Prosecution Insights
Last updated: May 29, 2026
Application No. 18/361,892

ELECTRO-STATIC DISCHARGE PROTECTION DEVICE

Non-Final OA §103
Filed
Jul 30, 2023
Priority
Sep 27, 2022 — RE 10-2022-0122746
Examiner
MCDONALD, JASON ANDREW
Art Unit
2898
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Samsung Electronics Co., Ltd.
OA Round
1 (Non-Final)
100%
Grant Probability
Favorable
1-2
OA Rounds
3m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 100% — above average
100%
Career Allowance Rate
2 granted / 2 resolved
+32.0% vs TC avg
Minimal +0% lift
Without
With
+0.0%
Interview Lift
resolved cases with interview
Typical timeline
3y 1m
Avg Prosecution
26 currently pending
Career history
51
Total Applications
across all art units

Statute-Specific Performance

§103
86.7%
+46.7% vs TC avg
§102
8.2%
-31.8% vs TC avg
§112
4.1%
-35.9% vs TC avg
Black line = Tech Center average estimate • Based on career data from 2 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Election/Restrictions Applicant’s election without traverse of Species A, Subspecies 1 in the reply filed on 23 December 2025 is acknowledged. Claims 1-5 and 11 read on the elected species. Claims 6-10 and 12-20 are withdrawn as reading on unelected species. Information Disclosure Statement The Information Disclosure Statements (IDS) submitted on 30 July 2023 and 27 February 2024 have been considered by the examiner and made of record in the application file. Claim Objections Claims 1, 2, and 4 are objected to because of the following informalities: The term --conductive type-- appears to imply --conductivity type--, since the context is N-type versus P-type materials. For the purpose of examination, the terminology has been corrected. Appropriate correction is required. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 1-2, 5, and 11 are rejected under 35 U.S.C. 103 as being unpatentable over Yang et al (KR 102147138 B1, hereinafter “Yang”), in view of Ma et al (CN 102244076 A, hereinafter “Ma”). Regarding Claim 1 – Yang discloses an electro-static discharge (ESD) protection device ([0001]), comprising: a substrate ([0008]) that includes a first well that has a first conductivity type (220 [0068]) and a second well that has a second conductivity type (230 [0068]); a first diffusion region that has the first conductivity type (243 [0069] and Fig. 7) and a second diffusion region that has the second conductivity type (242 [0069] and Fig. 7), wherein the first diffusion region and the second diffusion region are formed on the first well and connected to a first electrode (Anode [0069] and Fig. 7); a third diffusion region that has the first conductivity type (232 [0069] and Fig. 7) and a fourth diffusion region that has the second conductivity type (231 [0069] and Fig. 7), wherein the third diffusion region and the fourth diffusion region are formed on the second well and connected to a second electrode (Cathode [0069] and Fig. 7); a fifth diffusion region that has the first conductivity type (241 [0069] and Fig. 7) and that is formed on the first well and is adjacent to the second diffusion region (Fig. 7); a sixth diffusion region that has the second conductivity type and that is formed on the second well (234 [0069] and Fig. 7) and is adjacent to the third diffusion region (Fig. 7); a seventh diffusion region that has the second conductivity type and that is formed on the first well (250 [0068] and Fig. 7) and is adjacent to the first diffusion region (Fig. 7); and an eighth diffusion region that has the first conductivity type (251 [0069] and Fig. 7), wherein the seventh diffusion region and the eighth diffusion region are electrically connected to each other (forming a P-N junction as shown in Fig. 7). Yang fails to disclose the eighth diffusion region is formed on the second well and is adjacent to the sixth diffusion region. However, Ma discloses the eighth diffusion region (interpreted as diffusion 38, Ma [0025] and Fig. 3) formed on a well and is electrically connected to the sixth diffusion region (interpreted as diffusion 44, Ma [0025] and Fig. 3). Ma’s diffusion 38 serves the same purpose as the eighth diffusion in the claimed invention, forming part of a P-N diode between the bases of the PNP and NPN structures of the device. Ma discloses an ESD protection device analogous to Yang. Ma teaches adding diodes in series between bipolar (PNP and NPN) bases for the benefit of adjusting the trigger voltage (Ma [0030]). Therefore, it would have been obvious to one of ordinary skill in the art prior to the effective filing date of the claimed invention to consider combining the teachings of Yang and Ma to add diodes in series between bipolar bases for the benefit of adjusting the trigger voltage. Furthermore, the diode connections between NPN and PNP bases can be formed by any reasonable combination of series P-N junctions to adjust the trigger voltage. Such substitution of known equivalents with inherently similar properties presents a prima facie case of obviousness. See MPEP 2144.06(II). PNG media_image1.png 285 460 media_image1.png Greyscale PNG media_image2.png 285 506 media_image2.png Greyscale Regarding Claim 2 – Yang modified by Ma discloses all the limitations of claim 1. The combination of Yang and Ma further discloses the first conductivity type is an N conductivity type ([0008]), and the second conductivity type is a P conductivity type ([0008]). Regarding Claim 5 – Yang modified by Ma discloses all the limitations of claim 1. The combination of Yang and Ma further discloses the first diffusion region is adjacent to the seventh diffusion region (243 adjacent to 250, Yang Fig. 7), the second diffusion region is adjacent to the first diffusion region (242 adjacent to 243, Yang Fig. 7), and the fifth diffusion region is adjacent to the second diffusion region (241 adjacent to 242, Yang Fig. 7); wherein the sixth diffusion region is adjacent to the eighth diffusion region (electrically, by way of interconnect, 234 adjacent to 251, Yang Fig. 7), the third diffusion region is adjacent to the sixth diffusion region (232 adjacent to 234, Yang Fig. 7), and the fourth diffusion region is adjacent to the third diffusion region (231 adjacent to 232, Fig. 7); and wherein the fifth diffusion region and the eighth diffusion region are formed adjacent to a boundary between the first well and the second well (241 adjacent to boundary, and 233 adjacent to boundary, and directly connected to 251, Yang Fig. 7). Regarding Claim 11 – Yang further discloses the ESD protection device of claim 1, wherein the first electrode is an anode electrode (Anode [0069] and Fig. 7), and the second electrode is a cathode electrode (Cathode [0069] and Fig. 7). Claims 3 and 4 are rejected under 35 U.S.C. 103 as being unpatentable over Yang et al (KR 102147138 B1, hereinafter “Yang”), in view of Ma et al (CN 102244076 A, hereinafter “Ma”), and further in view of Salcedo et al (US 20060151836 A1, hereinafter “Salcedo”). Regarding Claim 3 – Yang modified by Ma discloses all the limitations of claim 1. The combination of Yang and Ma fails to disclose at least one metal interconnection and at least one via that electrically connect the seventh diffusion region and the eighth diffusion region. However, Salcedo discloses at least one metal interconnection and at least one via that electrically connect diffusion regions (Salcedo [0097] and Fig. 14). Salcedo discloses a similar ESD protection device to Yang. Salcedo teaches using metal interconnections with vias to connect diffusion regions for the benefit of ensuring incoming current is very well distributed along the multi-finger structure (Salcedo [0097]). Therefore, it would have been obvious to one of ordinary skill in the art prior to the effective filing date of the claimed invention to combine the teachings of Yang and Salcedo to use metal interconnections with vias to connect diffusion regions for the benefit of ensuring incoming current is very well distributed along the multi-finger structure. PNG media_image3.png 338 566 media_image3.png Greyscale Regarding Claim 4 – Yang modified by Ma discloses all the limitations of claim 1. The combination of Yang and Ma fails to disclose the substrate includes an epitaxial layer that has the first conductivity type. However, Salcedo discloses the substrate includes an epitaxial layer that has the first conductivity type (Salcedo [0018] and Fig. 13)(The label of first or second conductivity type is arbitrary, and Salcedo refers to the N-type epitaxial layer as having the second type). Salcedo discloses a similar ESD protection device to Yang. Salcedo teaches the use of an epitaxial layer on the substrate into which to diffuse the components of the ESD device. Epitaxial layers are known equivalents to deep wells for the purpose of preparing a substrate for additional diffusions, presenting a prima facie case of obviousness. See MPEP 2144.06(II). Therefore, it would have been obvious to one of ordinary skill in the art prior to the effective filing date of the claimed invention to consider using an epitaxial layer on the substrate. PNG media_image4.png 249 537 media_image4.png Greyscale Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to JASON MCDONALD whose telephone number is (571) 272-5944. The examiner can normally be reached M-F 8a-6p Eastern, alternating Fridays out of office. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Julio Maldonado can be reached at (571) 272-1864. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /JASON MCDONALD/Examiner, Art Unit 2898 /JULIO J MALDONADO/Supervisory Patent Examiner, Art Unit 2898
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Prosecution Timeline

Jul 30, 2023
Application Filed
Mar 31, 2026
Non-Final Rejection mailed — §103
May 12, 2026
Interview Requested
May 19, 2026
Applicant Interview (Telephonic)
May 19, 2026
Examiner Interview Summary

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Prosecution Projections

1-2
Expected OA Rounds
100%
Grant Probability
99%
With Interview (+0.0%)
3y 1m (~3m remaining)
Median Time to Grant
Low
PTA Risk
Based on 2 resolved cases by this examiner. Grant probability derived from career allowance rate.

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