Prosecution Insights
Last updated: April 19, 2026
Application No. 18/460,030

DATA LATCH CIRCUIT, SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR STORAGE DEVICE

Final Rejection §103§112
Filed
Sep 01, 2023
Examiner
BUI, THA-O H
Art Unit
2825
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Kioxia Corporation
OA Round
2 (Final)
88%
Grant Probability
Favorable
3-4
OA Rounds
2y 4m
To Grant
92%
With Interview

Examiner Intelligence

Grants 88% — above average
88%
Career Allow Rate
849 granted / 965 resolved
+20.0% vs TC avg
Minimal +4% lift
Without
With
+4.3%
Interview Lift
resolved cases with interview
Typical timeline
2y 4m
Avg Prosecution
28 currently pending
Career history
993
Total Applications
across all art units

Statute-Specific Performance

§101
1.3%
-38.7% vs TC avg
§103
41.9%
+1.9% vs TC avg
§102
34.0%
-6.0% vs TC avg
§112
10.7%
-29.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 965 resolved cases

Office Action

§103 §112
DETAILED ACTION Notice of AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Response to Amendment Acknowledgment is made of applicant’s Amendment, filed 26 December 2025. The changes and remarks disclosed therein have been considered. No claims have been cancelled/added by Amendment. Therefore, claims 1-12 are pending in the application. Drawings The drawings are objected to under 37 CFR 1.83(a). The drawings must show every feature of the invention specified in the claims. Therefore, the feature “…the second voltage is different from the third voltage”, as recited in claims 1, 3, 6, 12, must be shown or the feature(s) canceled from the claim(s). No new matter should be entered. Corrected drawing sheets in compliance with 37 CFR 1.121(d) are required in reply to the Office action to avoid abandonment of the application. Any amended replacement drawing sheet should include all of the figures appearing on the immediate prior version of the sheet, even if only one figure is being amended. The figure or figure number of an amended drawing should not be labeled as “amended.” If a drawing figure is to be canceled, the appropriate figure must be removed from the replacement sheet, and where necessary, the remaining figures must be renumbered and appropriate changes made to the brief description of the several views of the drawings for consistency. Additional replacement sheets may be necessary to show the renumbering of the remaining figures. Each drawing sheet submitted after the filing date of an application must be labeled in the top margin as either “Replacement Sheet” or “New Sheet” pursuant to 37 CFR 1.121(d). If the changes are not accepted by the examiner, the applicant will be notified and informed of any required corrective action in the next Office action. The objection to the drawings will not be held in abeyance. Claim Rejections - 35 USC § 112 The following is a quotation of the first paragraph of 35 U.S.C. 112(a): (a) IN GENERAL.—The specification shall contain a written description of the invention, and of the manner and process of making and using it, in such full, clear, concise, and exact terms as to enable any person skilled in the art to which it pertains, or with which it is most nearly connected, to make and use the same, and shall set forth the best mode contemplated by the inventor or joint inventor of carrying out the invention. Claims 1-12 rejected under 35 U.S.C. 112(a), as failing to comply with the written description requirement. The claim(s) contains subject matter which was not described in the specification in such a way as to reasonably convey to one skilled in the relevant art that the inventor or a joint inventor, or the inventor(s), at the time the application was filed, had possession of the claimed invention. Claims 1, 3, 6, 12 are recites the limitation “the second voltage is different from the third voltage”. This limitation cannot be found in the disclosure as originally filed and is therefore new matter. Claims 2, 4-5, 7-11 depend from claims 1, 3, 6, 12 and therefore contain the same new matter. Claim Rejections - 35 USC § 103 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102 of this title, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. The factual inquiries set forth in Graham v. John Deere Co., 383 U.S. 1, 148 USPQ 459 (1966), that are applied for establishing a background for determining obviousness under 35 U.S.C. 103 are summarized as follows: 1. Determining the scope and contents of the prior art. 2. Ascertaining the differences between the prior art and the claims at issue. 3. Resolving the level of ordinary skill in the pertinent art. 4. Considering objective evidence present in the application indicating obviousness or nonobviousness. Claims 1-11 are rejected under 35 U.S.C. 103 as being unpatentable over Hashimoto (US 2014/0145773 A1) in view of Teraoka et al (US 6,097,113 hereinafter “Teraoka”). Per MPEP 2111 and 2111.01, the claims are given their broadest reasonable interpretation and the words of the claims are given their plain meaning consistent with the specification without importing claim limitations from the specification. Regarding Independent Claim 1, Hashimoto, for example in Figs. 1-29, discloses a data latch circuit (see for example in Figs. 28-29 related in Figs. 1-27), comprising: a first circuit (see for example in Fig. 17 related in Figs. 1-16, 18-29) in which a first transistor (e.g., 12; in Fig. 17 related in Figs. 1-16, 18-29) with a first conductivity type (e.g., P-type; in Fig. 17 related in Figs. 1-16, 18-29) and a second transistor (e.g., 15; in Fig. 17 related in Figs. 1-16, 18-29) with a second conductivity type (e.g., N-type; in Fig. 17 related in Figs. 1-16, 18-29) that differs from the first conductivity type are connected in series (see for example in Fig. 17 related in Figs. 1-16, 18-29) and which is configured to store a first logical value (implied that is inverter’s function; in Fig. 17 related in Figs. 1-16, 18-29); and a second circuit (see for example in Fig. 17 related in Figs. 1-16, 18-29) in which a third transistor (e.g., 13; in Fig. 17 related in Figs. 1-16, 18-29) with the first conductivity type (e.g., P-type; in Fig. 17 related in Figs. 1-16, 18-29) and a fourth transistor (e.g., 16; in Fig. 17 related in Figs. 1-16, 18-29) with the second conductivity type (e.g., N-type; in Fig. 17 related in Figs. 1-16, 18-29) are connected in series and which is configured to store a second logical value (implied that is inverter’s function; in Fig. 17 related in Figs. 1-16, 18-29) being an inversion of the first logical value (see for example in Fig. 17 related in Figs. 1-16, 18-29), wherein one of a first voltage (e.g., WR/RE; in Fig. 17 related in Figs. 1-16, 18-29) and a second voltage (e.g., RE/WR; in Fig. 17 related in Figs. 1-16, 18-29) that differs from the first voltage can be applied to back gates of the first transistor and the third transistor (e.g., VBG(P); in Fig. 17 related in Figs. 1-16, 18-29) and a third voltage can be applied to sources of the first transistor and the third transistor (e.g., VDD; in Fig. 17 related in Figs. 1-16, 18-29), when data is transferred from the first circuit and the second circuit, the second voltage is applied to the back gate of the first transistor and the back gate of the third transistor (see for example in Fig. 17 related in Figs. 1-16, 18-29). However, Hashimoto is silent with regard to the second voltage is different from the third voltage. In the same field of endeavor, Teraoka, for example in Figs. 1-22, discloses the second voltage is different from the third voltage (e.g., VDD is different from VP1/VP2; in Fig. 1 related in Figs. 2-22). It would have been obvious before the effective filling date of the claimed invention was made to a person having ordinary skill in the art to modify the teaching of Hashimoto such as semiconductor integrated circuit having back-gate voltage control circuit (see for example in Figs. 1-29 of Hashimoto) by incorporating the teaching of Teraoka such as MOS integrated circuit device operating with low power consumption (see for example in Figs. 1-22 of Teraoka), for the purpose of controlling the voltage levels of back gate voltages applied to the back gates of MOS transistors included in internal circuitry are selected, by the selection signals, among the voltages from voltage generation circuits for generating a plurality of voltages having different voltage levels (Teraoka, see Abstract). The structure in of the prior art (Hashimoto and Teraoka) is substantially identical to the structure of the claims. MEPE 2112.01(I). The manner of operation does not distinguish this apparatus claim from the prior art apparatus. MEPE 2114(II). Regarding claim 2, the above Hashimoto/Teraoka, combination discloses wherein when the data is stored in the first circuit and the second circuit (see for example in Fig. 17 related in Figs. 1-16, 18-29 of Hashimoto and also see in Fig. 1 related in Figs. 2-22 of Teraoka, as discussed above), the first voltage is applied to the back gates of the first transistor and the third transistor and the third voltage can be applied to the sources of the first transistor and the third transistor (see for example in Fig. 17 related in Figs. 1-16, 18-29 of Hashimoto and also see in Fig. 1 related in Figs. 2-22 of Teraoka, as discussed above), and when the data is transferred from the first circuit and the second circuit (see for example in Fig. 17 related in Figs. 1-16, 18-29 of Hashimoto and also see in Fig. 1 related in Figs. 2-22 of Teraoka, as discussed above), the second voltage, which is higher than the first voltage, is applied to the back gates of the first transistor and the third transistor (e.g., RE as VDDH=1.8V; in Fig. 17 related in Figs. 1-16, 18-29 of Hashimoto and also see in Fig. 1 related in Figs. 2-22 of Teraoka, as discussed above), the third voltage is applied to the sources of the first transistor and the third transistor (e.g., VDD=1.0V; in Fig. 17 related in Figs. 1-16, 18-29 of Hashimoto and also see in Fig. 1 related in Figs. 2-22 of Teraoka, as discussed above), and the data is based on the first logical value and the second logical value (see for example in Fig. 17 related in Figs. 1-16, 18-29 of Hashimoto and also see in Fig. 1 related in Figs. 2-22 of Teraoka, as discussed above). Also, the structure in of the prior art (Hashimoto and Teraoka) is substantially identical to the structure of the claims. MPEP 2112.01(I). The manner of operation does not distinguish this apparatus claim from the prior art apparatus. MPEP 2114(II). Regarding Independent Claim 3, Hashimoto, for example in Figs. 1-29, discloses a data latch circuit (see for example in Figs. 28-29 related in Figs. 1-27), comprising: a first circuit (see for example in Fig. 17 related in Figs. 1-16, 18-29) in which a first transistor (e.g., 12; in Fig. 17 related in Figs. 1-16, 18-29) with a first conductivity type (e.g., P-type; in Fig. 17 related in Figs. 1-16, 18-29) and a second transistor (e.g., 15; in Fig. 17 related in Figs. 1-16, 18-29) with a second conductivity type (e.g., N-type; in Fig. 17 related in Figs. 1-16, 18-29) that differs from the first conductivity type are connected in series (see for example in Fig. 17 related in Figs. 1-16, 18-29) and which is configured to store a first logical value (implied that is inverter’s function; in Fig. 17 related in Figs. 1-16, 18-29); and a second circuit (see for example in Fig. 17 related in Figs. 1-16, 18-29) in which a third transistor (e.g., 13; in Fig. 17 related in Figs. 1-16, 18-29) with the first conductivity type (e.g., P-type; in Fig. 17 related in Figs. 1-16, 18-29) and a fourth transistor (e.g., 16; in Fig. 17 related in Figs. 1-16, 18-29) with the second conductivity type (e.g., N-type; in Fig. 17 related in Figs. 1-16, 18-29) are connected in series (see for example in Fig. 17 related in Figs. 1-16, 18-29) and which is configured to store a second logical value (implied that is inverter’s function; in Fig. 17 related in Figs. 1-16, 18-29) being an inversion of the first logical value (see for example in Fig. 17 related in Figs. 1-16, 18-29), wherein one of a first voltage (e.g., WR/RE; in Fig. 17 related in Figs. 1-16, 18-29) and a second voltage (e.g., RE/WR; in Fig. 17 related in Figs. 1-16, 18-29) that differs from the first voltage can be applied to sources of the first transistor and the third transistor (see for example in Fig. 17 related in Figs. 1-16, 18-29) and a third voltage can be applied to back gates of the first transistor and the third transistor (e.g., VBG(P); in Fig. 17 related in Figs. 1-16, 18-29), and when data is transferred from the first circuit and the second circuit, the second voltage is applied to the source of the first transistor and the source of the third transistor (see for example in Fig. 17 related in Figs. 1-16, 18-29), and the second voltage is different from the third voltage. However, Hashimoto is silent with regard to the second voltage is different from the third voltage. In the same field of endeavor, Teraoka, for example in Figs. 1-22, discloses the second voltage is different from the third voltage (e.g., VDD is different from VP1/VP2; in Fig. 1 related in Figs. 2-22). It would have been obvious before the effective filling date of the claimed invention was made to a person having ordinary skill in the art to modify the teaching of Hashimoto such as semiconductor integrated circuit having back-gate voltage control circuit (see for example in Figs. 1-29 of Hashimoto) by incorporating the teaching of Teraoka such as MOS integrated circuit device operating with low power consumption (see for example in Figs. 1-22 of Teraoka), for the purpose of controlling the voltage levels of back gate voltages applied to the back gates of MOS transistors included in internal circuitry are selected, by the selection signals, among the voltages from voltage generation circuits for generating a plurality of voltages having different voltage levels (Teraoka, see Abstract). The structure in of the prior art (Hashimoto and Teraoka) is substantially identical to the structure of the claims. MEPE 2112.01(I). The manner of operation does not distinguish this apparatus claim from the prior art apparatus. MEPE 2114(II). Regarding claim 4, the above Hashimoto/Teraoka, combination discloses wherein when the data is stored in the first circuit and the second circuit (see for example in Fig. 17 related in Figs. 1-16, 18-29 of Hashimoto and also see in Fig. 1 related in Figs. 2-22 of Teraoka, as discussed above), the first voltage is applied to the sources of the first transistor and the third transistor and the third voltage is applied to the back gates of the first transistor and the third transistor (see for example in Fig. 17 related in Figs. 1-16, 18-29 of Hashimoto and also see in Fig. 1 related in Figs. 2-22 of Teraoka, as discussed above), and when the data is transferred from the first circuit and the second circuit, a second voltage, which is lower than the first voltage, is applied to the sources of the first transistor and the third transistor (e.g., WR; in Fig. 17 related in Figs. 1-16, 18-29 of Hashimoto and also see in Fig. 1 related in Figs. 2-22 of Teraoka, as discussed above), and the third voltage is applied to the back gates of the first transistor and the third transistor (e.g., VBG(P); in Fig. 17 related in Figs. 1-16, 18-29 of Hashimoto and also see in Fig. 1 related in Figs. 2-22 of Teraoka, as discussed above). Also, the structure in of the prior art (Hashimoto and Teraoka) is substantially identical to the structure of the claims. MPEP 2112.01(I). The manner of operation does not distinguish this apparatus claim from the prior art apparatus. MPEP 2114(II). Regarding claim 5, the above Hashimoto/Teraoka, combination discloses wherein the first voltage and the third voltage have a same potential (see for example in Fig. 17 related in Figs. 1-16, 18-29 of Hashimoto and also see in Fig. 1 related in Figs. 2-22 of Teraoka). Also, the structure in of the prior art (Hashimoto and Teraoka) is substantially identical to the structure of the claims. MPEP 2112.01(I). The manner of operation does not distinguish this apparatus claim from the prior art apparatus. MPEP 2114(II). Regarding claim 6, the above Hashimoto/Teraoka, combination discloses a semiconductor device, comprising: the data latch circuit (see for example in Fig. 17 related in Figs. 1-16, 18-29, as discussed above); and a power supply circuit configured to apply the first voltage or the second voltage to the back gates or the sources of the first transistor and the third transistor of the data latch circuit (see for example in Fig. 17 related in Figs. 1-16, 18-29) including a first circuit in which a first transistor with a first conductivity type and a second transistor with a second conductivity type that differs from the first conductivity type are connected in series and which is configured to store a first logical value (see for example in Fig. 17 related in Figs. 1-16, 18-29); and a second circuit in which a third transistor with the first conductivity type and a fourth transistor with the second conductivity type are connected in series and which is configured to store a second logical value being an inversion of the first logical value (see for example in Fig. 17 related in Figs. 1-16, 18-29), wherein one of a first voltage and a second voltage that differs from the first voltage can be applied to back gates of the first transistor and the third transistor and a third voltage can be applied to sources of the first transistor and the third transistor (see for example in Fig. 17 related in Figs. 1-16, 18-29), and when data is transferred from the first circuit and the second circuit, the second voltage is applied to the back gate of the first transistor and the back gate of the third transistor (see for example in Fig. 17 related in Figs. 1-16, 18-29) see for example in Fig. 17 related in Figs. 1-16, 18-29; and a power supply circuit configured to apply the first voltage or the second voltage to the back gates or the sources of the first transistor and the third transistor of the data latch circuit (see for example in Fig. 17 related in Figs. 1-16, 18-29). However, Hashimoto is silent with regard to the second voltage is different from the third voltage. In the same field of endeavor, Teraoka, for example in Figs. 1-22, discloses the second voltage is different from the third voltage (e.g., VDD is different from VP1/VP2; in Fig. 1 related in Figs. 2-22). It would have been obvious before the effective filling date of the claimed invention was made to a person having ordinary skill in the art to modify the teaching of Hashimoto such as semiconductor integrated circuit having back-gate voltage control circuit (see for example in Figs. 1-29 of Hashimoto) by incorporating the teaching of Teraoka such as MOS integrated circuit device operating with low power consumption (see for example in Figs. 1-22 of Teraoka), for the purpose of controlling the voltage levels of back gate voltages applied to the back gates of MOS transistors included in internal circuitry are selected, by the selection signals, among the voltages from voltage generation circuits for generating a plurality of voltages having different voltage levels (Teraoka, see Abstract). The structure in of the prior art (Hashimoto and Teraoka) is substantially identical to the structure of the claims. MEPE 2112.01(I). The manner of operation does not distinguish this apparatus claim from the prior art apparatus. MEPE 2114(II). Regarding claim 7, the above Hashimoto/Teraoka, combination discloses wherein the power supply circuit is configured to apply the first voltage or the second voltage to the back gates of the first transistor and the third transistor (see for example in Figs. 1, 10, 15, 17, 20 related in Figs. 2-9, 11-14, 16, 18-19, 21-29 of Hashimoto and also see in Fig. 1 related in Figs. 2-22 of Teraoka, as discussed above), the power supply circuit is configured to apply the first voltage to the back gates of the first transistor and the third transistor when the data is stored in the first circuit and the second circuit (see for example in Figs. 1, 10, 15, 17, 20 related in Figs. 2-9, 11-14, 16, 18-19, 21-29 of Hashimoto and also see in Fig. 1 related in Figs. 2-22 of Teraoka, as discussed above), and the power supply circuit is configured to apply the second voltage to the back gates of the first transistor and the third transistor when the data is transferred from the first circuit and the second circuit (see for example in Figs. 1, 10, 15, 17, 20 related in Figs. 2-9, 11-14, 16, 18-19, 21-29 of Hashimoto and also see in Fig. 1 related in Figs. 2-22 of Teraoka, as discussed above). Also, the structure in of the prior art (Hashimoto and Teraoka) is substantially identical to the structure of the claims. MEPE 2112.01(I). The manner of operation does not distinguish this apparatus claim from the prior art apparatus. MEPE 2114(II). Regarding claim 8, the above Hashimoto/Teraoka, combination discloses wherein the power supply circuit is configured to apply the first voltage or the second voltage to the sources of the first transistor and the third transistor (see for example in Figs. 1, 10, 15, 17, 20 related in Figs. 2-9, 11-14, 16, 18-19, 21-29 of Hashimoto and also see in Fig. 1 related in Figs. 2-22 of Teraoka, as discussed above), the power supply circuit is configured to apply the first voltage to the sources of the first transistor and the third transistor when the data is stored in the first circuit and the second circuit (see for example in Figs. 1, 10, 15, 17, 20 related in Figs. 2-9, 11-14, 16, 18-19, 21-29 of Hashimoto and also see in Fig. 1 related in Figs. 2-22 of Teraoka, as discussed above), and the power supply circuit is configured to apply the second voltage to the sources of the first transistor and the third transistor when the data is transferred from the first circuit and the second circuit (see for example in Figs. 1, 10, 15, 17, 20 related in Figs. 2-9, 11-14, 16, 18-19, 21-29 of Hashimoto and also see in Fig. 1 related in Figs. 2-22 of Teraoka, as discussed above). Also, the structure in of the prior art (Hashimoto and Teraoka) is substantially identical to the structure of the claims. MEPE 2112.01(I). The manner of operation does not distinguish this apparatus claim from the prior art apparatus. MEPE 2114(II). Regarding claim 9, the above Hashimoto/Teraoka, combination discloses comprising the data latch circuit in plurality, wherein the power supply circuit is configured to apply power to the data latch circuit in plurality (see for example in Figs. 1, 10, 15, 17, 20 related in Figs. 2-9, 11-14, 16, 18-19, 21-29 of Hashimoto and also see in Fig. 1 related in Figs. 2-22 of Teraoka, as discussed above). Also, the structure in of the prior art (Hashimoto and Teraoka) is substantially identical to the structure of the claims. MEPE 2112.01(I). The manner of operation does not distinguish this apparatus claim from the prior art apparatus. MEPE 2114(II). Regarding claim 10, the above Hashimoto/Teraoka, combination discloses further comprising the power supply circuit in plurality, and the data latch circuit in plurality (see for example in Figs. 1, 10, 15, 17, 20 related in Figs. 2-9, 11-14, 16, 18-19, 21-29 of Hashimoto and also see in Fig. 1 related in Figs. 2-22 of Teraoka, as discussed above), wherein a first power supply circuit among the power supply circuit in plurality is configured to apply power to a first data latch circuit among the data latch circuit in plurality (see for example in Figs. 1, 10, 15, 17, 20 related in Figs. 2-9, 11-14, 16, 18-19, 21-29 of Hashimoto and also see in Fig. 1 related in Figs. 2-22 of Teraoka, as discussed above), and a second power supply circuit among the power supply circuit in plurality is configured to apply power to a second data latch circuit among the data latch circuit in plurality (see for example in Figs. 1, 10, 15, 17, 20 related in Figs. 2-9, 11-14, 16, 18-19, 21-29 of Hashimoto and also see in Fig. 1 related in Figs. 2-22 of Teraoka, as discussed above). Also, the structure in of the prior art (Hashimoto and Teraoka) is substantially identical to the structure of the claims. MEPE 2112.01(I). The manner of operation does not distinguish this apparatus claim from the prior art apparatus. MEPE 2114(II). Regarding claim 11, the above Hashimoto/Teraoka, combination discloses further comprising the power supply circuit in plurality, wherein a first power supply circuit among the power supply circuit in plurality is configured to apply power to the first transistor (see for example in Figs. 1, 10, 15, 17, 20 related in Figs. 2-9, 11-14, 16, 18-19, 21-29 of Hashimoto and also see in Fig. 1 related in Figs. 2-22 of Teraoka, as discussed above), and a second power supply circuit among the power supply circuit in plurality is configured to apply power to the third transistor (see for example in Figs. 1, 10, 15, 17, 20 related in Figs. 2-9, 11-14, 16, 18-19, 21-29 of Hashimoto and also see in Fig. 1 related in Figs. 2-22 of Teraoka, as discussed above). Also, the structure in of the prior art (Hashimoto and Teraoka) is substantially identical to the structure of the claims. MEPE 2112.01(I). The manner of operation does not distinguish this apparatus claim from the prior art apparatus. MEPE 2114(II). Claim 12 is rejected under 35 U.S.C. 103 as being unpatentable over Hashimoto (US 2014/0145773 A1) in view of Teraoka et al (US 6,097,113 hereinafter “Teraoka”) and further in view of Kamata et al (US 10,720,220 B2 hereinafter “Kamata”). Per MPEP 2111 and 2111.01, the claims are given their broadest reasonable interpretation and the words of the claims are given their plain meaning consistent with the specification without importing claim limitations from the specification. Regarding claim 12, the above Hashimoto/Teraoka, combination discloses the claimed invention as discussed above. However, the above Hashimoto/Teraoka is silent with regard to a semiconductor storage device, comprising: a memory cell transistor; a bit line connected to the memory cell transistor; a sense amplifier unit which is connected to the bit line. In the same field of endeavor, Kamata, for example in Figs. 1-24, discloses a semiconductor storage device, comprising: a memory cell transistor; a bit line connected to the memory cell transistor; a sense amplifier unit which is connected to the bit line (see for example in Figs. 1-2, 5 related in Figs. 3-4, 6-24). It would have been obvious before the effective filling date of the claimed invention was made to a person having ordinary skill in the art to modify the teaching of Hashimoto such as semiconductor integrated circuit having back-gate voltage control circuit (see for example in Figs. 1-29 of Hashimoto) and the teaching of Teraoka such as MOS integrated circuit device operating with low power consumption (see for example in Figs. 1-22 of Teraoka) by incorporating the teaching of Kamata such as sense amplifier having a sense transistor to which different voltage are applied during sensing and after sensing to correct a variation of the threshold voltage of the sense transistor (see for example in Figs. 1-24 of Kamata), for the purpose of controlling the control circuit is configured to adjust a voltage applied to a back gate of the sense transistor or a source of the sense transistor to correct a variation of a threshold voltage of the sense transistor (Kamata, see Abstract). Applicant are reminded that when presenting amendments to claims. In order to be fully responsive, an attempt should be made to point out the patentable novelty (see MPEP 714.04). Additionally, Applicant should point out where and/or how the originally filed disclosure supports the amendment(s) (see MPEP 2163 II A). Response to Arguments Applicant's arguments filed 26 December 2025 have been fully considered but are moot because a new ground(s) of rejection is made in view of Teraoka et al (US 6,097,113). Conclusion Applicant's amendment necessitated the new ground(s) of rejection presented in this Office action. Accordingly, THIS ACTION IS MADE FINAL. See MPEP § 706.07(a). Applicant is reminded of the extension of time policy as set forth in 37 CFR 1.136(a). A shortened statutory period for reply to this final action is set to expire THREE MONTHS from the mailing date of this action. In the event a first reply is filed within TWO MONTHS of the mailing date of this final action and the advisory action is not mailed until after the end of the THREE-MONTH shortened statutory period, then the shortened statutory period will expire on the date the advisory action is mailed, and any nonprovisional extension fee (37 CFR 1.17(a)) pursuant to 37 CFR 1.136(a) will be calculated from the mailing date of the advisory action. In no event, however, will the statutory period for reply expire later than SIX MONTHS from the mailing date of this final action. Any inquiry concerning this communication or earlier communications from the examiner should be directed to THA-O H BUI whose telephone number is (571)270-7357. The examiner can normally be reached M-F 7:00AM - 3:00PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, ALEXANDER SOFOCLEOUS can be reached at 571-272-0635. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /THA-O H BUI/Primary Examiner, Art Unit 2825 02/02/2026
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Prosecution Timeline

Sep 01, 2023
Application Filed
Sep 24, 2025
Non-Final Rejection — §103, §112
Dec 26, 2025
Response Filed
Jan 16, 2026
Examiner Interview Summary
Jan 16, 2026
Applicant Interview (Telephonic)
Feb 02, 2026
Final Rejection — §103, §112 (current)

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2y 5m to grant Granted Mar 03, 2026
Patent 12555635
MEMORY DEVICE HAVING CACHE STORAGE UNIT FOR STORAGE OF CURRENT AND NEXT DATA PAGES AND PROGRAM OPERATION THEREOF
2y 5m to grant Granted Feb 17, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

3-4
Expected OA Rounds
88%
Grant Probability
92%
With Interview (+4.3%)
2y 4m
Median Time to Grant
Moderate
PTA Risk
Based on 965 resolved cases by this examiner. Grant probability derived from career allow rate.

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