Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2829 2858 2868
This examiner grants 79% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18628896 | SEMICONDUCTOR TEST DEVICE AND METHOD OF MANUFACTURING THE SAME | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18602732 | FLEXIBLE ELECTRIC WIRING SUBSTRATE AND CHIP UNIT AND METHOD OF INSPECTING FLEXIBLE ELECTRIC WIRING SUBSTRATE | Non-Final OA | CANON KABUSHIKI KAISHA |
| 18532867 | SOCKET APPARATUS FOR SECURE PLACEMENT OF CHIP PACKAGE | Non-Final OA | Microsoft Technology Licensing, LLC |
| 17709630 | TECHNOLOGIES FOR TESTING LIQUID METAL ARRAY INTERCONNECT PACKAGES | Final Rejection | Intel Corporation |
| 19126922 | FAULT DETECTION IN AN ELECTRIC DRIVE TRAIN OF A VEHICLE | Non-Final OA | McLaren Applied Limited |
| 18836196 | LIQUID-COOLED TERMINATION FOR RADIO FREQUENCY POWER MEASUREMENT | Non-Final OA | BIRD TECHNOLOGIES GROUP INC. |
| 18424927 | CONTACT PROBE AND PROBE UNIT | Non-Final OA | NHK Spring Co., Ltd. |
| 18767807 | DAMPER INSPECTION SYSTEMS AND METHODS | Non-Final OA | Air Distribution Technologies IP, LLC |
| 18717410 | CONTACT PIN ASSEMBLY FOR KELVIN TEST AND KELVIN TEST DEVICE COMPRISING SAME | Non-Final OA | POINT ENGINEERING CO., LTD. |
| 18548872 | PROBE CARD | Non-Final OA | Kabushiki Kaisha Nihon Micronics |
| 18453354 | CONDUCTION INSPECTION JIG AND METHOD FOR MANUFACTURING PRINTED WIRING BOARD | Non-Final OA | IBIDEN CO., LTD. |
| 18634655 | Roller Tap Down Technique for Probe Arrays | Non-Final OA | FormFactor, Inc. |
| 18486156 | Probe Head | Non-Final OA | PMK Mess- und Kommunikationstechnik, GmbH |
| 18427076 | PROBE MOUNTING STRUCTURE AND RELIABILITY TEST SYSTEM FOR WAFER-LEVEL RELIABILITY TEST | Non-Final OA | SEMIGHT INSTRUMENTS CO., LTD |
| 18579270 | SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOARD INTERFACES | Final Rejection | Smiths Interconnect Americas, Inc. |
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