Prosecution Insights
Last updated: July 17, 2026
Application No. 18/383,007

NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF SPECIMENS

Non-Final OA §112
Filed
Oct 23, 2023
Examiner
ISHIZUKA, YOSHIHISA
Art Unit
2857
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Applied Materials Israel Ltd.
OA Round
1 (Non-Final)
68%
Grant Probability
Favorable
1-2
OA Rounds
10m
Est. Remaining
88%
With Interview

Examiner Intelligence

Grants 68% — above average
68%
Career Allowance Rate
295 granted / 432 resolved
At TC average
Strong +20% interview lift
Without
With
+20.0%
Interview Lift
resolved cases with interview
Typical timeline
3y 6m
Avg Prosecution
25 currently pending
Career history
461
Total Applications
across all art units

Statute-Specific Performance

§101
6.6%
-33.4% vs TC avg
§103
68.1%
+28.1% vs TC avg
§102
1.8%
-38.2% vs TC avg
§112
21.6%
-18.4% vs TC avg
Black line = Tech Center average estimate • Based on career data from 432 resolved cases

Office Action

§112
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 112 The following is a quotation of 35 U.S.C. 112(b): (b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention. The following is a quotation of 35 U.S.C. 112 (pre-AIA ), second paragraph: The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention. Claims 1-20 are rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention. Claims 1, 20 recite “pertaining to the tested structure”. However it is not clear what tested structure the claim is referring to and is therefore indefinite. The claim does not recite any structure that is tested, but recites a specimen being tested and is therefore not clear. Claims 1, 20 recite “and assumed by one or more structural parameters”. However it is not clear what the metes and bounds of “assumed by one or more structural parameter” entails. Assumed has been interpreted as “suppose to be the case, without proof:” However it is not clear what assumed would mean and is therefore indefinite. Claims 1, 20 recite “the one or more landing energies”. There is insufficient antecedent basis for this limitation in the claim. Claims 1, 2, 3, 4, 10, 11, 12, 13, 14, 15, recite variable with indexes or subscripts. Examiner notes that for the vector pn, Applicant specifies that this is “pertaining to an n-th simulated specimen”. However none of the other variables have a defined meaning to the index or subscripts and are therefore indefinite and is not consistent. Examiner notes that prior art could not be applied due to the 35 U.S.C.§ 112(b) Rejections above. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. Shwartz (US 2023/0326713 A1) teaches a method for non-destructive hybrid acousto-optic and scanning electron microscopy-based metrology. The method includes: (i) obtaining acousto-optic and scanning electron microscopy measurement data of an inspected structure on a sample; (ii) processing the measurement data to extract values of key measurement parameters corresponding to the acousto-optic measurement data and the scanning electron microscopy measurement data, respectively; and (iii) obtaining estimated values of one or more structural parameters of the inspected structure by inputting the extracted values into an algorithm, which is configured to jointly process the extracted values to output estimated values of the one or more structural parameters.. Any inquiry concerning this communication or earlier communications from the examiner should be directed to YOSHIHISA ISHIZUKA whose telephone number is (571)270-7050. The examiner can normally be reached M-F 11:00-7:00. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Catherine Rastovski can be reached at (571) 270-0349. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. YOSHIHISA . ISHIZUKA Examiner Art Unit 2857 /YOSHIHISA ISHIZUKA/Primary Examiner, Art Unit 2857
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Prosecution Timeline

Oct 23, 2023
Application Filed
Jun 03, 2026
Non-Final Rejection mailed — §112 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
68%
Grant Probability
88%
With Interview (+20.0%)
3y 6m (~10m remaining)
Median Time to Grant
Low
PTA Risk
Based on 432 resolved cases by this examiner. Grant probability derived from career allowance rate.

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