DETAILED ACTION
Notice of Pre-AIA or AIA Status
The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA .
Claims 1-11 are pending.
Claims 1-11 are rejected below.
Specification
The title of the invention is not descriptive. A new title is required that is clearly indicative of the invention to which the claims are directed.
Claim Rejections - 35 USC § 102
In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status.
The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action:
A person shall be entitled to a patent unless –
(a)(2) the claimed invention was described in a patent issued under section 151, or in an application for patent published or deemed published under section 122(b), in which the patent or application, as the case may be, names another inventor and was effectively filed before the effective filing date of the claimed invention.
Claim(s) 1-4, and 7-11 is/are rejected under 35 U.S.C. 102(a)(2) as being anticipated by Kim (U.S. PG Pub. 2024/0353348).
As to claim 1, 8, 9 and 10, Kim teaches a method for cell detection, comprising: obtaining, by shooting, a cell picture of a cell obtained after tab welding [0033 The monitoring apparatus 100 may determine whether a battery cell is defective based on an image obtained by capturing at least one process processing device 210, 220, and 230. According to an example embodiment, the monitoring apparatus 100 may determine whether the cathode tab of the battery cell and the top cap are weakly welded based on the image of the at least one process processing device 210, 220, and 230.], the cell picture being shot under illumination of a shadowless light source[0032]; determining a detection object in the cell picture [0082 In an example embodiment, when welding is present only in a region where the top cap and the cathode tab of the battery unit 105 overlap, the position detector 170 may determine that the welding position is normal. In an example embodiment, when welding is at least partially present in a region where the top cap and the cathode tab do not overlap, the position detector 170 may determine that the welding position is defective.]; and performing defect detection based on the detection object to obtain a detection result[0082 In an example embodiment, when welding is present only in a region where the top cap and the cathode tab of the battery unit 105 overlap, the position detector 170 may determine that the welding position is normal. In an example embodiment, when welding is at least partially present in a region where the top cap and the cathode tab do not overlap, the position detector 170 may determine that the welding position is defective].
As to claim 2, Kim teaches wherein the cell picture comprises a first cell picture which is obtained, by shooting, of the cell obtained before an identification layer is applied, and the detection object comprises a welding point detection region[0065]; and wherein determining the detection object in the cell picture comprises: determining a reference position of an adapter plate in the first cell picture based on a preset adapter plate model[0065 determining the welds and where to crop. Examiner notes that adapter plate has no definition and can be the area around the welds]; and determining the welding point detection region based on the reference position of the adapter plate[0065-0066].
As to claim 3, Kim teaches wherein the detection result comprises a welding point detection result; and wherein performing defect detection based on the detection object to obtain the detection result comprises: looking for and obtaining spot information within the welding point detection region, and obtaining the welding point detection result by analysis based on the spot information[0086 various weld states in the various known weld area].
As to claim 4, Kim teaches wherein the spot information comprises the number of spots and/or a sum of spot areas[0086 various weld spots in the various weld areas].
As to claims 7 and 11, Kim teaches wherein the cell picture is shot by two cameras under illumination of the shadowless light source[0037].
Claim Rejections - 35 USC § 103
In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status.
The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action:
A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made.
Claim(s) 5 and 6 is/are rejected under 35 U.S.C. 103 as being unpatentable over Kim (U.S. PG Pub. 2024/0353348) in view of Lev (U.S. PG Pub. 2021/0295745).
As to claims 5 and 6 Kim describes imaging the tab and determining if an defects are present. What Kim does not do is discuss applying and identification layer. However, this is an obvious variation and is taught by Lev as follows:
As to claims 5 and 6 Lev teaches applying an identification layer determine the of components around it (such as a plate from Kim) and determine if a defect is present based on imagines and known defects [0103].
Therefore, it would have been obvious to one of ordinary skill in the art prior to the effective filing date to include the teachings of Lev into the system and methods of Kim. The motivation to combine is that Lev teaches using defect monitoring an identification layer can be properly placed and corrected, if need be, thereby not allowing defective layers to be released [0103-0106].
Other prior art of record
The prior art made of record and not relied upon is considered pertinent to applicant's disclosure:
Bhagat (U.S. PG Pub. 2024/0170742) teaches quality analysis for battery cells.
Zhao (U.S. Pat. 11,657,494) teaches a detecting defects in battery cells.
Jeung (U.S. PG Pub. 2021/0130029) teaches that it is known to add labels to batteries. This is also supporting evidence for above.
Conclusion
Any inquiry concerning this communication or earlier communications from the examiner should be directed to NATHAN L LAUGHLIN whose telephone number is (571)270-1042. The examiner can normally be reached Monday-Friday 8AM-4PM.
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/NATHAN L LAUGHLIN/Primary Examiner, Art Unit 2119