Tech Center 2800 • Art Units: 2853 2881
This examiner grants 87% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18391808 | Charged Particle Gun and Charged Particle Beam Apparatus | Non-Final OA | Hitachi High-Tech Corporation |
| 18556927 | SAMPLE IMAGE OBSERVATION DEVICE AND METHOD | Non-Final OA | Hitachi High-Tech Corporation |
| 18393233 | Method for Alignment Free Ion Column | Non-Final OA | FEI Company |
| 18555379 | ULTRAVIOLET LIGHT IRRADIATION DEVICE | Non-Final OA | Ushio Denki Kabushiki Kaisha |
| 18393329 | SEMICONDUCTING COLD PHOTOCATHODE DEVICE USING ELECTRIC FIELD TO CONTROL THE ELECTRON AFFINITY | Non-Final OA | ATTOLIGHT AG |
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