Prosecution Insights
Last updated: April 19, 2026
Application No. 18/461,316

CHIP PACKAGE DEVICES AND MEMORY SYSTEMS

Non-Final OA §102
Filed
Sep 05, 2023
Examiner
ULLAH, ELIAS
Art Unit
2893
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Yangtze Memory Technologies Co. Ltd.
OA Round
1 (Non-Final)
84%
Grant Probability
Favorable
1-2
OA Rounds
2y 4m
To Grant
92%
With Interview

Examiner Intelligence

Grants 84% — above average
84%
Career Allow Rate
700 granted / 829 resolved
+16.4% vs TC avg
Moderate +8% lift
Without
With
+8.1%
Interview Lift
resolved cases with interview
Typical timeline
2y 4m
Avg Prosecution
22 currently pending
Career history
851
Total Applications
across all art units

Statute-Specific Performance

§101
0.1%
-39.9% vs TC avg
§103
32.8%
-7.2% vs TC avg
§102
55.7%
+15.7% vs TC avg
§112
7.8%
-32.2% vs TC avg
Black line = Tech Center average estimate • Based on career data from 829 resolved cases

Office Action

§102
DETAILED ACTION Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1-16are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Wang et al. (Wang, US 2019/0157209 A1). Regarding claim 1, Wang shows a chip package device (package chip 30 in FIG. 22 and [0071]), comprising: a circuit substrate (circuit substrate CB in FIG. 22) having a first surface (top surface of CB) and a second surface ( bottom surface of CB) disposed oppositely (see FIG 22), wherein the circuit substrate (CB) comprises an opening ( opening of 150 via) that penetrates through the circuit substrate (CB) in a direction from the first surface (top surface of CB) towards the second surface (bottom surface of CB); a first chip (chip 120); a second chip (chip 110), wherein the second chip (chip 110) is fixed on the first surface of the circuit substrate (CB), and the first chip (chip 120) is fixed on a surface of the second chip away from the circuit substrate (CB); a first conductive assembly connecting the first chip (chip 120) and the circuit substrate (CB); and a second conductive assembly (see FIG. 22), wherein a part of the second conductive assembly penetrates through the opening ( via 150), and the second conductive assembly connects the second chip and the circuit substrate (CB). Regarding claim 2, Wang shows a chip package device (package chip 30 in FIG. 22 and [0071]), wherein the first chip (chip 120) has a first active surface and a first back surface disposed oppositely (see FIG. 22), the first back surface of the first chip (chip[ 120) is fixed on the second chip (Chip 110), and a first pad is disposed on the first active surface (see FIG. 22). Regarding claim 3, Wang shows a chip package device (package chip 30 in FIG. 22 and [0071]), wherein the first conductive assembly comprises: first wires (wire WR1/WR2), one end of each of the first wires being fixed on the first pad of the first active surface, and other ends of each of the first wires being fixed on the first surface of the circuit substrate (CB). Regarding claim 4, Wang shows a chip package device (package chip 30 in FIG. 22 and [0071]), wherein the first conductive assembly further comprises: conductive bridging blocks ( interface between chip and redistribution layer) fixed on at least one of the first chip (chip 120) and the second chip (chip 1220); and the first wires comprise first wire (WR1/WR2) segments and second wire segments, two opposite ends of the first wire segments being fixed on the conductive bridging blocks and the first pad of the first active surface respectively (see Fig. 22), and two opposite ends of the second wire segments being fixed on the conductive bridging blocks and the first surface of the circuit substrate respectively (see FIG. 22). Regarding claim 5, Wang shows a chip package device (package chip 30 in FIG. 22 and [0071]), wherein the conductive bridging blocks are fixed on the first active surface of the first chip (active surface of chip 120), and are disposed as being spaced apart from the first pad (pad of chip 120). Regarding claim 6, Wang shows a chip package device (package chip 30 in FIG. 22 and [0071]), wherein the conductive bridging blocks are fixed on the surface of the second chip (chip 110) far away from the circuit substrate (substrate CB), and are disposed as being spaced apart from the first chip (chip 120). Regarding claim 7, Wang shows a chip package device (package chip 30 in FIG. 22 and [0071]), wherein the first conductive assembly further comprises: carriers, wherein the carriers are fixed on at least one of the first chip and the second chip, and a plurality of the conductive bridging blocks are located on the carriers (c1 in [0028]). Regarding claim 8, Wang shows a chip package device (package chip 30 in FIG. 22 and [0071]), wherein the carriers include at least one of a semiconductor substrate ( chip 120/110 comprise semiconductor substrate) and a circuit board (CB). Regarding claim 9, Wang shows a chip package device (package chip 30 in FIG. 22 and [0071]), wherein the circuit substrate further comprises: pins (see connection pin on top of chip 110) located on the first surface of the circuit substrate (CB), disposed as being spaced apart from the second chip, and connected with the circuit substrate, wherein other ends of the first wires are fixed on the pins (see FIG. 22). Regarding claim 10, Wang shows a chip package device (package chip 30 in FIG. 22 and [0071]), wherein the second chip (chip 110) has a second active surface (top surface of chip 120) and a second back surface (back surface 120) disposed oppositely, the second active surface of the second chip is fixed on the first surface of the circuit substrate (CB), and a plurality of second pads (connection pad of chip 120) are disposed on the second active surface and are exposed in the opening (interface of 150 and pad); the second conductive assembly comprises second wires that penetrate through the opening, and two opposite ends of the second wires are fixed on the second pads and the second surface of the circuit substrate (CB) respectively. Regarding claim 11, Wang shows a chip package device (package chip 30 in FIG. 22 and [0071]), wherein the plurality of second pads (pad of chip 120) are located between two opposite edges of the second chip (Chip 120). Regarding claim 12, Wang shows a chip package device (package chip 30 in FIG. 22 and [0071]), further comprising: a first adhesion layer (DA1) that is disposed between the first chip (chip 120) and the second chip (chip 110), and adheres the first chip and the second chip (see FIG. 22). Regarding claim 13, Wang shows a chip package device (package chip 30 in FIG. 22 and [0071]), further comprising: a second adhesion layer (DA2) that is disposed between the second chip (chip 110) and the circuit substrate (CB), and adheres the second chip and the circuit substrate (CB). Regarding claim 14, Wang shows a chip package device (package chip 30 in FIG. 22 and [0071]), wherein the circuit substrate (CB) comprises a plurality of third pads (pads of CB) located on the second surface; and the chip package device further comprises: a ball grid array (ball grid 200) comprising a plurality of solder balls located on the plurality of third pads (see FIG. 22). Regarding claim 15, Wang shows a chip package device (package chip 30 in FIG. 22 and [0071]), further comprising: a package layer (130) at least partially covering the first conductive assembly, the first chip (120), the second chip (110) and the circuit substrate (CB). Regarding claim 16, Wang shows a chip package device (package chip 30 in FIG. 22 and [0071]), a chip package device comprising: a circuit substrate (CB) having a first surface and a second surface disposed oppositely, wherein the circuit substrate comprises an opening (VIA opening150) that penetrates through the circuit substrate (CB) in a direction from the first surface towards the second surface; a first chip (chip 110/120); a second chip (110/120), wherein the second chip is fixed on the first surface of the circuit substrate (CB), and the first chip is fixed on a surface of the second chip far away from the circuit substrate (CB); a first conductive assembly (interconnection conductive layer in 180) connecting the first chip and the circuit substrate (CB); and a second conductive assembly, wherein a part of the second conductive assembly penetrates through the opening (VIA opening 150), and the second conductive assembly connects the second chip and the circuit substrate (CB). Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to ELIAS M ULLAH whose telephone number is (571)272-1415. The examiner can normally be reached M-F at 8AM-5PM EST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Yara Green can be reached at 571-270-3035. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /ELIAS ULLAH/Primary Examiner, Art Unit 2893
Read full office action

Prosecution Timeline

Sep 05, 2023
Application Filed
Nov 15, 2025
Non-Final Rejection — §102 (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
84%
Grant Probability
92%
With Interview (+8.1%)
2y 4m
Median Time to Grant
Low
PTA Risk
Based on 829 resolved cases by this examiner. Grant probability derived from career allow rate.

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