Prosecution Insights
Last updated: April 19, 2026
Application No. 18/402,974

VERTICAL SEMICONDUCTOR COMPONENT, IN PARTICULAR VERTICAL TRANSISTOR, WITH MINIMIZED SOURCE-DRAIN LEAKAGE CURRENTS

Non-Final OA §102§103
Filed
Jan 03, 2024
Examiner
TURNER, BRIAN
Art Unit
2818
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Robert Bosch GmbH
OA Round
1 (Non-Final)
83%
Grant Probability
Favorable
1-2
OA Rounds
2y 3m
To Grant
88%
With Interview

Examiner Intelligence

Grants 83% — above average
83%
Career Allow Rate
614 granted / 741 resolved
+14.9% vs TC avg
Minimal +5% lift
Without
With
+4.6%
Interview Lift
resolved cases with interview
Typical timeline
2y 3m
Avg Prosecution
61 currently pending
Career history
802
Total Applications
across all art units

Statute-Specific Performance

§101
1.4%
-38.6% vs TC avg
§103
59.5%
+19.5% vs TC avg
§102
22.6%
-17.4% vs TC avg
§112
13.5%
-26.5% vs TC avg
Black line = Tech Center average estimate • Based on career data from 741 resolved cases

Office Action

§102 §103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Objections Claim 13 is objected to because of the following informalities: Claim 13 should be amended as follows to correct an apparent typographic error. 13. (New) The semiconductor component according to claim 7, wherein the semiconductor layer structure has at least one gallium nitride layer or is produced based on gallium nitride. Appropriate correction is required. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 7-8, 10-11 and 13 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Saitoh et al. (PG Pub. No. US 2014/0203329 A1). Regarding claim 7, Saitoh teaches a vertical semiconductor component (figs. 1, 6), comprising: a vertically lower drain electrode (¶ 0057: 33); a semiconductor layer structure (¶ 0050: 15) arranged vertically above the drain electrode (fig. 1: 14 arranged above 33), wherein the semiconductor layer structure has at least one drift layer (¶ 0050: 25) and a trench- shaped conduction channel (¶¶ 0051, 0088 19, 69), wherein a vertically lower end region of the conduction channel adjoins the drift layer (fig. 1: lower end of 19 adjoins 25), and wherein a gate electrode (¶ 0049: 23) is formed vertically above the conduction channel (fig. 1: 23 formed above 19) and the conduction channel is conductively connected to a source electrode (fig. 1: 19 conductively connected to source electrode 31); wherein the conduction channel has, in an at least partially vertically extending wall portion (figs. 1, 6: sloped portion of 19/69), a gradation, which is delimited by an upper and a lower boundary surface of the conduction channel (figs. 1, 6: 19/69 includes upper and lower surfaces) such that the wall portion has a lateral outer portion (figs. 1, 6: portion of 19/69 connected to 31) and a lateral inner portion (figs. 1, 6: portion of 19/69 connected to 25) which are connected to one another via a lateral intermediate portion (portion of 19/69 extending between 31 and 25), wherein the intermediate portion has a reduced cross-section compared with the outer portion and the inner portion (fig. 6: sloped portion of 19/69 thinner than end portions of 19/69, meeting the broadest reasonable interpretation of “reduced cross-section”). Regarding claim 8, Saitoh teaches the semiconductor component according to claim 7, wherein the semiconductor component is a vertical transistor (¶ 0109). Regarding claim 10, Saitoh teaches the semiconductor component according to claim 7, wherein, in the lateral region of the intermediate portion, a lower boundary surface of the conduction channel adjoins a p- doped shielding layer (¶ 0050 & fig. 1: end of sloped portion of 19 adjoins p-doped blocking layer 27). Regarding claim 11, Saitoh teaches the semiconductor component according to claim 7, wherein the intermediate portion has a maximum layer thickness of 0.7 um (¶ 0032: 20 nm). Regarding claim 13, Saitoh teaches the semiconductor component according to claim 7, wherien the semiconductor layer structure has at least one gallium nitride layer or is produced based on gallium nitride (¶ 0050). Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. The factual inquiries for establishing a background for determining obviousness under 35 U.S.C. 103 are summarized as follows: 1. Determining the scope and contents of the prior art. 2. Ascertaining the differences between the prior art and the claims at issue. 3. Resolving the level of ordinary skill in the pertinent art. 4. Considering objective evidence present in the application indicating obviousness or nonobviousness. Claim 12 is rejected under 35 U.S.C. 103 as being unpatentable over Saitoh as applied to claim 7 above, and further in view of Shibata et al. (PG Pub. No. US 2021/0167061 A1). Regarding claim 12, Saitoh teaches the semiconductor component according to claim 7, wherein the conduction channel is contacted on a lateral side of the gate electrode with a source electrode or a portion of a source electrode (¶ 0056, fig. 1: 19 contacted on a lateral side of 23 with source electrode 31). Saitoh does not teach the conduction channel is contacted on both lateral sides of the gate electrode with a source electrode. Shibata teaches a semiconductor component (¶ 0108 & fig. 3: 10) including a conduction channel (¶ 0144: 30) contacted on both lateral sides of a gate electrode (¶ 0109 & fig. 3: both lateral sides of 30 with respect to gate electrode 44) with a source electrode (¶ 0110 & fig. 3: both lateral sides of 30 contact a source electrode 40). It would have been obvious to one of ordinary skill in the art at the time the invention was filed to configure the semiconductor component of Saitoh with the lateral source connections of Shibata, as a means to increase contact area between the source electrode(s) and the channel layer, reducing parasitic resistance, increasing channel conduction, and enhancing device performance. Allowable Subject Matter Claim 9 is objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. The following is a statement of reasons for the indication of allowable subject matter: Saitoh teaches a semiconductor component comprising an intermediate portion (sloped portion of channel layer 19/69). However, Saitoh does not teach wherein the intermediate portion is configured so as to be planar in a lateral direction, perpendicular to a vertical direction. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to BRIAN TURNER whose telephone number is (571)270-5411. The examiner can normally be reached M-F 8am-5pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Eva Montalvo can be reached at 571-270-3829. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /BRIAN TURNER/Examiner, Art Unit 2818
Read full office action

Prosecution Timeline

Jan 03, 2024
Application Filed
Mar 05, 2026
Non-Final Rejection — §102, §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
83%
Grant Probability
88%
With Interview (+4.6%)
2y 3m
Median Time to Grant
Low
PTA Risk
Based on 741 resolved cases by this examiner. Grant probability derived from career allow rate.

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