Prosecution Insights
Last updated: May 29, 2026
Application No. 18/397,967

METHODS OF FORMING MICROELECTRONIC DEVICES, AND RELATED MEMORY DEVICES AND ELECTRONIC SYSTEMS

Non-Final OA §103§112
Filed
Dec 27, 2023
Priority
Nov 19, 2020 — divisional of 11/869,841
Examiner
TRAN, TONY
Art Unit
2893
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Micron Technology, Inc.
OA Round
5 (Non-Final)
70%
Grant Probability
Favorable
5-6
OA Rounds
4m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 70% — above average
70%
Career Allowance Rate
603 granted / 858 resolved
+2.3% vs TC avg
Strong +34% interview lift
Without
With
+34.0%
Interview Lift
resolved cases with interview
Typical timeline
2y 9m
Avg Prosecution
25 currently pending
Career history
919
Total Applications
across all art units

Statute-Specific Performance

§101
0.2%
-39.8% vs TC avg
§103
82.7%
+42.7% vs TC avg
§102
16.3%
-23.7% vs TC avg
§112
0.5%
-39.5% vs TC avg
Black line = Tech Center average estimate • Based on career data from 858 resolved cases

Office Action

§103 §112
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Continued Examination Under 37 CFR 1.114 A request for continued examination under 37 CFR 1.114, including the fee set forth in 37 CFR 1.17(e), was filed in this application after final rejection. Since this application is eligible for continued examination under 37 CFR 1.114, and the fee set forth in 37 CFR 1.17(e) has been timely paid, the finality of the previous Office action has been withdrawn pursuant to 37 CFR 1.114. Applicant's submission filed on 02/11/2026 has been entered. Claim Rejections - 35 USC § 112 The following is a quotation of the first paragraph of 35 U.S.C. 112(a): (a) IN GENERAL.—The specification shall contain a written description of the invention, and of the manner and process of making and using it, in such full, clear, concise, and exact terms as to enable any person skilled in the art to which it pertains, or with which it is most nearly connected, to make and use the same, and shall set forth the best mode contemplated by the inventor or joint inventor of carrying out the invention. The following is a quotation of the first paragraph of pre-AIA 35 U.S.C. 112: The specification shall contain a written description of the invention, and of the manner and process of making and using it, in such full, clear, concise, and exact terms as to enable any person skilled in the art to which it pertains, or with which it is most nearly connected, to make and use the same, and shall set forth the best mode contemplated by the inventor of carrying out his invention. Claim 11 rejected under 35 U.S.C. 112(a) or 35 U.S.C. 112 (pre-AIA ), first paragraph, because the best mode contemplated by the inventor or a joint inventor, or for applications subject to pre-AIA 35 U.S.C. 112, the inventor(s) has not been disclosed. Evidence of concealment of the best mode is based upon claim 14 such as “the upper end of the intervention portion adjacent to the upper portion having a fourth width substantially same as the second width of the upper portion” wherein the tolerant difference of the word substantially is not specified. Appropriate action is required. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 11 and 14 is/are rejected under 35 U.S.C. 103 as being unpatentable over Zhao (Pub. No.: US 2021/0391353) filed in the IDS on 02/27/2023 in view of JEON (Pub. No.: US 2020/0365213). PNG media_image1.png 777 885 media_image1.png Greyscale Re claim 11, Zhao, FIGS. 3A-3B teaches a memory device, comprising: a stack structure comprising a vertically alternating sequence of insulative structures (324, ¶ [0052]) and conductive structures (326); at least one source structure (332) underlying the stack structure; cell pillar structures (310, [0055]) vertically extending through the stack structure and coupled to the at least one source structure; cell contact structures (312) coupled to cell pillar structures; conductive plug structures (336+340+342) in physical contact with the cell contact structures (312), each of the conductive plug structures (336+340+342) comprising: a first portion (336) having a first variable width throughout a first vertical height of the first portion, a second portion (342) having an upper end and a lower end opposite to the upper end, the lower end of the second portion vertically adjacent to overlying the first portion (336) and having a second width substantially same as the first width of the first portion (upper most portion of 336); a third portion adjacent to the upper end of the second portion and having a third width throughout a third vertical height of the third portion (340), digit line contact structures (bit line, [0056]) overlying and coupled to the conductive plug structures. Zhao fails to teach a first portion (336) having a first width throughout a first vertical height of the first portion, digit line contact structures in physical contact with the conductive plug structures; the third width of the third portion greater than the first width of the first portion; and digit line structures coupled to the digit line contact structures. PNG media_image2.png 723 1334 media_image2.png Greyscale JEON, FIG. 17 [as shown above] teaches a first portion [FP] having a first width throughout a first vertical height of the first portion, digit line contact structures (4371c/4372c/4271c) in physical contact with the conductive plug structures ([FP]/[SP]/[TP]), the third width of the third portion (the uppermost horizontal width of [TP], note that the third portion is NOW including a little horizontal portion on the top) greater than the first width of the first portion (horizontal width of the [FP], note that as shown in FIG. 3B above, [TP] is a little bit greater than [FP]); and digit line structures (4240c/4230c/4220c) coupled to the digit line contact structures (4371c/4372c/4271c). It would have been obvious for a person of ordinary skill in the art before the effective filing date of the claim invention to include the above said teaching for the purpose of enhancing the connectivity as taught by JEON, [0004]. Furthermore, the following limitation “the second portion exhibiting arcuate sidewalls having a concave shape” had a little patentable weight because it has been held that where the only difference between the prior art and the claims was a recitation of relative size or shape of the claimed device, and a device having the claimed relative size or shape would not perform differently than the prior art device, the claimed device was not patentably distinct from the prior art device (MPEP §2144.04) and it would have been obvious that a mere change in shape of a component is generally recognized as being within the level of ordinary skill in the art. Re claim 14, Zhao, FIGS. 3A-3B teaches an electronic system, comprising: at least one microelectronic device structure comprising: vertically extending strings of memory cells (310, [0055]) coupled to access line structures and at least one source structure; conductive structures (336+340+342) overlying and coupled to the vertically extending strings of memory cells, each of the conductive structures comprising: a lower portion having a first width (336); an upper portion (342) having a second width greater than the first width; and digit line structures (bit line, [0056]) coupled to the digit line contact structures (336+340+342). Zhao fails to teach an input device; an output device; a processor device operably coupled to the input device and the output device; and a memory device operably coupled to the processor device and comprising at least one microelectronic device structure comprising: an intervening portion having a lower end adjacent to the lower portion and an upper end adjacent to the upper portion, the intervening portion exhibiting arcuate sidewalls having a concave shape, the lower end of the intervention portion adjacent to the lower portion having a third width substantially same as the first width of the lower portion, the upper end of the intervention portion adjacent to the upper portion having a fourth width substantially same as the second width of the upper portion; digit line contact structures in physical contact with the conductive plug structures; and digit line structures coupled to the digit line contact structures. JEON, FIG. 17 [as shown above] teaches an input device (530, FIGS. 1-2); an output device (530); a processor device (560) operably coupled to the input device and the output device; and a memory device (300) operably coupled to the processor device and comprising at least one microelectronic device structure comprising: an intervening portion [TP] having a lower end adjacent to the lower portion and an upper end adjacent to the upper portion, the intervening portion exhibiting arcuate sidewalls having a concave shape, the lower end of the intervention portion adjacent to the lower portion [SP] having a third width substantially same as the first width of the lower portion, the upper end of the intervention portion adjacent to the upper portion (the uppermost horizontal width of [TP], note that the intervening portion is NOW including a little horizontal portion on the top) having a fourth width substantially same as the second width of the upper portion (horizontal width of [SP]); digit line contact structures (4371c/4372c/4271c) in physical contact with the conductive plug structures ([FP]/[SP]/[TP]); and digit line structures (4240c/4230c/4220c) coupled to the digit line contact structures (4371c/4372c/4271c). It would have been obvious for a person of ordinary skill in the art before the effective filing date of the claim invention to include the above said teaching for the purpose of enhancing the connectivity as taught by JEON, [0004]. Furthermore, the following limitation “the intervening portion exhibiting arcuate sidewalls having a concave shape” had a little patentable weight because it has been held that where the only difference between the prior art and the claims was a recitation of relative size or shape of the claimed device, and a device having the claimed relative size or shape would not perform differently than the prior art device, the claimed device was not patentably distinct from the prior art device (MPEP §2144.04) and it would have been obvious that a mere change in shape of a component is generally recognized as being within the level of ordinary skill in the art. Claim(s) 11, 13-15 and 20 is/are rejected under 35 U.S.C. 103 as being unpatentable over LEE (Pub. No.: US 2017/0287930) in view of JEON. Re claim 11, LEE, FIG. 13 teaches a memory device, comprising: a stack structure comprising a vertically alternating sequence of insulative structures (ILD, ¶ [0054]) and conductive structures (EL); at least one source structure (15, [0116]) underlying the stack structure; cell pillar structures (VS1/HS1/DVS/DSP, [0073]) vertically extending through the stack structure and coupled to the at least one source structure; cell contact structures (PAD) coupled to cell pillar structures; conductive plug structures (LCP/SBL1/UCP) in physical contact with the cell contact structures (PAD), each of the conductive plug structures (LCP/SBL1/UCP) comprising: a first portion (LCP) vertically adjacent to the respective cell contact structure and having a first vertical height, the first portion (LCP) exhibiting a first substantially uniform horizontal width throughout the first vertical height; a second portion (SBL1) overlying the first portion; a third portion (UCP) overlying the second portion and having a third vertical height, the third portion exhibiting a third substantially uniform horizontal width (UCP) throughout the third vertical height; digit line contact structures (BL1) in physical contact with the conductive plug structures (LCP/SBL1/UCP), LEE fails to teach a first portion having a first width throughout a first vertical height of the first portion, a second portion having an upper end and a lower end opposite to the upper end, the lower end of the second portion vertically adjacent to overlying the first portion and having a second width substantially same as the first width of the first portion; a third portion adjacent to the upper end of the second portion and having a third width throughout a third vertical height of the third portion, the third width of the third portion greater than the first width of the first portion; and digit line structures coupled to the digit line contact structures. JEON, FIG. 17 [as shown above] teaches a first portion [FP] having a first width throughout a first vertical height of the first portion, a second portion [SP] having an upper end and a lower end opposite to the upper end, the lower end of the second portion vertically adjacent to overlying the first portion [FP] and having a second width substantially same as the first width of the first portion [FP]; a third portion adjacent to the upper end of the second portion and having a third width throughout a third vertical height of the third portion [TP], the third width of the third portion (the horizontal width of the uppermost portion of [TP], note that the third portion is NOW including a little horizontal portion on the top) greater than the first width of the first portion (the horizontal width of the [FP]); and digit line structures (4240c/4230c/4220c) coupled to the digit line contact structures (4371c/4372c/4271c). It would have been obvious for a person of ordinary skill in the art before the effective filing date of the claim invention to include the above said teaching for the purpose of enhancing the connectivity as taught by JEON, [0004]. Furthermore, the following limitation “the second portion exhibiting arcuate sidewalls having a concave shape” had a little patentable weight because it has been held that where the only difference between the prior art and the claims was a recitation of relative size or shape of the claimed device, and a device having the claimed relative size or shape would not perform differently than the prior art device, the claimed device was not patentably distinct from the prior art device (MPEP §2144.04) and it would have been obvious that a mere change in shape of a component is generally recognized as being within the level of ordinary skill in the art. Re claim 13, in the combination, LEE, FIG. 13 teaches the memory device of claim 11, further comprising a base structure vertically underlying the stack structure and comprising a control logic circuitry (GST of FIGS. 2) coupled to the at least one source structure, the digit line structures (BT1/BT2), and the conductive structures (EL) of the stack structure. Re claim 14, LEE, FIG. 11 teaches an electronic system, comprising: an input device (5, FIG. 1); an output device (2/3); a processor device (5) operably coupled to the input device and the output device; and a memory device operably coupled to the processor device and comprising at least one microelectronic device structure comprising: vertically extending strings of memory cells (MCT of FIG. 2 or DS of FIG. 11, [0048]) coupled to access line structures and at least one source structure; conductive structures (PAD/LCP/SEL1) overlying and coupled to the vertically extending strings of memory cells, each of the conductive structures comprising: a lower portion (PAD) having a first width; an upper portion (SBL1) having a second width greater than the first width; an intervening portion (LCP) between the lower portion and the upper portion; and digit line contact structures (BT1/BT2/UCP) in physical contact with the conductive structures (PAD/SBL1/LCP). However, LEE fails to teach a lower portion having a first width; an upper portion having a second width greater than the first width; and an intervening portion having a lower end adjacent to the lower portion and an upper end adjacent to the upper portion, the intervening portion exhibiting arcuate sidewalls having a concave shape, the lower end of the intervention portion adjacent to the lower portion having a third width substantially same as the first width of the lower portion, the upper end of the intervention portion adjacent to the upper portion having a fourth width substantially same as the second width of the upper portion; and digit line structures coupled to the digit line contact structures. JEON, FIG. 17 [as shown above] teaches a lower portion [FP] having a first width; an upper portion [SP] having a second width greater than the first width; and an intervening portion [TP] having a lower end adjacent to the lower portion and an upper end adjacent to the upper portion, the intervening portion exhibiting arcuate sidewalls having a concave shape, the lower end of the intervention portion adjacent to the lower portion having a third width substantially same as the first width of the lower portion, the upper end of the intervention portion adjacent to the upper portion (the uppermost horizontal width of [TP], note that the intervening portion is NOW including a little horizontal portion on the top) having a fourth width substantially same as the second width of the upper portion (horizontal width of [SP]); and digit line structures (4240c/4230c/4220c) coupled to the digit line contact structures (4371c/4372c/4271c). It would have been obvious for a person of ordinary skill in the art before the effective filing date of the claim invention to include the above said teaching for the purpose of enhancing the connectivity as taught by JEON, [0004]. Furthermore, the following limitation “the intervening portion exhibiting arcuate sidewalls having a concave shape” had a little patentable weight because it has been held that where the only difference between the prior art and the claims was a recitation of relative size or shape of the claimed device, and a device having the claimed relative size or shape would not perform differently than the prior art device, the claimed device was not patentably distinct from the prior art device (MPEP §2144.04) and it would have been obvious that a mere change in shape of a component is generally recognized as being within the level of ordinary skill in the art. Re claim 15, LEE, FIG. 11 teaches the electronic system of claim 14, wherein the memory device comprises a 3D NAND Flash memory device (Abstract). Re claim 20, in the combination, LEE, FIG. 13 teaches the electronic system of claim 14, wherein each of the digit line contact structures (BL1/BL1/UCP) has respectively having a horizontal center offset from a horizontal center of a respective one of the conductive structures (PAD/LCP/SBL1) in physical contract therewith. Claim(s) 12 is/are rejected under 35 U.S.C. 103 as being unpatentable over LEE in view of JEON and further in view of Zhu (Pub. No.: US 20210020566) filed in the IDS on 02/27/2023. LEE/JEON teaches all the limitation of claim 11. LEE/JEON fails to teach the limitation of claim 12. Zhu teaches a dielectric oxide material (top most dielectric layer 108, FIG. 1A, ¶ [0031]) overlying the stack structure and horizontally adjacent the first horizontal boundaries of the first portion (122) of each of the conductive plug structures; a dielectric nitride material (124/126, [0035]) on the dielectric oxide material and horizontally adjacent second horizontal boundaries of the second portion (128) of each of the conductive plug structures; and an additional dielectric oxide material (132, [0039]) on the dielectric nitride material and horizontally adjacent third horizontal boundaries of the third portion (134) of each of the conductive plug structures. It would have been prima facie obvious to one of ordinary skill in the art at the time the invention was made to include the above said teaching for the purpose of providing an electrical isolation layer and preventing the electrical short as taught by Zhu. Claim(s) 16-19 is/are rejected under 35 U.S.C. 103 as being unpatentable over LEE in view of JEON and further in view of Zhu. Re claim 16, LEE/JEON teaches all the limitation of claim 14. LEE/JEON fails to teach the limitation of claim 16. Zhu, FIG. 1A teaches a first dielectric material (top most dielectric layer 108, ¶ [0030]) vertically overlying the stack structure and in physical contact with sidewalls of the lower portion (122) each of the conductive structures; a second dielectric material (124/126) vertically overlying and having a different material composition than the first dielectric material, the second dielectric material in physical contact with sidewalls of the intervening portion (128) of each of the conductive structures; and a third dielectric material (132, [0039]) vertically overlying and having a different material composition than the second dielectric material, the third dielectric material in physical contact with sidewalls of the upper portion (134) of each of the conductive structures. It would have been prima facie obvious to one of ordinary skill in the art at the time the invention was made to include the above said teaching for the purpose of providing an electrical isolation layer and preventing the electrical short as taught by Zhu. Re claim 17, in the combination, Zhu, FIG. 1A teaches the electronic system of claim 16, wherein: the upper portion of each of the conductive structures (134) is substantially confined within a vertical span of the third dielectric material (132); and the intervening portion of each of the conductive structures (128) is substantially confined within a vertical span of the second dielectric material (124/126). Re claim 18, in the combination, Zhu, FIG. 1A teaches the electronic system of claim 16, wherein: the first dielectric material is SiO2 (108, FIG. 1A, ¶ [0031]); the second dielectric material is Si3N4 (124/126, [0035]); and the third dielectric material is additional SiO2 (132, [0039]). Re claim 19, in the combination, Fay, FIG. 7 teaches the electronic system of claim 16, wherein: the sidewalls of the lower portion of each of the conductive structures vertically extend in substantially linear paths (120); the sidewalls of the upper portion of each of the conductive structures vertically extend in additional substantially linear paths (106); and the sidewalls of the intervening portion of each of the conductive structures vertically extend in curved paths (110/108). Response to Arguments Applicant's arguments with respect to claims 11-20 on the remarks filed on 11/14/2025 have been considered but are not persuasive because: PNG media_image3.png 200 400 media_image3.png Greyscale In re claim 11, JEON, FIG. 17 [as shown above] teaches a first portion [FP] having a first width throughout a first vertical height of the first portion, a second portion [SP] having an upper end and a lower end opposite to the upper end, the lower end of the second portion vertically adjacent to overlying the first portion [FP] and having a second width substantially same as the first width of the first portion [FP]; a third portion adjacent to the upper end of the second portion and having a third width throughout a third vertical height of the third portion [TP], the third width of the third portion (the horizontal width of the uppermost portion of [TP], note that the third portion is NOW including a little horizontal portion on the top) greater than the first width of the first portion (the horizontal width of the [FP]). In re claim 14, JEON, FIG. 17 [as shown above] teaches a lower portion [FP] having a first width; an upper portion [SP] having a second width greater than the first width; and an intervening portion [TP] having a lower end adjacent to the lower portion and an upper end adjacent to the upper portion, the intervening portion exhibiting arcuate sidewalls having a concave shape, the lower end of the intervention portion adjacent to the lower portion having a third width substantially same as the first width of the lower portion, the upper end of the intervention portion adjacent to the upper portion (the uppermost horizontal width of [TP], note that the intervening portion is NOW including a little horizontal portion on the top) having a fourth width substantially same as the second width of the upper portion (horizontal width of [SP]). Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to TONY TRAN whose telephone number is (571)270-1749. The examiner can normally be reached Monday-Friday, 8AM-5PM, EST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Britt Hanley can be reached on 571-270-3042. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /TONY TRAN/Primary Examiner, Art Unit 2893
Read full office action

Prosecution Timeline

Show 6 earlier events
Jun 23, 2025
Response after Non-Final Action
Jul 16, 2025
Non-Final Rejection mailed — §103, §112
Oct 20, 2025
Response Filed
Dec 05, 2025
Final Rejection mailed — §103, §112
Jan 30, 2026
Response after Non-Final Action
Feb 11, 2026
Request for Continued Examination
Feb 23, 2026
Response after Non-Final Action
Apr 09, 2026
Non-Final Rejection mailed — §103, §112 (current)

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Prosecution Projections

5-6
Expected OA Rounds
70%
Grant Probability
99%
With Interview (+34.0%)
2y 9m (~4m remaining)
Median Time to Grant
High
PTA Risk
Based on 858 resolved cases by this examiner. Grant probability derived from career allowance rate.

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