Prosecution Insights
Prosecution Insights
Technology areas: Communications • Semiconductors, Circuits & Optics
24 pending office actions • 13 art units • 22 examiners • 0 of 24 (0%) have an AI response strategy ready • 46 patents granted in the last 365 days
Applied Materials Israel Ltd. has 22 pending office actions in the Semiconductors, Circuits & Optics technology area. These actions are distributed among 20 distinct examiners, showing a high degree of variety in the individuals reviewing the company's applications. The portfolio is further spread across 11 distinct art units, reflecting a diverse range of specialized technical subject matter. This broad distribution requires a management approach to handle the various examiners simultaneously.
LI, LARRY is the busiest examiner for the company, currently handling 3 pending office actions. The remaining workload is distributed among the other 20 distinct examiners who are active in this portfolio. With 11 distinct art units, the company maintains a broad presence across the semiconductor examination landscape. Practitioners must account for the perspectives of the various examiners, although the concentration of 3 pending office actions with LI, LARRY provides a point of focus within the larger portfolio of 22 pending office actions.
Based on the USPTO statutory response window for each pending office action. 5 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.
Every pending office action with a known statutory deadline, placed on a days-until-due axis. Dots left of Today are overdue; the further right, the more runway. Cases that share a deadline window stack vertically. 5 of the docket's apps have a known mailing date.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §101 + other | 4 (17%) |
| §103 only | 7 (29%) |
| §112 only | 4 (17%) |
| Multi-statute (no §101) | 9 (38%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| LI, LARRY | 3 | 100.0% | +0.0% |
| WILLIAMS, REBECCA COLETTE | 1 | 50.0% | +58.3% |
| TAYLOR, MEREDITH IREENE DUPAI | 1 | 68.3% | +54.3% |
| MARIAM, DANIEL G | 1 | 90.6% | +10.4% |
| FATIMA, UROOJ | 1 | 75.0% | +0.0% |
| GASSEN, CHRISTOPHER J | 1 | 79.6% | +25.0% |
| COCHRAN, BRIANNA RENAE | 1 | 45.5% | +66.7% |
| RENZE, GEORGE NICHOLAS | 1 | 73.7% | +18.3% |
| VANORE, DAVID A | 1 | 88.9% | +7.5% |
| KALISZEWSKI, ALINA ROSE | 1 | 84.4% | +23.8% |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 3 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18912493 | FITTING ROUNDED QUADRILATERAL SHAPES IN SEM IMAGING | MARIAM, DANIEL G | — |
| 18754126 | METHOD AND SYSTEM FOR 3D RECONSTRUCTION OF WAFER STRUCTURE BY DIAGONAL MILLING | VANORE, DAVID A | — |
| 18630957 | PROTECTING A DETECTOR WHILE DISCHARGING A REGION OF A SAMPLE | LI, LARRY | — |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18402641 | DETERMINATION OF LAYER PROPERTIES USING WIDENING OF AN ELECTRON BEAM | WANG, JING | 11d overdue |
| 18528737 | CALIBRATION OF AN EXAMINATION SYSTEM | SMITH, DAVID E | 19d |
| 18774820 | AN ARTIFICIAL INTELLIGENCE BASED METHOD FOR PRESENTING DATA RELATED TO DEFECTS DISCOVERED BY AN INSPECTION SYSTEM | COCHRAN, BRIANNA RENAE | 26d |
| 18970739 | ROUGHNESS DETERMINATION | TAYLOR, MEREDITH IREENE DUPAI | — |
| 18888033 | NOTCH FILTER FOR HIGH THROUGHPUT X-RAY PHOTON SPECTROSCOPY | GASSEN, CHRISTOPHER J | — |
| 18673251 | DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN | KALISZEWSKI, ALINA ROSE | — |
| 18599138 | ELECTROSTATIC ENERGY FILTER MODULE | LI, LARRY | — |
| 18443236 | OPTIMIZATION OF A METROLOGY ALGORITHM FOR EXAMINATION OF SEMICONDUCTOR WAFERS | FORRISTALL, JOSHUA L | — |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 7 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18774820 | AN ARTIFICIAL INTELLIGENCE BASED METHOD FOR PRESENTING DATA RELATED TO DEFECTS DISCOVERED BY AN INSPECTION SYSTEM | COCHRAN, BRIANNA RENAE | 26d |
| 19031183 | IDENTIFICATION OF AN ARRAY IN A SEMICONDUCTOR SPECIMEN | WILLIAMS, REBECCA COLETTE | — |
| 18970739 | ROUGHNESS DETERMINATION | TAYLOR, MEREDITH IREENE DUPAI | — |
| 18912493 | FITTING ROUNDED QUADRILATERAL SHAPES IN SEM IMAGING | MARIAM, DANIEL G | — |
| 18888033 | NOTCH FILTER FOR HIGH THROUGHPUT X-RAY PHOTON SPECTROSCOPY | GASSEN, CHRISTOPHER J | — |
| 18769022 | AUTOMATIC GENERATION AND PLANTING OF SYNTHETIC DEFECTS OF INTEREST AND GENERATION OF SYNTHETIC FAULT IMAGES OF SEMICONDUCTOR SPECIMENS | RENZE, GEORGE NICHOLAS | — |
| 18673251 | DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN | KALISZEWSKI, ALINA ROSE | — |
| Art Unit | Apps |
|---|---|
| 2881 | 6 |
| 2857 | 2 |
| 2671 | 1 |
| 2675 | 1 |
| 2676 | 1 |
| 2615 | 1 |
| 2613 | 1 |
| 2878 | 1 |
| 2666 | 1 |
| 2667 | 1 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 19031183 | IDENTIFICATION OF AN ARRAY IN A SEMICONDUCTOR SPECIMEN | WILLIAMS, REBECCA COLETTE | — | §103 | Non-Final OA | — | Pending | Jan 17, 2025 |
| 18970739 | ROUGHNESS DETERMINATION | TAYLOR, MEREDITH IREENE DUPAI | 2671 | §103§112 | Non-Final OA | — | Pending | Dec 05, 2024 |
| 18912493 | FITTING ROUNDED QUADRILATERAL SHAPES IN SEM IMAGING | MARIAM, DANIEL G | 2675 | §112 | Non-Final OA | — | Pending | Oct 10, 2024 |
| 18893821 | MACHINE LEARNING BASED GENERATION OF SYNTHETIC FAULT IMAGES OF SEMICONDUCTOR SPECIMENS | FATIMA, UROOJ | 2676 | §103 | Non-Final OA | — | Pending | Sep 23, 2024 |
| 18888033 | NOTCH FILTER FOR HIGH THROUGHPUT X-RAY PHOTON SPECTROSCOPY | GASSEN, CHRISTOPHER J | 2881 | §102§103§112 | Non-Final OA | — | Pending | Sep 17, 2024 |
| 18774820 | AN ARTIFICIAL INTELLIGENCE BASED METHOD FOR PRESENTING DATA RELATED TO DEFECTS DISCOVERED BY AN INSPECTION SYSTEM | COCHRAN, BRIANNA RENAE | 2615 | §103§112 | Final Rejection | 26d | Pending | Jul 16, 2024 |
| 18769022 | AUTOMATIC GENERATION AND PLANTING OF SYNTHETIC DEFECTS OF INTEREST AND GENERATION OF SYNTHETIC FAULT IMAGES OF SEMICONDUCTOR SPECIMENS | RENZE, GEORGE NICHOLAS | 2613 | §103 | Final Rejection | — | Pending | Jul 10, 2024 |
| 18754126 | METHOD AND SYSTEM FOR 3D RECONSTRUCTION OF WAFER STRUCTURE BY DIAGONAL MILLING | VANORE, DAVID A | 2878 | §112 | Non-Final OA | — | Pending | Jun 25, 2024 |
| 18673251 | DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN | KALISZEWSKI, ALINA ROSE | — | §102§103§112 | Non-Final OA | — | Pending | May 23, 2024 |
| 18630957 | PROTECTING A DETECTOR WHILE DISCHARGING A REGION OF A SAMPLE | LI, LARRY | 2881 | §103 | Final Rejection | — | Pending | Apr 09, 2024 |
| 18599138 | ELECTROSTATIC ENERGY FILTER MODULE | LI, LARRY | 2881 | §103§112 | Final Rejection | — | Pending | Mar 07, 2024 |
| 18443236 | OPTIMIZATION OF A METROLOGY ALGORITHM FOR EXAMINATION OF SEMICONDUCTOR WAFERS | FORRISTALL, JOSHUA L | — | §101§103§112 | Non-Final OA | — | Pending | Feb 15, 2024 |
| 18439748 | TRAINING AND USING A NEURAL NETWORK FOR DEFECT DETECTION | GERMICK, JOHNATHAN R | — | §101§102§103§112 | Non-Final OA | — | Pending | Feb 12, 2024 |
| 18411009 | DETERMINATION OF UNDERCUT SIDEWALLS BASED ON AN IMAGE OF A SEMICONDUCTOR SPECIMEN | WILBURN, MOLLY K | 2666 | §112 | Non-Final OA | 6d | Pending | Jan 11, 2024 |
| 18402641 | DETERMINATION OF LAYER PROPERTIES USING WIDENING OF AN ELECTRON BEAM | WANG, JING | 2881 | §101§103 | Final Rejection | 11d overdue | Pending | Jan 02, 2024 |
| 18537693 | AUTOMATIC SEGMENTATION OF AN IMAGE OF A SEMICONDUCTOR SPECIMEN AND USAGE IN METROLOGY | CAMMARATA, MICHAEL ROBERT | 2667 | §103 | Non-Final OA | — | Pending | Dec 12, 2023 |
| 18528737 | CALIBRATION OF AN EXAMINATION SYSTEM | SMITH, DAVID E | 2881 | §102§103 | Final Rejection | 19d | Pending | Dec 04, 2023 |
| 18383007 | NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF SPECIMENS | ISHIZUKA, YOSHIHISA | 2857 | §112 | Non-Final OA | — | Pending | Oct 23, 2023 |
| 18488888 | MACHINE LEARNING BASED DEFECT EXAMINATION AND RANKING FOR SEMICONDUCTOR SPECIMENS | HELCO, NICHOLAS JOHN | 2122 | §101§103 | Non-Final OA | — | Pending | Oct 17, 2023 |
| 18370303 | METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES | LI, LARRY | 2881 | §102§103 | Final Rejection | — | Pending | Sep 19, 2023 |
| 18236322 | ROBOT BLADE AND WAFER BREAKAGE PREVENTION SYSTEM | RODDEN, JOSHUA E | — | §102§103§112 | Non-Final OA | — | Pending | Aug 21, 2023 |
| 18231567 | DEPTH-PROFILING OF SAMPLES BASED ON X-RAY MEASUREMENTS | BARBEE, MANUEL L | 2857 | §103 | Final Rejection | 22d | Pending | Aug 08, 2023 |
| 18231221 | PULSE STRETCHER SYSTEM AND METHOD | KING, JOSHUA | 2828 | §103 | Non-Final OA | — | Pending | Aug 07, 2023 |
| 18122646 | HIGH VOLTAGE NOISE CANCELLATION | POOS, JOHN W | 2843 | §102§103 | Non-Final OA | — | Pending | Mar 16, 2023 |
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