DETAILED ACTION
General Remarks
The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA .
Election/Restrictions
Applicant’s election without traverse of Group I, (claims 1-13), in the reply filed on 01/06/2026 is acknowledged. Non-elected claims 14-20 are withdrawn.
Drawings
The drawings are objected to under 37 CFR 1.83(a). The drawings must show every feature of
the invention specified in the claims. Therefore, the limitation of “at least one additional line of conducting material located atop the second line of conducting material” in claim 8 must be shown or the feature(s) canceled from the claim(s). No new matter should be entered.
Corrected drawing sheets in compliance with 37 CFR 1.121(d) are required in reply to the Office action to avoid abandonment of the application. Any amended replacement drawing sheet should include all of the figures appearing on the immediate prior version of the sheet, even if only one figure is being amended. The figure or figure number of an amended drawing should not be labeled as “amended.” If a drawing figure is to be canceled, the appropriate figure must be removed from the replacement sheet, and where necessary, the remaining figures must be renumbered and appropriate changes made to the brief description of the several views of the drawings for consistency. Additional replacement sheets may be necessary to show the renumbering of the remaining figures. Each drawing sheet submitted after the filing date of an application must be labeled in the top margin as either “Replacement Sheet” or “New Sheet” pursuant to 37 CFR 1.121(d). If the changes are not accepted by the examiner, the applicant will be notified and informed of any required corrective action in the next Office action. The objection to the drawings will not be held in abeyance.
Claim Objections
Claim 1 is objected to because of the following informalities: “…at least one line of conducting
material located in the dielectric material substrate…”. It should be read “…at least one line of conducting material located on the dielectric material substrate …”.
Claim 7 is objected to because of the following informalities: “…a first line of conducting
material located in the dielectric material substrate… … a second line of conducting material located in the dielectric material substrate…”. It should be read “…a first line of conducting material located on the dielectric material substrate… a second line of conducting material located on the dielectric material substrate”.
Appropriate correction is required.
Claim Rejections - 35 USC § 103
The following is a quotation of AIA 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action:
A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102 of this title, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made.
Claims 1-13 are rejected under AIA 35 U.S.C. 103 as being unpatentable over Whitney et al. (US 5726621 A, hereinafter Whitney) in view of Li (US 20150097266 A1, hereinafter Li).
Re: Independent Claim 1, Whitney discloses an electrical fuse for an integrated circuit, the electrical fuse (Fig. 2a) comprising:
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Whitney’s Figure 2a-Annotated.
a dielectric material substrate (26a a ceramic substrate such as dielectric material in Col. 1, lines 40-45, Col. 3, lines 51-52, Fig. 2a); and
at least one line of conducting material (44a fusible element in Col. 3, lines 51-52, Fig. 2a) located on the dielectric material substrate (26a),
wherein each of the at least one line of conducting material (44a) includes:
a first conductive structure (44a-left a portion of 44a at left side in Col. 4, lines 11-12, Fig. 2a-Annotated);
a second conductive structure (44a-right a portion of 44a at right side in Col. 4, lines 11-12, Fig. 2a-Annotated); and
a fuse element (48a-1 fuse element, a middle portion of 44a in Col. 4, lines 17-18, Fig. 2a-Annotated) extending horizontally between (Fig. 2a-Annotated) the first (44a-left) and second conductive (44a-right) structures.
Whitney does not expressly disclose wherein the fuse element (48a-1) has a height that is less (Fig. 2a-Annotated) than the height of the first (44a-left) and second (44a-right) conductive structures.
However, in the same semiconductor device field of endeavor, Li discloses wherein the fuse element (72 fuse link in [0049], Fig. 2B-Annotated) has a height that is less (the fuse link height HL is about 10% of the fuse contact height Hc in [0049]) than the height of the first (74-left fuse contact in [0049], Fig. 2B-Annotated) and second (74-right fuse contact in [0049], Fig. 2B-Annotated) conductive structures.
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Li’s Figure 2B-Annotated.
It would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to include the Li’s feature of wherein the fuse element has a height that is less than the height of the first and second conductive structures to Whitney’s device to increase the current density to facilitate blowing of the fuse ([0049], Li).
Re: Claim 2, Whitney modified by Li discloses the electrical fuse of claim 1, wherein the fuse element (Li applied to 48a-1, Fig. 2a, Whitney) extends horizontally (Fig. 2a-Annotated, Whitney) between a bottom portion of each of the first (Li applied to 44a-left Fig. 2a-Annotated, Whitney) and second conductive (Li applied to 44a-right Fig. 2a-Annotated, Whitney) structures.
Re: Claim 3, Whitney modified by Li discloses the electrical fuse of claim 1, wherein the fuse element (72 fuse link in [0049], Fig. 2B-Annotated, Li) is ten (10) to fifteen (15) times less (the fuse link height HL is about 10% of the fuse contact height Hc in [0049] , Li) in height than the first (74-left fuse contact in [0049], Fig. 2B-Annotated, Li) and second conductive (74-right fuse contact in [0049], Fig. 2B-Annotated, Li) structures.
Re: Claim 4, Whitney modified by Li discloses the electrical fuse of claim 1, further comprising: a first conductive connector (46a-left-1 pad 46a at left side in Col. 4, lines 11-12, Fig. 2a-Annotated, Whitney) that is located above the first conductive structure (44a-left, Whitney); and a second conductive connector (46a-right-1 pad 46a at right side in Col. 4, lines 11-12, Fig. 2a-Annotated, Whitney) that is located above the second conductive structure (44a-right, Whitney).
Re: Claim 5, Whitney modified by Li discloses the electrical fuse of claim 4, further comprising: a layer of dielectric material (24a a ceramic substrate such as dielectric material in Col. 1, lines 40-45, Col. 3, lines 51-52, Fig. 2a, Whitney) surrounding the first conductive connector (46a-left-1, Whitney) and the second conductive connector (46a-right-1, Whitney).
Re: Claim 6, Whitney modified by Li discloses the electrical fuse of claim 1,
Whitney modified by Li does not expressly disclose wherein the conducting material is a metal.
However, in the same semiconductor device field of endeavor, Li discloses the conducting material is a metal (70 a fuse structure made of tungsten in [0058], Fig. 2B).
It would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to include the Li’s feature of wherein the conducting material is a metal to Whitney’s device to increase the current density to facilitate blowing of the fuse ([0049], Li).
Re: Independent Claim 7, Whitney teaches an electrical fuse for an integrated circuit, the electrical fuse (Fig. 2a) comprising:
a dielectric material substrate (26a a ceramic substrate such as dielectric material in Col. 1, lines 40-45, Col. 3, lines 51-52, Fig. 2a);
a first line of conducting material (44a fusible element in Col. 3, lines 51-52, Fig. 2a) located on the dielectric material substrate (26a), wherein the first line of conducting material (44a) includes:
a first conductive structure (44a-left a portion of 44a at left side in Col. 4, lines 11-12, Fig. 2a-Annotated);
a second conductive structure (44a-right a portion of 44a at right side in Col. 4, lines 11-12, Fig. 2a-Annotated); and
a fuse element (48a-1 fuse element, a middle portion of 44a in Col. 4, lines 17-18, Fig. 2a-Annotated) extending horizontally between (Fig. 2a-Annotated) the first (44a-left) and second conductive (44a-right) structures,
a second line of conducting material (42a fusible element in Col. 3, lines 51-52, Fig. 2a) located on the dielectric material substrate (26a) located above the first line of conducting material (44a), wherein the second line of conducting material (42a) includes:
a third conductive structure (42a-left a portion of 42a at left side in Col. 4, lines 11-12, Fig. 2a-Annotated);
a fourth conductive structure (42a-right a portion of 42a at right side in Col. 4, lines 11-12, Fig. 2a-Annotated); and
a second fuse element (48a-2 fuse element, a middle portion of 42a in Col. 4, lines 17-18, Fig. 2a-Annotated) extending horizontally between the third (42a-left) and fourth conductive (42a-right) structures.
Whitney does not expressly disclose wherein the fuse element (44a) has a height that is less than the height of the first (44a-left) and second (44a-right) conductive structures; and wherein the second fuse element (48a-2) has a height that is less than the height of the third (42a-left) and fourth conductive (42a-right) structures.
However, in the same semiconductor device field of endeavor, Li discloses wherein the fuse element (72 fuse link in [0049], Fig. 2B-Annotated) has a height that is less (the fuse link height HL is about 10% of the fuse contact height Hc in [0049]) than the height of the first (74-left fuse contact in [0049], Fig. 2B-Annotated) and second (74-right fuse contact in [0049], Fig. 2B-Annotated) conductive structures.
It would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to include the Li’s feature of wherein the fuse element has a height that is less than the height of the first and second conductive structures to Whitney’s device to obtain wherein the fuse element has a height that is less than the height of the first and second conductive structures; and wherein the second fuse element has a height that is less than the height of the third and fourth conductive structures to increase the current density to facilitate blowing of the fuse ([0049], Li).
Re: Claim 8, Whitney modified by Li discloses the electrical fuse of claim 7, further comprising: at least one additional line of conducting material (40a fusible element in Col. 3, lines 51-52, Fig. 2a, Whitney) located atop the second line of conducting material (42a Fig. 2a, Whitney).
Re: Claim 9, Whitney modified by Li discloses the electrical fuse of claim 7, wherein the first fuse element (Li applied to 48a-1, Fig. 2a, Whitney) extends horizontally between (Fig. 2a-Annotated, Whitney) a bottom portion of each of the first (Li applied to 44a-left Fig. 2a-Annotated, Whitney) and second conductive (Li applied to 44a-right Fig. 2a-Annotated, Whitney) structures, and the second fuse element (Li applied to 48a-2, Fig. 2a, Whitney) extends horizontally between a bottom portion of each of the third (Li applied to 42a-left Fig. 2a-Annotated, Whitney) and fourth conductive (Li applied to 42a-right Fig. 2a-Annotated, Whitney) structures.
Re: Claim 10, Whitney modified by Li discloses the electrical fuse of claim 7, wherein the first fuse element (72 fuse link in [0049], Fig. 2B-Annotated, Li) is ten (10) to fifteen (15) times less (the fuse link height HL is about 10% of the fuse contact height Hc in [0049] , Li) in height than the first (74-left fuse contact in [0049], Fig. 2B-Annotated, Li) and second conductive (74-right fuse contact in [0049], Fig. 2B-Annotated, Li) structures, and the second fuse element (Li applied to 48a-1, Fig. 2a, Whitney) is ten (10) to fifteen (15) times less in height than the third (Li applied to 42a-left Fig. 2a-Annotated, Whitney) and fourth (Li applied to 42a-right Fig. 2a-Annotated, Whitney) conductive structures.
Re: Claim 11, Whitney modified by Li discloses the electrical fuse of claim 7, further comprising: a first conductive connector (46a-left-1 pad 46a at left side in Col. 4, lines 11-12, Fig. 2a-Annotated, Whitney) that is located above the first conductive structure (44a-left Fig. 2a-Annotated, Whitney); a second conductive connector (46a-right-1 pad 46a at right side in Col. 4, lines 11-12, Fig. 2a-Annotated, Whitney) that is located above the second conductive structure (44a-right Fig. 2a-Annotated, Whitney); a third conductive connector (46a-left-2 pad 46a at left side in Col. 4, lines 11-12, Fig. 2a-Annotated, Whitney) that is located above the third conductive structure (42a-left Fig. 2a-Annotated, Whitney); and a fourth conductive connector (46a-right-2 pad 46a at right side in Col. 4, lines 11-12, Fig. 2a-Annotated, Whitney) that is located above the fourth conductive structure (42a- right Fig. 2a-Annotated, Whitney).
Re: Claim 12, Whitney modified by Li discloses the electrical fuse of claim 11, further comprising: a first layer of dielectric material (24a a ceramic material such as dielectric material in Col. 1, lines 40-45, Col. 3, lines 51-52, Fig. 2a, Whitney) surrounding the first conductive connector (46a-left-1, Whitney) and the second conductive connector (46a-right-1, Whitney); and a second layer of dielectric material (22a a ceramic material such as dielectric material in Col. 1, lines 40-45, Col. 3, lines 51-52, Fig. 2a, Whitney) surrounding the third conductive connector (46a-left-2, Fig. 2a-Annotated, Whitney) and the fourth consecutive connector (46a-right-2, Fig. 2a-Annotated, Whitney).
Re: Claim 13, Whitney modified by Li discloses the electrical fuse of claim 7,
Whitney modified by Li does not expressly disclose wherein the conducting material is a metal.
However, in the same semiconductor device field of endeavor, Li discloses the conducting material is a metal (70 a fuse structure made of tungsten in [0058], Fig. 2B).
It would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to include the Li’s feature of wherein the conducting material is a metal to Whitney’s device to increase the current density to facilitate blowing of the fuse ([0049], Li).
Conclusion
The prior art made of record and not relied upon is considered pertinent to applicant's disclosure:
Srikrishnan et al. (US 5469981 A) teaches “ELECTRICALLY BLOWABLE FUSE STRUCTURE MANUFACTURING FOR ORGANIC INSULATORS”. This document is related to an electrically blowable fuse structure usable with organic insulators in microelectronic parts is provided. The fuse structure is made of a first heat resistant member, a fusing element and a second heat resistant member. The heat resistant members are in substantial contact with the fuse and thermally insulate the fuse from the organic insulator. The ends of each fuse are electrically connected to a pair of conductors.
Yoneda (US 20250182989 A1) teaches “PROTECTIVE ELEMENT”. This document is related to a protective element including: a first fuse element part including a first fuse element; a second fuse element part including a second fuse element; an insulating enclosure having a fusing space in which the first fuse element is positioned and a cutting space in which the second fuse element is positioned; and a slider disposed to be movable within the fusing space toward a second fuse element side. The fusing space is divided into a first space and a second space which interpose the slider, the first fuse element being positioned in the first space, and a second space being connected to the cutting space. When a fusion current flows to the first fuse element, and as pressure in the first space rises, the slider is configured to move toward a second fuse element side such that a cutting part of the slider cuts the second fuse element.
Any inquiry concerning this communication or earlier communications from the examiner should be directed to SANDRA MILENA RODRIGUEZ VILLANUEVA whose telephone number is (571)272-1936. The examiner can normally be reached Monday to Friday 8:00am-5:00pm (EST).
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/SANDRA MILENA RODRIGUEZ VILLANUEVA/Examiner, Art Unit 2898
/JESSICA S MANNO/SPE, Art Unit 2898