Prosecution Insights
Last updated: April 19, 2026
Application No. 18/348,041

INTEGRATED CIRCUIT DEVICE EXPOSED DIE PACKAGE STRUCTURE WITH ADHESIVE

Non-Final OA §103
Filed
Jul 06, 2023
Examiner
VALENZUELA, PATRICIA D
Art Unit
2812
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Marvell Asia Pte. Ltd.
OA Round
1 (Non-Final)
90%
Grant Probability
Favorable
1-2
OA Rounds
2y 4m
To Grant
92%
With Interview

Examiner Intelligence

Grants 90% — above average
90%
Career Allow Rate
645 granted / 715 resolved
+22.2% vs TC avg
Minimal +2% lift
Without
With
+2.1%
Interview Lift
resolved cases with interview
Typical timeline
2y 4m
Avg Prosecution
63 currently pending
Career history
778
Total Applications
across all art units

Statute-Specific Performance

§101
1.3%
-38.7% vs TC avg
§103
60.1%
+20.1% vs TC avg
§102
19.9%
-20.1% vs TC avg
§112
8.6%
-31.4% vs TC avg
Black line = Tech Center average estimate • Based on career data from 715 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Election/Restrictions Applicant’s election of claims 1-11 in the reply filed on 11/06/25 is acknowledged. Because applicant did not distinctly and specifically point out the supposed errors in the restriction requirement, the election has been treated as an election without traverse (MPEP § 818.01(a)). Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 1-11 is/are rejected under 35 U.S.C. 103 as being unpatentable over Schrock (USPGPUB DOCUMENT: 20180012865, hereinafter Schrock) in view of Tsao (USPGPUB DOCUMENT: 2021/0202358, hereinafter Tsao). Re claim 1 Schrock discloses in Fig 3 an integrated circuit device package comprising: a package structure having a base(102) and walls(left/right 115a) extending from the base(102); at least one integrated circuit die(104/106) mounted to the package structure base(102) within the walls(left/right 115a), each integrated circuit die(104/106) among the at least one integrated circuit die(104/106) having a top surface parallel to the base(102) and each integrated circuit die(104/106) among the at least one integrated circuit die(104/106) having a thickness extending along an axis, perpendicular to the top surface, at most equal to a height of the walls(left/right 115a); a thermally conductive heat spreader(316) extending parallel to the base(102) above the at least one integrated circuit die(104/106) and above the walls(left/right 115a); and an interface layer(120) comprising: an adhesive layer portion(left/right 120 portions)[0036] disposed between the walls(left/right 115a) and the heat spreader(316) to adhere the heat spreader to the walls(left/right 115a); and a thermal interface material (TIM) layer portion(middle 120 portion)[0020,0036] coplanar with, and laterally displaced from, the adhesive layer portion(left/right 120 portions)[0036], to dissipate heat from each respective integrated circuit die(104/106) to the heat spreader(316). Schrock does not disclose the TIM layer portion being disposed in thermally conductive relationship between the heat spreader and each respective integrated circuit die(104/106) from among the at least one integrated circuit die(104/106), Tsao discloses the TIM layer portion(250/260)[0040 of Tsao] It would have been obvious to one of ordinary skill in the art at the time of the inventions to use the material of Tsao to replace the material (underfill 110) of Schrock’s device because such material replacement is art recognized suitability for an intended purpose. See MPEP 2144.07. In doing so, the TIM layer portion(250/260)[0040 of Tsao] being disposed in thermally conductive relationship between the heat spreader(316) and each respective integrated circuit die(104/106) from among the at least one integrated circuit die(104/106), Re claim 2 Schrock and Tsao disclose the integrated circuit device package of claim 1, wherein the package structure comprises molded[0019] packaging material. Re claim 3 Schrock and Tsao disclose the integrated circuit device package of claim 1, wherein the adhesive layer portion(left/right 120 portions)[0036] is thermally conductive. Re claim 4 Schrock and Tsao disclose the integrated circuit device package of claim 1, wherein dies from among the at least one integrated circuit die(104/106) are arranged in a stack of integrated circuit die(104/106)s, the stack having a stack thickness, perpendicular to the top surface, at most equal to the height of the walls(left/right 115a). Re claim 5 Schrock and Tsao disclose the integrated circuit device package of claim 1, wherein the TIM layer portion comprises any one of a: (a) polymer TIM, (b) graphite TIM, (c) metal TIM, and (d) liquid metal TIM. Re claim 6 Schrock and Tsao disclose the integrated circuit device package of claim 1, wherein the adhesive layer portion(left/right 120 portions)[0036] surrounds the TIM layer portion in the interface layer(120). Re claim 7 Schrock and Tsao disclose the integrated circuit device package of claim 1 wherein: the TIM layer portion is flowable; and the adhesive layer portion(left/right 120 portions)[0036] surrounds the TIM layer portion in the interface layer(120). Re claim 8 Schrock and Tsao disclose the integrated circuit device package of claim 7 wherein the adhesive layer portion(left/right 120 portions)[0036] forms a barrier between the integrated circuit die(104/106) and the heat spreader(316), to contain the flowable TIM layer portion. Re claim 9 Schrock and Tsao disclose the integrated circuit device package of claim 1, wherein the heat spreader(316) comprises a flat lid. Re claim 10 Schrock and Tsao disclose the integrated circuit device package of claim 1, wherein the heat spreader(316) comprises a forged lid. Re claim 11 Schrock and Tsao disclose the integrated circuit device package of claim 1, wherein the heat spreader(316) comprises a stamped hat-shaped lid. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to PATRICIA D VALENZUELA whose telephone number is (571)272-9242. The examiner can normally be reached Monday-Friday 10am-6pm EST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, William Partridge can be reached at 571-270-1402. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /PATRICIA D VALENZUELA/Primary Examiner, Art Unit 2812
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Prosecution Timeline

Jul 06, 2023
Application Filed
Feb 21, 2026
Non-Final Rejection — §103 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12604686
SEMICONDUCTOR CHIP AND SEMICONDUCTOR PACKAGE INCLUDING THE SAME
2y 5m to grant Granted Apr 14, 2026
Patent 12604749
SEMICONDUCTOR PACKAGE
2y 5m to grant Granted Apr 14, 2026
Patent 12598990
ELECTRICALLY ISOLATED DISCRETE PACKAGE WITH HIGH PERFORMANCE CERAMIC SUBSTRATE
2y 5m to grant Granted Apr 07, 2026
Patent 12598986
METAL INSULATOR METAL CAPACITOR (MIM CAPACITOR)
2y 5m to grant Granted Apr 07, 2026
Patent 12593675
RETICLE STITCHING TO ACHIEVE HIGH-CAPACITY INTEGRATED CIRCUIT
2y 5m to grant Granted Mar 31, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
90%
Grant Probability
92%
With Interview (+2.1%)
2y 4m
Median Time to Grant
Low
PTA Risk
Based on 715 resolved cases by this examiner. Grant probability derived from career allow rate.

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