Office Action Predictor
Last updated: April 15, 2026
Application No. 18/531,488

WAFER LEVEL PACKAGING PROCESS FOR THIN FILM INDUCTORS

Non-Final OA §102§Other
Filed
Dec 06, 2023
Examiner
HAIDER, WASIUL
Art Unit
2812
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Qualcomm Incorporated
OA Round
1 (Non-Final)
92%
Grant Probability
Favorable
1-2
OA Rounds
1y 11m
To Grant
95%
With Interview

Examiner Intelligence

Grants 92% — above average
92%
Career Allow Rate
489 granted / 532 resolved
+23.9% vs TC avg
Minimal +3% lift
Without
With
+2.7%
Interview Lift
resolved cases with interview
Fast prosecutor
1y 11m
Avg Prosecution
18 currently pending
Career history
550
Total Applications
across all art units

Statute-Specific Performance

§101
0.2%
-39.8% vs TC avg
§103
53.6%
+13.6% vs TC avg
§102
24.1%
-15.9% vs TC avg
§112
15.3%
-24.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 532 resolved cases

Office Action

§102 §Other
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. 1. Claim(s) 1-3,19-23 are rejected under 35 U.S.C. 102a(1) as being anticipated by US 20130056847 A1 (Chen). PNG media_image1.png 310 590 media_image1.png Greyscale Regarding claim 1, Chen shows (Fig. 4) an integrated circuit (IC) package, comprising: an integrated circuit (IC) die (410, para 27) including an input/output (I/O) pad (not shown in figure but stated in claim 6 as a connector); and a vertical thin-film inductor (TFI) extending vertically (420, para 27, not repeated for the current embodiment, extending from the bottom of die 410 to the ball 460) substantially from the I/O pad to a solder bump (460, solder ball (para 33). Regarding claim 2, Chen shows (Fig. 4) wherein the vertical TFI (420) comprises an electrical conducting pillar (472, 436,438 post, para 28,31) extending vertically substantially from the I/O pad (connector as in claim 6) to a solder bump (460). Regarding claim 3, Chen shows (Fig. 4) wherein the electrical conducting pillar (472, 436,438 post) comprises copper (para 34, since posts are part of the metal interconnect structure). Regarding claim 19, Chen shows (Fig. 4) further comprising a passivation layer (452, 456 para 31,33) coaxially surrounding the electrical conducting pillar (472, 436, 438, para 33). Regarding claim 20, Chen shows (Fig. 4) wherein the passivation layer comprises a polymer (para 34, polyimide a type of polymer) or an epoxy mold compound. Regarding claim 21, Chen shows (Fig. 4) wherein the polymer comprises polyimide (para 34) or polybenzoxazoles (PBO). Regarding claim 22, Chen shows (Fig. 4) a method of fabricating an integrated circuit (IC) package, comprising: providing an integrated circuit (IC) (410, para 27) including an input/output (I/O) pad (not shown in figure but stated in claim 6 as a connector); forming a vertical thin-film inductor (TFI) extending vertically (420, para 27, not repeated for the current embodiment, extending from the bottom of die 410 to the ball 460) from substantially the I/O pad; and forming a solder bump (460, solder ball (para 33) over the vertical TFI. Regarding claim 23, the prior art/s as noted in the above rejection of claim 2, discloses the entire claimed invention. Allowable Subject Matter Claims 4-18, 24-30 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Regarding claim 4 or 24, the prior art of record, either singularly or in combination, does not disclose or suggest the combination of limitations including “first magnetic semi-ring layer electrically isolated from the electrical conducting pillar”. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to WASIUL HAIDER whose telephone number is (571)272-1554. The examiner can normally be reached M-F 9 a.m. - 6 p.m.. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, William Partridge can be reached at (571) 270-1402. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /WASIUL HAIDER/Primary Examiner, Art Unit 2812
Read full office action

Prosecution Timeline

Dec 06, 2023
Application Filed
Jan 27, 2026
Non-Final Rejection — §102, §Other
Apr 01, 2026
Response Filed

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12604496
Epitaxy Everywhere Based Self-Aligned Direct Backside Contact
2y 5m to grant Granted Apr 14, 2026
Patent 12593462
IGBT AND DIODE WITH LIFETIME CONTROL REGIONS
2y 5m to grant Granted Mar 31, 2026
Patent 12593725
ELECTRONIC DEVICE
2y 5m to grant Granted Mar 31, 2026
Patent 12593477
SEMICONDUCTOR DEVICE
2y 5m to grant Granted Mar 31, 2026
Patent 12593435
EDRAM AND METHOD FOR MAKING SAME
2y 5m to grant Granted Mar 31, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

AI Strategy Recommendation

Get an AI-powered prosecution strategy using examiner precedents, rejection analysis, and claim mapping.
Powered by AI — typically takes 5-10 seconds

Prosecution Projections

1-2
Expected OA Rounds
92%
Grant Probability
95%
With Interview (+2.7%)
1y 11m
Median Time to Grant
Low
PTA Risk
Based on 532 resolved cases by this examiner. Grant probability derived from career allow rate.

Sign in for Full Analysis

Enter your email to receive a magic link. No password needed.

Free tier: 3 strategy analyses per month