25 pending office actions
| App # | Title | Examiner | Art Unit | Status | Filed |
|---|---|---|---|---|---|
| 18774820 | AN ARTIFICIAL INTELLIGENCE BASED METHOD FOR PRESENTING DATA RELATED TO DEFECTS DISCOVERED BY AN INSPECTION SYSTEM | COCHRAN, BRIANNA RENAE | 2615 | Non-Final OA | Jul 16, 2024 |
| 18769022 | AUTOMATIC GENERATION AND PLANTING OF SYNTHETIC DEFECTS OF INTEREST AND GENERATION OF SYNTHETIC FAULT IMAGES OF SEMICONDUCTOR SPECIMENS | RENZE, GEORGE NICHOLAS | 2613 | Non-Final OA | Jul 10, 2024 |
| 18754131 | ALGORITHM FOR 3D RECONSTRUCTION OF DIAGONALLY CUT SEMICONDUCTOR LOGIC STRUCTURE | DU, HAIXIA | 2611 | Non-Final OA | Jun 25, 2024 |
| 18749474 | HYBRID VACUUM ELECTROSTATIC CHUCK CARRIER FOR HIGH WARPAGE WAFERS | SREEVATSA, SREEYA | 2838 | Non-Final OA | Jun 20, 2024 |
| 18625121 | EDGE DETECTION FOR GREYSCALE IMAGES | PATEL, JAYESH A | 2677 | Non-Final OA | Apr 02, 2024 |
| 18584963 | UNSUPERVISED METHOD TO INCREASE SIGNAL-TO-NOISE-RATIO OF DEFECTS IN AN INSPECTION SYSTEM | SOHRABY, PARDIS | 2664 | Non-Final OA | Feb 22, 2024 |
| 18583777 | OPTIMAL DETERMINATION OF AN OVERLAY TARGET USING MACHINE LEARNING | PATEL, PINALBEN V | 2673 | Non-Final OA | Feb 21, 2024 |
| 18582549 | REGISTRATION BETWEEN AN INSPECTION IMAGE AND A DESIGN IMAGE | LI, RUIPING | 2676 | Non-Final OA | Feb 20, 2024 |
| 18411009 | DETERMINATION OF UNDERCUT SIDEWALLS BASED ON AN IMAGE OF A SEMICONDUCTOR SPECIMEN | DIGUGLIELMO, DANIELLA MARIE | 2666 | Non-Final OA | Jan 11, 2024 |
| 18402619 | NONDESTRUCTIVE ESTIMATION OF STRUCTURAL PROPERTIES OF A SPECIMEN VIA X-RAY MODELLING BASED ON SIMULATIONS AND GROUND TRUTH MEASUREMENTS | MCCORMACK, JASON L | 2881 | Non-Final OA | Jan 02, 2024 |
| 18402641 | DETERMINATION OF LAYER PROPERTIES USING WIDENING OF AN ELECTRON BEAM | WANG, JING | 2881 | Non-Final OA | Jan 02, 2024 |
| 18393570 | CROSSTALK CORRECTION FOR IMAGES OF SEMICONDUCTOR SPECIMENS | SHEN, QUN | 2662 | Final Rejection | Dec 21, 2023 |
| 18391562 | MIRROR-BASED RELAY FOR AN OPTICAL INSPECTION SYSTEM | RIZVI, AKBAR HASSAN | 2877 | Final Rejection | Dec 20, 2023 |
| 18389710 | FOURIER TRANSFORM BASED MACHINE LEARNING FOR DEFECT EXAMINATION OF SEMICONDUCTOR SPECIMENS | AUGUSTIN, MARCELLUS | 2682 | Non-Final OA | Dec 19, 2023 |
| 18529495 | WAFER INSPECTION USING A DYNAMIC SCAN PLAN | CROCKETT, JOSHUA BRIGHAM | 2661 | Non-Final OA | Dec 05, 2023 |
| 18528737 | CALIBRATION OF AN EXAMINATION SYSTEM | SMITH, DAVID E | 2881 | Non-Final OA | Dec 04, 2023 |
| 18510505 | VACUUM CHUCK FOR HIGH WARPAGE WAFERS | TON, TRI T | 2877 | Final Rejection | Nov 15, 2023 |
| 18370303 | METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES | LI, LARRY | 2881 | Non-Final OA | Sep 19, 2023 |
| 18237854 | NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES | GASSEN, CHRISTOPHER J | 2881 | Non-Final OA | Aug 24, 2023 |
| 18231567 | DEPTH-PROFILING OF SAMPLES BASED ON X-RAY MEASUREMENTS | DALBO, MICHAEL J | 2857 | Non-Final OA | Aug 08, 2023 |
| 18198768 | ELECTRON BEAM SPOT SHAPE RECONSTRUCTION UNIT | VANORE, DAVID A | 2878 | Final Rejection | May 17, 2023 |
| 18112876 | METHODS AND SYSTEMS FOR MICROSCOPY | NGUYEN, THONG Q | 2872 | Non-Final OA | Feb 22, 2023 |
| 18099169 | FILLING EMPTY STRUCTURES BY DEPOSITION UNDER SEM - BALANCING PARAMETERS BY GAS FLOW CONTROL | LOGIE, MICHAEL J | 2881 | Non-Final OA | Jan 19, 2023 |
| 17891473 | ENERGY DISPERSIVE X-RAY SPECTROSCOPY SENSING UNIT BACKGROUND | CHOI, JAMES J | 2878 | Final Rejection | Aug 19, 2022 |
| 17496156 | SEGMENTING AN IMAGE USING A NEURAL NETWORK | GORMLEY, AARON PATRICK | 2148 | Final Rejection | Oct 07, 2021 |
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