Prosecution Insights
Last updated: May 29, 2026
Application No. 18/424,927

CONTACT PROBE AND PROBE UNIT

Non-Final OA §102
Filed
Jan 29, 2024
Priority
Feb 02, 2023 — JP 2023-014708
Examiner
PATEL, PARESH H
Art Unit
2858
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Nhk Spring Co. Ltd.
OA Round
1 (Non-Final)
79%
Grant Probability
Favorable
1-2
OA Rounds
4m
Est. Remaining
78%
With Interview

Examiner Intelligence

Grants 79% — above average
79%
Career Allowance Rate
745 granted / 938 resolved
+11.4% vs TC avg
Minimal -1% lift
Without
With
+-1.3%
Interview Lift
resolved cases with interview
Typical timeline
2y 8m
Avg Prosecution
23 currently pending
Career history
962
Total Applications
across all art units

Statute-Specific Performance

§101
0.6%
-39.4% vs TC avg
§103
59.7%
+19.7% vs TC avg
§102
23.4%
-16.6% vs TC avg
§112
7.1%
-32.9% vs TC avg
Black line = Tech Center average estimate • Based on career data from 938 resolved cases

Office Action

§102
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Election/Restrictions Applicant’s election without traverse of Fig. 3, claims 1, 4 and 7 in the reply filed on 02/09/2026 is acknowledged. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1, 4 and 7 are is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Yamamoto (US 2018/0335447 A1). Regarding claim 1, Yamamoto at fig. 3 (see below), ¶0050 discloses a contact probe 3 for transmitting a signal by connecting longitudinal ends thereof to different electrodes, comprising: a first plunger 10 including a tip end 11a/10/12/15 configured to be contact with one of the electrodes 8a, and a flange 13a that is continuous to the tip end; and a coil spring 40 configured to be joined to the first plunger 10, wherein the tip end includes: a tip contact 11a including a tip configured to be contact with the one of the electrode 8a; a first base portion 10/12 that is columnar [as shown], the first base portion being provided to a base end side of the tip contact [base of 11a], and including a lateral side surface [surface of 10/12] extending along a longitudinal axis of the first plunger [as shown]; and a second base portion 15 provided to an end of the first base portion, the end being on a side opposite to the tip contact [as shown], the second base portion 15 including an inclined lateral side [truncated-cone portion, see 0050] inclined in a manner approaching the longitudinal axis of the first plunger [as shown], as the inclined lateral side extends toward the flange [as shown]. PNG media_image1.png 314 336 media_image1.png Greyscale Regarding claim 4, Yamamoto at fig. 3, ¶0050 discloses the contact probe according to claim 1, wherein the first base portion 12/10 has a cylindrical shape [as shown, see “cylinder portion 11”], and the second base portion 15 has a truncated cone shape [truncated-cone portion, see 0050]. Regarding claim 7, as further explain/stated above for rejection of claim 1, Yamamoto at fig. 3, ¶0050 discloses all the elements including the probe unit 1B [see fig. 3] comprising: a contact probe 3 including: a first plunger 10 including a tip end configured to be contact with one of electrodes, and a flange that is continuous to the tip end; and a coil spring 40 connected to the first plunger; and a probe holder 5 including a holder hole [hole for 3] configured to hold the contact probe, wherein the tip end includes a tip contact including a tip configured to be contact with the one of the electrodes; a first base portion that is columnar, the first base portion being provided to a base end side of the tip contact, and including a lateral side surface extending along a longitudinal axis of the first plunger; and a second base portion provided to an end of the first base portion, the end being on a side opposite to the tip contact, and including an inclined lateral side inclined in a manner approaching the longitudinal axis of the first plunger, as the inclined lateral side extends toward the flange. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to PARESH PATEL whose telephone number is (571)272-1968. The examiner can normally be reached 8:00 am to 4:00pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Eman Alkafawi can be reached at 571-272-4448. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /PARESH PATEL/Primary Examiner, Art Unit 2858 March 26, 2026
Read full office action

Prosecution Timeline

Jan 29, 2024
Application Filed
Apr 03, 2026
Non-Final Rejection mailed — §102 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
79%
Grant Probability
78%
With Interview (-1.3%)
2y 8m (~4m remaining)
Median Time to Grant
Low
PTA Risk
Based on 938 resolved cases by this examiner. Grant probability derived from career allowance rate.

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