Prosecution Insights
Prosecution Insights
19 pending office actions • 13 art units • 18 examiners • 0 of 19 (0%) have an AI response strategy ready • 44 patents granted in the last 365 days
Based on the USPTO statutory response window for each pending office action. 3 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.
Every pending office action with a known statutory deadline, placed on a days-until-due axis. Dots left of Today are overdue; the further right, the more runway. Cases that share a deadline window stack vertically. 3 of the docket's apps have a known mailing date.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §101 only | 2 (11%) |
| §101 + other | 2 (11%) |
| §103 only | 4 (21%) |
| §102 only | 1 (5%) |
| §112 only | 6 (32%) |
| Multi-statute (no §101) | 4 (21%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| LI, LARRY | 2 | 100.0% | +0.0% |
| LAPAGE, MICHAEL P | 1 | 78.7% | +33.2% |
| TAYLOR, MEREDITH IREENE DUPAI | 1 | 67.9% | +51.3% |
| MARIAM, DANIEL G | 1 | 90.5% | +10.4% |
| SALEH, ZAID MUHAMMAD | 1 | 66.1% | +46.3% |
| RENZE, GEORGE NICHOLAS | 1 | 71.9% | +18.8% |
| VANORE, DAVID A | 1 | 88.9% | +7.5% |
| THOMAS, LUCY M | 1 | 62.4% | +18.2% |
| FORRISTALL, JOSHUA L | 1 | 63.2% | +19.0% |
| WANG, JING | 1 | 100.0% | +0.0% |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 3 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18912493 | FITTING ROUNDED QUADRILATERAL SHAPES IN SEM IMAGING | MARIAM, DANIEL G | — |
| 18754126 | METHOD AND SYSTEM FOR 3D RECONSTRUCTION OF WAFER STRUCTURE BY DIAGONAL MILLING | VANORE, DAVID A | — |
| 18599138 | ELECTROSTATIC ENERGY FILTER MODULE | LI, LARRY | — |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18402641 | DETERMINATION OF LAYER PROPERTIES USING WIDENING OF AN ELECTRON BEAM | WANG, JING | 11d overdue |
| 18528737 | CALIBRATION OF AN EXAMINATION SYSTEM | SMITH, DAVID E | 19d |
| 19094641 | STABILIZATION OF A MANUFACTURING PROCESS OF A SPECIMEN BY SHAPE ANALYSIS OF STRUCTURAL ELEMENTS OF THE SPECIMEN | LAPAGE, MICHAEL P | — |
| 18970739 | ROUGHNESS DETERMINATION | TAYLOR, MEREDITH IREENE DUPAI | — |
| 18443236 | OPTIMIZATION OF A METROLOGY ALGORITHM FOR EXAMINATION OF SEMICONDUCTOR WAFERS | FORRISTALL, JOSHUA L | — |
| 18370303 | METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES | LI, LARRY | — |
| 18236322 | ROBOT BLADE AND WAFER BREAKAGE PREVENTION SYSTEM | RODDEN, JOSHUA E | — |
| 18230127 | IMAGE SEGMENTATION FOR EXAMINING A SEMICONDUCTOR SPECIMEN | HWANG, JINSU | — |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 7 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 19094641 | STABILIZATION OF A MANUFACTURING PROCESS OF A SPECIMEN BY SHAPE ANALYSIS OF STRUCTURAL ELEMENTS OF THE SPECIMEN | LAPAGE, MICHAEL P | — |
| 18970739 | ROUGHNESS DETERMINATION | TAYLOR, MEREDITH IREENE DUPAI | — |
| 18912493 | FITTING ROUNDED QUADRILATERAL SHAPES IN SEM IMAGING | MARIAM, DANIEL G | — |
| 18770409 | DEFECT FILTERING FOR MASK INSPECTION | SALEH, ZAID MUHAMMAD | — |
| 18769022 | AUTOMATIC GENERATION AND PLANTING OF SYNTHETIC DEFECTS OF INTEREST AND GENERATION OF SYNTHETIC FAULT IMAGES OF SEMICONDUCTOR SPECIMENS | RENZE, GEORGE NICHOLAS | — |
| 18749495 | HYBRID VACUUM ELECTROSTATIC CHUCK IN DEDICATED CHAMBER FOR HIGH WARPAGE WAFERS | THOMAS, LUCY M | — |
| 18443236 | OPTIMIZATION OF A METROLOGY ALGORITHM FOR EXAMINATION OF SEMICONDUCTOR WAFERS | FORRISTALL, JOSHUA L | — |
| Art Unit | Apps |
|---|---|
| 2881 | 4 |
| 2667 | 2 |
| 2877 | 1 |
| 2671 | 1 |
| 2675 | 1 |
| 2668 | 1 |
| 2613 | 1 |
| 2878 | 1 |
| 2838 | 1 |
| 2665 | 1 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 19094641 | STABILIZATION OF A MANUFACTURING PROCESS OF A SPECIMEN BY SHAPE ANALYSIS OF STRUCTURAL ELEMENTS OF THE SPECIMEN | LAPAGE, MICHAEL P | 2877 | §101 | Non-Final OA | — | Pending | Mar 28, 2025 |
| 18970739 | ROUGHNESS DETERMINATION | TAYLOR, MEREDITH IREENE DUPAI | 2671 | §103§112 | Non-Final OA | — | Pending | Dec 05, 2024 |
| 18912493 | FITTING ROUNDED QUADRILATERAL SHAPES IN SEM IMAGING | MARIAM, DANIEL G | 2675 | §112 | Non-Final OA | — | Pending | Oct 10, 2024 |
| 18770409 | DEFECT FILTERING FOR MASK INSPECTION | SALEH, ZAID MUHAMMAD | 2668 | §103 | Non-Final OA | — | Pending | Jul 11, 2024 |
| 18769022 | AUTOMATIC GENERATION AND PLANTING OF SYNTHETIC DEFECTS OF INTEREST AND GENERATION OF SYNTHETIC FAULT IMAGES OF SEMICONDUCTOR SPECIMENS | RENZE, GEORGE NICHOLAS | 2613 | §103 | Final Rejection | — | Pending | Jul 10, 2024 |
| 18754126 | METHOD AND SYSTEM FOR 3D RECONSTRUCTION OF WAFER STRUCTURE BY DIAGONAL MILLING | VANORE, DAVID A | 2878 | §112 | Non-Final OA | — | Pending | Jun 25, 2024 |
| 18749495 | HYBRID VACUUM ELECTROSTATIC CHUCK IN DEDICATED CHAMBER FOR HIGH WARPAGE WAFERS | THOMAS, LUCY M | 2838 | §112 | Non-Final OA | — | Pending | Jun 20, 2024 |
| 18599138 | ELECTROSTATIC ENERGY FILTER MODULE | LI, LARRY | 2881 | §112 | Final Rejection | — | Pending | Mar 07, 2024 |
| 18443236 | OPTIMIZATION OF A METROLOGY ALGORITHM FOR EXAMINATION OF SEMICONDUCTOR WAFERS | FORRISTALL, JOSHUA L | — | §101§103§112 | Non-Final OA | — | Pending | Feb 15, 2024 |
| 18402641 | DETERMINATION OF LAYER PROPERTIES USING WIDENING OF AN ELECTRON BEAM | WANG, JING | 2881 | §101§103 | Final Rejection | 11d overdue | Pending | Jan 02, 2024 |
| 18537693 | AUTOMATIC SEGMENTATION OF AN IMAGE OF A SEMICONDUCTOR SPECIMEN AND USAGE IN METROLOGY | CAMMARATA, MICHAEL ROBERT | 2667 | §103 | Final Rejection | — | Pending | Dec 12, 2023 |
| 18528737 | CALIBRATION OF AN EXAMINATION SYSTEM | SMITH, DAVID E | 2881 | §102§103 | Final Rejection | 19d | Pending | Dec 04, 2023 |
| 18518025 | DEFECT DETECTION USING A MACHINE LEARNING ALGORITHM | SAFAIPOUR, BOBBAK | 2665 | §102 | Non-Final OA | — | Pending | Nov 22, 2023 |
| 18383007 | NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF SPECIMENS | ISHIZUKA, YOSHIHISA | 2857 | §112 | Non-Final OA | — | Pending | Oct 23, 2023 |
| 18370303 | METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES | LI, LARRY | 2881 | §102§103 | Final Rejection | — | Pending | Sep 19, 2023 |
| 18236322 | ROBOT BLADE AND WAFER BREAKAGE PREVENTION SYSTEM | RODDEN, JOSHUA E | — | §102§103§112 | Non-Final OA | — | Pending | Aug 21, 2023 |
| 18231221 | PULSE STRETCHER SYSTEM AND METHOD | KING, JOSHUA | 2828 | §103 | Non-Final OA | — | Pending | Aug 07, 2023 |
| 18230127 | IMAGE SEGMENTATION FOR EXAMINING A SEMICONDUCTOR SPECIMEN | HWANG, JINSU | 2667 | §101 | Final Rejection | — | Pending | Aug 03, 2023 |
| 18112876 | METHODS AND SYSTEMS FOR MICROSCOPY | NGUYEN, THONG Q | 2872 | §112 | Final Rejection | 12d | Pending | Feb 22, 2023 |
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