Prosecution Insights
Last updated: April 18, 2026
Application No. 18/362,128

INSULATION LAYER FOR A SEMICONDUCTOR PACKAGE

Non-Final OA §103
Filed
Jul 31, 2023
Examiner
SUN, YU-HSI DAVID
Art Unit
2817
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Sandisk Technologies Inc.
OA Round
1 (Non-Final)
77%
Grant Probability
Favorable
1-2
OA Rounds
2y 9m
To Grant
85%
With Interview

Examiner Intelligence

Grants 77% — above average
77%
Career Allow Rate
648 granted / 845 resolved
+8.7% vs TC avg
Moderate +8% lift
Without
With
+8.4%
Interview Lift
resolved cases with interview
Typical timeline
2y 9m
Avg Prosecution
27 currently pending
Career history
872
Total Applications
across all art units

Statute-Specific Performance

§101
3.0%
-37.0% vs TC avg
§103
45.9%
+5.9% vs TC avg
§102
25.5%
-14.5% vs TC avg
§112
16.6%
-23.4% vs TC avg
Black line = Tech Center average estimate • Based on career data from 845 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Election/Restrictions Applicant’s election without traverse of Species I in the reply filed on 10/7/2025 is acknowledged. Claim 3 is withdrawn from further consideration pursuant to 37 CFR 1.142(b) as being drawn to a nonelected species, there being no allowable generic or linking claim. Election was made without traverse in the reply filed on 10/7/2025. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 1, 2, 6-11, 14 and 16-19 are rejected under 35 U.S.C. 103 as being unpatentable over NOH et al. (US PG Pub 2023/0028943, hereinafter Noh) in view of CHOU (US PG Pub 2023/0420386, hereinafter Chou). Regarding claim 1, figure 1 of Nikitin discloses a semiconductor package, comprising: a substrate (100); a molding compound (500) covering a memory device (210) communicatively coupled to the substrate by a bond wire (215), at least a portion of the bond wire extending past a top surface of the molding compound; and an insulation layer (317) provided above the molding compound and covering the at least the portion of the bond wire that extends past the top surface of the molding compound. Noh does not explicitly disclose an electromagnetic interference (EMI) layer at least partially surrounding the substrate, the molding compound, and the insulation layer. In the same field of endeavor, figure 11 of Chou discloses an electromagnetic interference (EMI) layer (214) at least partially surrounding a device including a substrate and a molding compound (212). In light of such teachings, it would have been obvious to one of ordinary skill in the art at the time the invention was made to form an EMI layer around the device as taught by Chou for the purpose of providing protection from EMI depending on specific functionality requirements and design constraints. Regarding claim 2, the prior art does not explicitly disclose the insulation layer is approximately five micrometers (µm) thick. However, it would have been obvious to form the insulation layer with a thickness within the claimed range, since it has been held by the Federal circuit that, where the only difference between the prior art and the claims was a recitation of relative dimensions of the claimed device and a device having the claimed relative dimensions would not perform differently than the prior art device, the claimed device was not patentably distinct from the prior art device. (In Gardner v. TEC Systems, Inc., 725 F.2d 1338, 220 USPQ 777 (Fed. Cir. 1984), cert. denied, 469 U.S. 830, 225 USPQ 232 (1984)). Regarding claim 6, figure 1 of Nikitin discloses the insulation layer prevents a short from occurring between the EMI layer and the at least the portion of the bond wire that extends past the top surface of the molding compound. Regarding claim 7, Nikitin does not explicitly disclose the insulation layer enables a Z-height of the molding compounding to be reduced by approximately forty-five micrometers (µm) or more. However, it would have been obvious to form the insulation layer with a thickness that reduces the Z-height in the claimed range, since it has been held by the Federal circuit that, where the only difference between the prior art and the claims was a recitation of relative dimensions of the claimed device and a device having the claimed relative dimensions would not perform differently than the prior art device, the claimed device was not patentably distinct from the prior art device. (In Gardner v. TEC Systems, Inc., 725 F.2d 1338, 220 USPQ 777 (Fed. Cir. 1984), cert. denied, 469 U.S. 830, 225 USPQ 232 (1984)). Regarding claim 8, figure 1 of Nikitin does not explicitly disclose the memory device is a NAND die stack. However NAND type memory devices are well known in the art and it would have been obvious to include a NAND die stack for the purpose of forming a high storage density memory device. Regarding claim 9, the prior art discloses the entire claimed invention as noted in the above rejections. Regarding claim 10, Nikitin does not explicitly disclose the insulation layer is provided on the second portion of the bond wire using a one or more of a spraying process, a printing process and a sputtering process. However, it would have been obvious to form the insulation layer (317) using a printing process for the purpose of selecting a suitable and well known process for forming die attach films. Regarding claims 11 and 14, the prior art discloses the entire claimed invention as noted in the above rejections. Regarding claims 16-19, the prior art discloses the entire claimed invention as noted in the above rejections. Allowable Subject Matter Claims 4-5, 12-13, 15 and 20 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to YU-HSI DAVID SUN whose telephone number is (571)270-5773. The examiner can normally be reached Mon-Fri 8am-4pm ET. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Marlon Fletcher can be reached at 571-272-2063. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /YU-HSI D SUN/Primary Examiner, Art Unit 2817
Read full office action

Prosecution Timeline

Jul 31, 2023
Application Filed
Dec 01, 2025
Non-Final Rejection — §103
Mar 26, 2026
Applicant Interview (Telephonic)
Mar 26, 2026
Examiner Interview Summary
Mar 27, 2026
Response Filed

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12604693
METHOD OF MANUFACTURING CHIPS
2y 5m to grant Granted Apr 14, 2026
Patent 12598821
CHIP PACKAGE STRUCTURE AND METHOD FOR PRODUCING THE SAME
2y 5m to grant Granted Apr 07, 2026
Patent 12593717
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
2y 5m to grant Granted Mar 31, 2026
Patent 12581982
BONDING WIRE FOR SEMICONDUCTOR DEVICES
2y 5m to grant Granted Mar 17, 2026
Patent 12582016
SEMICONDUCTOR DEVICE
2y 5m to grant Granted Mar 17, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
77%
Grant Probability
85%
With Interview (+8.4%)
2y 9m
Median Time to Grant
Low
PTA Risk
Based on 845 resolved cases by this examiner. Grant probability derived from career allow rate.

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