Therefore, one skilled in the art before the effective filing date of the claimed invention to substitute am injection molding of thermoplastic polymer for the process of Hor, since the injection molding of the polymer would facilitate in protecting the semiconductor device from outside contaminant as by Yoshikawa. With respect to Claims 8 and 15, Hor-Yoshikawa discloses the claimed invention except for using a ceramic material for encapsulating a semiconductor. However, Jin discloses using a ceramic material for encapsulating a semiconductor (see col. 5 lines 55-60). Thus, Hor-Yoshikawa and Jin have substantially the same environment of a chip encapsulated and mounted to a lead frame. Therefore, one skilled in the art before the effective filing date of the claimed invention to substitute a ceramic material for the material of Hor-Yoshikawa, since the ceramic would facilitate in protecting the semiconductor device from outside contaminant as by Yoshikawa. Allowable Subject Matter 10. Claims 5, 12, and 17-19 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. The following is a statement of reasons for the indication of allowance subject matter: none of the prior art of record does not teach or suggest the combination of at least two single semiconductor packages are separated by less than 3 mm viewed in the second longitudinal direction in claims 5 and 12. At least two single semiconductor packages are separated by a range of 0.03-0.35 mm in claim 17. At least two single semiconductor packages are separated by a range of range of 0.12-0.18 mm in claim 18. At least two single semiconductor packages are separated by 0.15 mm in claim 19. The prior art made of record and not relied upon is cited primarily to show the product of the instant invention. Conclusion 11. Any inquiry concerning the communication or earlier communications from the examiner should be directed to Alonzo Chambliss whose telephone number is (571) 272-1927. If attempts to reach the examiner by telephone are unsuccessful, the examiner's supervisor, Jacob Y. Choi can be reached on (469) 295-9060. The fax phone number for the organization where this application or proceeding is assigned is (571) 273-8300. Information regarding the status of an application may be obtained from the Patent Application Information Retrieval (PAIR) system Status information for published applications may be obtained from either Private PMR or Public PMR. Status information for unpublished applications is available through Private PMR only. For more information about the PMR system see hittp://pair-dkect.uspto. gov. Should you have questions on access to the Private PMR system contact the Electronic Center (EBC) at 866-217-9197 (toll-free). AC/March 4, 2026 /Alonzo Chambliss/ Primary Examiner, Art Unit 2897
Read full office action

Prosecution Timeline

Jun 29, 2023
Application Filed
Mar 09, 2026
Non-Final Rejection mailed — §102, §103 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

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Patent 12628645
CHIP-SCALE PACKAGE ARCHITECTURES CONTAINING A DIE BACK SIDE METAL AND A SOLDER THERMAL INTERFACE MATERIAL
1y 11m to grant Granted May 12, 2026
Patent 12615940
LIGHT-EMITTING ELEMENT WITH A PIXEL ELECTRODE HAVING AN UNEVEN STRUCTURE
3y 2m to grant Granted Apr 28, 2026
Patent 12616040
METAL LAYER PLATED TO INNER LEADS OF A LEADFRAME
2y 10m to grant Granted Apr 28, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
90%
Grant Probability
65%
With Interview (-25.1%)
2y 0m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1177 resolved cases by this examiner. Grant probability derived from career allowance rate.

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