Prosecution Insights
Last updated: July 17, 2026
Application No. 18/439,963

SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES

Non-Final OA §102§103
Filed
Feb 13, 2024
Examiner
MIHALIOV, DMITRI
Art Unit
2812
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Amkor Technology Singapore Holding Pte. Ltd.
OA Round
1 (Non-Final)
75%
Grant Probability
Favorable
1-2
OA Rounds
1y 0m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 75% — above average
75%
Career Allowance Rate
18 granted / 24 resolved
+7.0% vs TC avg
Strong +33% interview lift
Without
With
+33.3%
Interview Lift
resolved cases with interview
Typical timeline
3y 5m
Avg Prosecution
24 currently pending
Career history
48
Total Applications
across all art units

Statute-Specific Performance

§103
82.8%
+42.8% vs TC avg
§102
12.5%
-27.5% vs TC avg
§112
2.3%
-37.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 24 resolved cases

Office Action

§102 §103
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. Information Disclosure Statement The information disclosure statement (IDS) submitted on August 7, 2024 was filed in compliance with the provisions of 37 CFR 1.97. Accordingly, the information disclosure statement is being considered by the examiner. Title The title of the invention is not descriptive. A new title is required that is clearly indicative of the invention to which the claims are directed. The following title is suggested: --Semiconductor Devices Including A Routing Component Containing Deep Trench Capacitors Located Between Upper And Lower Redistribution Layers And Related Methods Of Manufacturing-- Claim Objections Claims 2, 3, 5, 8, 9, 10, 11, 13, 16, 17, 18, and 20 are objected to because of the following informalities: In all the claims objected to, “comprising” in the preamble should read --further comprising--. In addition: Claim 9: “underfill” should read --an underfill-- Claim 16: “The electronic device of claim 1” should read --The electronic device of claim 12-- Claim 17: “underfill” should read --an underfill-- Appropriate correction is required. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. (a)(2) the claimed invention was described in a patent issued under section 151, or in an application for patent published or deemed published under section 122(b), in which the patent or application, as the case may be, names another inventor and was effectively filed before the effective filing date of the claimed invention. Claims 1, 3-20 are rejected under 35 U.S.C. 102 (a)(1) and (a)(2) as being anticipated by Lee et al. (U.S. Pub. 2022/0384308), hereinafter Lee.. Examiner notes that in the specification the Applicant defines “coupled” as “two elements indirectly connected by one or more other elements” and “can refer to an electrical coupling or a mechanical coupling.” See Paragraph [0014]. It is under this broad definition that the Examiner applies the interpretation of the prior art below. Regarding Claim 1, Lee teaches an electronic device ((1g); Fig. 11A, Paragraph [0086]) comprising: -a lower redistribution structure ((42); Fig. 11A, Paragraph [0066]) comprising a lower redistribution structure upper side (e.g. top of (42)) and a lower redistribution structure lower side (e.g. bottom of (42)); -an upper redistribution structure ((52); Fig. 11A, Paragraph [0067]) comprising an upper redistribution structure upper side (e.g. top of (52)) and an upper redistribution structure lower side (e.g. bottom of (52)); -a first electronic component ((61); Fig. 11A, Paragraph [0085]) coupled to the upper redistribution structure upper side (top of (52)); -a second electronic component ((62); Fig. 11A, Paragraph [0085]) coupled to the upper redistribution structure upper side (top of (52)); and -a routing component ((2); Figs. 2 and 11A, Paragraph [0059]) comprising a routing redistribution structure ((11); Figs. 2 and 11A, Paragraph [0067]), a component die (‘DIE’ comprising (20) and (27); Figs. 2 and 11A, Paragraph [0060] and [0062]), component through-interconnects ((23); Fig. 8, Paragraph [0073]- Examiner notes that this is provided as an additional structure which while not shown explicitly in Figs. 2 and 11A, is present in the embodiment utilized by the Examiner), and a component encapsulant (comprising (12) and (29); Fig. 2 and 11A, Paragraph [0059] and [0064]); wherein -the component encapsulant ((12) and (29)) comprises a component encapsulant upper side (e.g. top of (29)) and a component encapsulant lower side (e.g. (122)) (Paragraph [0065]); wherein -the routing redistribution structure (11) comprises a routing redistribution structure upper side (top of (11)) coupled to the upper redistribution structure lower side (bottom of (52)) and a routing redistribution structure lower side (bottom of (11)) on the component encapsulant upper side (e.g. top of (29)) (as visible in Fig. 2); wherein -the component die (‘DIE’) comprises a component die substrate (20) and a die interface structure (27) on the component die substrate (20); wherein the die interface structure (27) is coupled to the routing redistribution structure lower side (bottom of (11)); and wherein -the component through-interconnects (23) extend through the component encapsulant ((12) and (29)) (necessarily, as (12) encapsulates it) and couple the routing redistribution structure lower side (bottom of (11)) to the lower redistribution structure upper side (top of (42)). Regarding Claim 3, Lee teaches the electronic device ((1g); Fig. 11A, Paragraph [0086]) of Claim 1, further comprising: -die interconnects ((28); Fig. 2 and 11A, Paragraph [0062]) that couple the die interface structure (27) to the routing redistribution structure (11). Regarding Claim 4, Lee teaches the electronic device ((1g); Fig. 11A, Paragraph [0086]) of Claim 1, wherein: -an upper surface of the component die substrate (top of (20)) comprises one or more passive elements (‘deep trench capacitors’ (25); Fig. 2 and 11A, Paragraph [0059]). Regarding Claim 5, Lee teaches the electronic device ((1g); Fig. 11A, Paragraph [0086]) of Claim 4, further comprising: -die through-interconnects ((24); Figs. 2 and 11A, Paragraph [0060]) that extend through the component die substrate (20) and couple the lower redistribution structure (42) to the one or more passive elements (25). Regarding Claim 6, Lee teaches the electronic device ((1g); Fig. 11A, Paragraph [0086]) of Claim 4, wherein: -the one or more passive elements (25) comprise one or more deep trench capacitors (Paragraph [0059]). Regarding Claim 7, Lee teaches the electronic device ((1g); Fig. 11A, Paragraph [0086]) of Claim 4, wherein: -the one or more passive elements (25) are coupled to the die interface structure (27). Regarding Claim 8, Lee teaches the electronic device ((1g); Fig. 11A, Paragraph [0086]) of Claim 1, further comprising: -an upper encapsulant ((16); Fig. 11A, Paragraph [0068]) that laterally surrounds the first electronic component (61) and the second electronic component (62). Regarding Claim 9, Lee teaches the electronic device ((1g); Fig. 11A, Paragraph [0086]) of Claim 8, further comprising: -an underfill (e.g. top (51); Fig. 2 and 11A, Paragraph [0067]) between a lower side of the first electronic component (61) and the upper redistribution structure upper side (top of (52)). Regarding Claim 10, Lee teaches the electronic device ((1g); Fig. 11A, Paragraph [0086]) of Claim 1, further comprising: -a lower encapsulant (e.g. right and left portions of (14); Fig. 11A, Paragraph [0065]) that laterally surrounds the routing component (2). Regarding Claim 11, Lee teaches the electronic device ((1g); Fig. 11A, Paragraph [0086]) of Claim 10 further comprising: -device through-interconnects ((3); Fig. 11A, Paragraph [0063]) that pass through the lower encapsulant (14) and couple the upper redistribution structure (52) to the lower redistribution structure (42). Regarding Claim 12, Lee teaches an electronic device ((1g); Fig. 11A, Paragraph [0086]) comprising: -a lower redistribution structure ((42); Fig. 11A, Paragraph [0066]) comprising a lower redistribution structure upper side (e.g. top of (42)) and a lower redistribution structure lower side (e.g. bottom of (42)); -an upper redistribution structure ((52); Fig. 11A, Paragraph [0067]) comprising an upper redistribution structure upper side (e.g. top of (52)) and an upper redistribution structure lower side (e.g. bottom of (52)); -a first electronic component ((61); Fig. 11A, Paragraph [0085]) coupled to the upper redistribution structure upper side (top of (52)); -a second electronic component ((62); Fig. 11A, Paragraph [0085]) coupled to the upper redistribution structure upper side (top of (52)); and -a component die (‘DIE’ comprising (20) and (27); Figs. 2 and 11A, Paragraph [0060] and [0062]), comprising a component die lower side (bottom of (‘DIE’)) coupled to the lower redistribution structure upper side (top of (42)) and a component die upper side (top of (‘DIE’)) coupled to the upper redistribution structure lower side (bottom of (52)); wherein -the component die (‘DIE’) comprises a component die substrate (20), one or more passive elements (‘deep trench capacitors’ (25); Fig. 2 and 11A, Paragraph [0059]) along an upper surface of the component die substrate (top of (20)), a die interface structure ((27); Figs. 2 and 11A, Paragraph [0060] and [0062]) over the component die substrate (20) and the one of more passive elements (25), and die through-interconnects ((24); Figs. 2 and 11A, Paragraph [0060]) that pass through the component die substrate (20) and couple the one or more passive elements (25) to the lower redistribution structure (42). Regarding Claim 13, Lee teaches the electronic device ((1g); Fig. 11A, Paragraph [0086]) of Claim 12, further comprising: -Die interconnects (comprising (28) and (11); Fig. 2 and 11A, Paragraph [0067]), that couple the die interface structure (27) to the upper redistribution structure (52). Regarding Claim 14, Lee teaches the electronic device ((1g); Fig. 11A, Paragraph [0086]) of Claim 12, wherein: -the one or more passive elements (25) comprise one or more deep trench capacitors (Paragraph [0059]). Regarding Claim 15, Lee teaches the electronic device ((1g); Fig. 11A, Paragraph [0086]) of Claim 12, wherein: -the one or more passive elements (25) are coupled to the upper redistribution structure (52). Regarding Claim 16, Lee teaches the electronic device ((1g); Fig. 11A, Paragraph [0086]) of Claim 12, further comprising: -an upper encapsulant ((16); Fig. 11A, Paragraph [0068]) that laterally surrounds the first electronic component (61) and the second electronic component (62). Regarding Claim 17, Lee teaches the electronic device ((1g); Fig. 11A, Paragraph [0086]) of Claim 16, further comprising: -an underfill (e.g. top (51); Fig. 2 and 11A, Paragraph [0067]) between a lower side of the first electronic component (61) and the upper redistribution structure upper side (top of (52)). Regarding Claim 18, Lee teaches the electronic device ((1g); Fig. 11A, Paragraph [0086]) of Claim 12, further comprising: -a lower encapsulant (e.g. right and left portions of (14); Fig. 11A, Paragraph [0065]) that laterally surrounds the component die (‘DIE’). Regarding Claim 19, Lee teaches the electronic device ((1g); Fig. 11A, Paragraph [0086]) of Claim 18, further comprising: -device through-interconnects ((3); Fig. 11A, Paragraph [0063]) that pass through the lower encapsulant (14) and couple the upper redistribution structure (52) to the lower redistribution structure (42). Regarding Claim 20, Lee teaches a method of manufacturing an electronic device ((1g); Fig. 11A, Paragraph [0086]), the method comprising: -providing a lower redistribution structure ((42); Fig. 11A, Paragraph [0066]) comprising a lower redistribution structure upper side (e.g. top of (42)) and a lower redistribution structure lower side (e.g. bottom of (42)); -providing an upper redistribution structure ((52); Fig. 11A, Paragraph [0067]) comprising an upper redistribution structure upper side (e.g. top of (52)) and an upper redistribution structure lower side (e.g. bottom of (52)); -providing a routing component ((2); Figs. 2 and 11A, Paragraph [0059]) on the lower redistribution structure upper side (top of (42)), wherein: -the routing component (2) comprises a routing redistribution structure (‘RSS’ (comprising (28) and (11); Fig. 2 and 11A, Paragraph [0067]), a component die (‘DIE’ comprising (20) and (27); Figs. 2 and 11A, Paragraph [0060] and [0062]), component through-interconnects ((23); Fig. 8, Paragraph [0073]- Examiner notes that this is provided as an additional structure which while not shown explicitly in Figs. 2 and 11A, is present in the embodiment utilized by the Examiner), and a component encapsulant (comprising (12) and (29); Fig. 2 and 11A, Paragraph [0059] and [0064]); -the component encapsulant ((12) and (29)) comprises a component encapsulant upper side (e.g. top of (29)) and a component encapsulant lower side (e.g. (122)) (Paragraph [0065]); wherein -the routing redistribution structure (‘RSS’) comprises a routing redistribution structure upper side (top of (‘RSS’)) coupled to the upper redistribution structure lower side (bottom of (52)) and a routing redistribution structure lower side (bottom of (11)) on the component encapsulant upper side (e.g. top of (29)) (as visible in Fig. 2); wherein -the component die (‘DIE’) comprises a component die substrate (20) and a die interface structure (27) on the component die substrate (20); wherein the die interface structure (27) is coupled to the routing redistribution structure lower side (bottom of (11)); and wherein -the component through-interconnects (23) extend through the component encapsulant ((12) and (29)) (necessarily, as (12) encapsulates it) and couple the routing redistribution structure lower side (bottom of (11)) to the lower redistribution structure upper side (top of (42)); -providing a first electronic component ((61); Fig. 11A, Paragraph [0085]) coupled to the upper redistribution structure upper side (top of (52)); -providing a second electronic component ((62); Fig. 11A, Paragraph [0085]) coupled to the upper redistribution structure upper side (top of (52)); and Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim 2 is rejected under 35 U.S.C. 103 as being unpatentable over Lee. Regarding Claim 2, Lee teaches the electronic device ((1g); Fig. 11A, Paragraph [0086]) of Claim 1, but does not teach in the utilized embodiment: -routing interconnects that couple the routing redistribution structure (11) to the upper redistribution structure (52). Lee teaches in a separate embodiment (Fig. 10, Paragraph [0082]): -routing interconnects ((18); Fig. 10, Paragraph [0073]) that couple the routing redistribution structure (11) to the upper redistribution structure (52). It would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to incorporate the further teachings of Lee into the device of Lee such that routing interconnects that couple the routing redistribution structure to the upper redistribution structure. This would be due to the fact that doing so would produce the predictable result of incorporating an alternative connection structure into the device, one with enchanced electrical connection (Paragraph [0076]). Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to DMITRI MIHALIOV whose telephone number is (571)270-5220. The examiner can normally be reached weekdays 7:30 - 17:30 US Eastern Time. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Davienne Monbleau can be reached at (571) 272-1945. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /DMITRI MIHALIOV/ Examiner, Art Unit 2812 /DAVIENNE N MONBLEAU/ Supervisory Patent Examiner, Art Unit 2812
Read full office action

Prosecution Timeline

Feb 13, 2024
Application Filed
Jun 09, 2026
Non-Final Rejection mailed — §102, §103 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12685003
DISPLAY MODULE AND DISPLAY DEVICE
3y 1m to grant Granted Jul 14, 2026
Patent 12672303
HIGH ELECTRON MOBITY TRANSISTOR WITH GRADIENT ALUMINUM COMPOSITION IN BARRIER LAYER
3y 7m to grant Granted Jun 30, 2026
Patent 12666637
NANOSTRUCTURE FIELD-EFFECT TRANSISTOR DEVICE AND METHOD OF FORMING
3y 2m to grant Granted Jun 23, 2026
Patent 12652841
EPITAXIAL STRUCTURE
3y 0m to grant Granted Jun 09, 2026
Patent 12642109
SEMICONDUCTOR SUBSTRATE INCLUDING FIRST AND SECOND CONDUCTIVE POSTS AND A PLURALITY OF FIRST AND SECOND CIRCUIT LAYER PADS
3y 10m to grant Granted May 26, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

Strategy Recommendation AI-generated — please review before filing

Get a prosecution strategy drawn from examiner precedents, rejection analysis, and claim mapping.
Typically takes 5-10 seconds — AI-generated, attorney review required before filing

Prosecution Projections

1-2
Expected OA Rounds
75%
Grant Probability
99%
With Interview (+33.3%)
3y 5m (~1y 0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 24 resolved cases by this examiner. Grant probability derived from career allowance rate.

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month