DETAILED ACTION
Notice of Pre-AIA or AIA Status
The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA .
Election/Restrictions
Applicant’s election without traverse of claims 1-5 in the reply filed on 5/4/26 is acknowledged.
Claim Rejections - 35 USC § 112
The following is a quotation of 35 U.S.C. 112(b):
(b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention.
The following is a quotation of 35 U.S.C. 112 (pre-AIA ), second paragraph:
The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention.
Claim 1 recites the limitation "critical electrical field" in line 15. There is insufficient antecedent basis for this limitation in the claim.
Claim 1 recites the limitation "permittivity" in line 15. There is insufficient antecedent basis for this limitation in the claim.
Claims 1-5 are rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention.
In claim 1, lines 15-16, it is unclear what part of the first semiconductor region, the product is greater than, thus claim is indefinite.
In claim 2, lines 2 and 3, it is unclear what effective length is being referred to, thus claim indefinite.
In claim 5, lines 2 and 3, it is unclear what part of the second semiconductor region, the doping concentration is greater than, thus claim is indefinite.
Allowable Subject Matter
Claims 1-5 would be allowable if rewritten or amended to overcome the rejection(s) under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), 2nd paragraph, set forth in this Office action.
Examiner’s Cited References
The cited references generally show the similar or related structure having a super-junction having a first semiconductor region and a second semiconductor region, where first and second regions having different materials and conductivities and the product of the critical electrical field and the permittivity of the first region is greater than the product of the critical electrical field and the permittivity of the second region as presently claimed by applicant.
Conclusion
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LONG . PHAM
Examiner
Art Unit 2823
/LONG PHAM/ Primary Examiner, Art Unit 2897