Prosecution Insights
Last updated: April 19, 2026
Application No. 18/391,808

Charged Particle Gun and Charged Particle Beam Apparatus

Non-Final OA §102
Filed
Dec 21, 2023
Examiner
IPPOLITO, NICOLE MARIE
Art Unit
2881
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Hitachi High-Tech Corporation
OA Round
1 (Non-Final)
87%
Grant Probability
Favorable
1-2
OA Rounds
2y 2m
To Grant
96%
With Interview

Examiner Intelligence

Grants 87% — above average
87%
Career Allow Rate
1485 granted / 1714 resolved
+18.6% vs TC avg
Moderate +10% lift
Without
With
+9.5%
Interview Lift
resolved cases with interview
Typical timeline
2y 2m
Avg Prosecution
15 currently pending
Career history
1729
Total Applications
across all art units

Statute-Specific Performance

§101
1.0%
-39.0% vs TC avg
§103
30.8%
-9.2% vs TC avg
§102
31.4%
-8.6% vs TC avg
§112
15.6%
-24.4% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1714 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1-2, 4-5, 9 and 11 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Dinu-Gurtler et al. (U.S. Patent Application Publication Number 20150187533, from hereinafter “Dinu”). In regards to claim 1, Dinu teaches a charged particle gun (see the title, an electron gun) comprising a charged particle source that generates a charged particle (see the abstract that teaches a cathode body that does just that), an electron portion that includes an extraction electrode for extracting a charged particle beam from a charged particle source (Fig. 1a, heather cathode 50, cathode arrangement 20, focusing electrode 40 that, as FIG. 1a illustrates, likewise extracts from the heather cathode 50, paragraph 0093), a voltage introduction unit that introduces voltage to the electrode portion (this is implicit, the electrode would be non-functional if not powered) and a temperature adjustment unit that adjusts a temperature of the electrode portion (paragraphs 0006, 0009, 0020, 0028-0029, 0040-0043, 0101-0102) wherein the temperature unit is configured to adjust the temperature of the electrode portion based on a change in state of the electrode portion (paragraphs 0006, 0009, 0020, 0028-0029, 0040-0043, 0101-0102). In regards to claim 2, Dinu teaches that the temperature adjustment unit adjusts the temperature of the electrode portion based on current and voltage of the electrode portion (paragraphs 0006, 0009, 0020, 0028-0029, 0040-0043, 0101-0102). In regards to claim 4, Dinu teaches that the extraction electrode includes a plurality of a divided electrodes (FIGS. 2A-2B) and the temperature adjustment unit includes a temperature adjustment unit connected to each of the plurality of divided electrodes (paragraphs 0006, 0009, 0020, 0028-0029, 0040-0043, 0101-0102) . In regards to claim 5, Dinu teaches that the electrode portion includes the extraction electrode and a voltage introduction electrode connected to the extraction electrode for introducing voltage to the extraction electrode and the temperature introduction unit is connected to the voltage introduction electrode (paragraphs 0006, 0009, 0020, 0028-0029, 0040-0043, 0101-0102). In regards to claim 9, Dinu teaches a diaphragm disposed below the extraction electrode wherein a hole diameter of the diaphragm is smaller than a hole diameter of the extraction electrode (FIGS. 1A-1B and 4 illustrate this). In regards to claim 11, Dinu teaches a charged particle beam apparatus comprising the charged particle gun (the title teaches a lithography device). Allowable Subject Matter Claims 3, 6-8 and 10 objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to NICOLE M IPPOLITO whose telephone number is (571)270-7449. The examiner can normally be reached Monday-Thursday 6:00am-4:00pm Mountain Time. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Robert H Kim can be reached at 571-272-2293. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /NICOLE M IPPOLITO/Primary Examiner, Art Unit 2881
Read full office action

Prosecution Timeline

Dec 21, 2023
Application Filed
Jan 20, 2026
Non-Final Rejection — §102 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12599782
BORON NEUTRON CAPTURE THERAPY SYSTEM AND TREATMENT PLAN GENERATION METHOD THEREFOR
2y 5m to grant Granted Apr 14, 2026
Patent 12599783
QUALITY ASSURANCE FOR A RADIOTHERAPY DEVICE
2y 5m to grant Granted Apr 14, 2026
Patent 12601968
METHOD AND APPARATUS FOR PROCESSING A SAMPLE
2y 5m to grant Granted Apr 14, 2026
Patent 12592372
ION FUNNEL-BASED COLLISION CELL
2y 5m to grant Granted Mar 31, 2026
Patent 12586692
X-RAY PROTECTIVE GARMENT
2y 5m to grant Granted Mar 24, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

AI Strategy Recommendation

Get an AI-powered prosecution strategy using examiner precedents, rejection analysis, and claim mapping.
Powered by AI — typically takes 5-10 seconds

Prosecution Projections

1-2
Expected OA Rounds
87%
Grant Probability
96%
With Interview (+9.5%)
2y 2m
Median Time to Grant
Low
PTA Risk
Based on 1714 resolved cases by this examiner. Grant probability derived from career allow rate.

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month