Prosecution Insights
Last updated: May 29, 2026

Examiner: MIHALIOV, DMITRI

Tech Center 2800 • Art Units: 2812

This examiner grants 73% of resolved cases

Performance Statistics

72.7%
Allow Rate
+4.7% vs TC avg
42
Total Applications
+37.5%
Interview Lift
1272
Avg Prosecution Days
Based on 22 resolved cases, 2023–2026

Rejection Statute Breakdown

0%
§101 Eligibility
18.6%
§102 Novelty
74.4%
§103 Obviousness
3.5%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
17980472 A LIGHT EMITTING DISPLAY DEVICE AND MANUFACTURING METHOD THEREOF INCLUDING A LOW-LEVEL VOLTAGE POWER LINE DISPOSED ON A SUBPIXEL SUBSTRATE AND A DISPLAY PANEL COMPRISING INVERTED GROUPS OF SUBPIXELS Final Rejection LG Display Co., Ltd.
18214526 DISPLAY DEVICE AND METHOD FOR MANUFACTURING THE SAME Non-Final OA Samsung Display Co., Ltd.
18260673 A SEMICONDUCTOR PACKAGE AND IT'S METHOD OF MANUFACTURING FEATURING AN IMAGING ELEMENT AND A FRAME WHICH PARTIALLY EXTENDS INWARDLY, BOTH MOUNTED ON A SUBSTRATE Final Rejection SONY SEMICONDUCTOR SOLUTIONS CORPORATION
17694889 LIGHT-EMITTING ELEMENT WITH INTERMEDIATE LAYER BETWEEN SEMICONDUCTOR LAYERS AND DISPLAY DEVICE INCLUDING THE SAME Final Rejection POSTECH Research and Business Development Foundation
17485325 OXIDE LAYER DOPING ON A SUB CHANNEL OF A TRANSISTOR STRUCTURE Final Rejection Intel Corporation
17901732 SEMICONDUCTOR DEVICE Final Rejection TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
18336388 SEMICONDUCTOR STORAGE DEVICE Non-Final OA Kioxia Corporation
18347329 SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18169597 SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THEREOF Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18303503 VARIABLE RESISTANCE ELEMENT AND SEMICONDUCTOR DEVICE INCLUDING THE SAME Non-Final OA SK hynix Inc.
17843674 THREE-DIMENSIONAL MEMORY DEVICE HAVING STAIRCASE STRUCTURE AND METHOD FOR FORMING THE SAME Final Rejection YANGTZE MEMORY TECHNOLOGIES CO., LTD.
18331305 NANOSTRUCTURE FIELD-EFFECT TRANSISTOR DEVICE AND METHOD OF FORMING Non-Final OA Taiwan Semiconductor Manufacturing Co, Ltd.
18168985 Vias for Semiconductor Devices Formed from Multiple Etching Final Rejection Wolfspeed, Inc.
18350465 A METHOD FOR GRAPHENE LAYER GROWTH AND SIMULTANEOUS MOLYBDENUM SILICIDE FORMATION ON A SEMICONDUCTOR DEVICE Non-Final OA Consiglio Nazionale Delle Ricerche

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