Tech Center 2800 • Art Units: 2829 2858 2868
This examiner grants 80% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18890626 | SEMICONDUCTOR PACKAGE INSPECTION DEVICE | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 19043026 | ELECTRIC LEAKAGE DETECTION CIRCUIT | Non-Final OA | Panasonic Automotive Systems Co., Ltd. |
| 19064928 | DEVICE FOR EVALUATING POSITIVE ELECTRODE SLURRY FOR ALL-SOLID-STATE BATTERY | Non-Final OA | HONDA MOTOR CO., LTD. |
| 18991738 | METHOD OF EVALUATING ELECTRODE ACTIVITY | Non-Final OA | HONDA MOTOR CO., LTD. |
| 17709630 | TECHNOLOGIES FOR TESTING LIQUID METAL ARRAY INTERCONNECT PACKAGES | Non-Final OA | Intel Corporation |
| 19108897 | Arrangement And Method For Detecting A Current Of A First Conductor Of A Circuit | Non-Final OA | Siemens Aktiengesellschaft |
| 18526083 | CHIP TESTING STRUCTURE | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18424927 | CONTACT PROBE AND PROBE UNIT | Final Rejection | NHK Spring Co., Ltd. |
| 18713456 | TEST METHOD, CORRECTION AMOUNT CALCULATION METHOD, AND TEST DEVICE | Non-Final OA | Tokyo Electron Limited |
| 19024000 | MAGNETIC SENSOR AND SIGNAL PROCESSING CIRCUIT | Non-Final OA | TDK Corporation |
| 19007843 | MAGNETIC FIELD DETECTION SYSTEM | Non-Final OA | TDK Corporation |
| 18833967 | MAGNETIC SENSOR | Non-Final OA | TDK Corporation |
| 19015884 | PROXIMITY SENSOR | Non-Final OA | Keyence Corporation |
| 19062891 | Non-Intrusive, In-Situ Power Measurement Method | Non-Final OA | THE FLORIDA STATE UNIVERSITY RESEARCH FOUNDATION, INC. |
| 18748876 | HYBRID SHIELDING SOCKETS WITH IMPEDANCE TUNING FOR INTEGRATED CIRCUIT DEVICE TEST TOOLING | Non-Final OA | Essai, Inc. |
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