Prosecution Insights
Last updated: July 17, 2026
Application No. 18/541,146

PROBE CARD STRUCTURE

Final Rejection §112
Filed
Dec 15, 2023
Priority
Aug 09, 2023 — TW 112129888
Examiner
VELEZ, ROBERTO
Art Unit
2858
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Star Technologies Inc.
OA Round
4 (Final)
67%
Grant Probability
Favorable
5-6
OA Rounds
1m
Est. Remaining
88%
With Interview

Examiner Intelligence

Grants 67% — above average
67%
Career Allowance Rate
180 granted / 267 resolved
-0.6% vs TC avg
Strong +21% interview lift
Without
With
+20.6%
Interview Lift
resolved cases with interview
Typical timeline
2y 9m
Avg Prosecution
30 currently pending
Career history
291
Total Applications
across all art units

Statute-Specific Performance

§101
2.8%
-37.2% vs TC avg
§103
79.8%
+39.8% vs TC avg
§102
7.5%
-32.5% vs TC avg
§112
9.3%
-30.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 267 resolved cases

Office Action

§112
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Response to Arguments Applicant’s arguments, see remarks (pages 6-7), filed on 05/14/2026, with respect to claims 1-2 and 7-12 have been fully considered and are persuasive. The previous rejection of claims 1-2 and 7-12 has been withdrawn. Claim Objections Claim 8 is objected to because of the following informalities: Regarding claim 8, line 1 recites “the signal probe”. For clarity and consistency purposes, line 1 should recite “the at least one signal probe”. Regarding claim 9, line 2 recites “the signal probe”. For clarity and consistency purposes, line 1 should recite “the at least one signal probe”. Regarding claim 12, line 2 recites the acronym “GSG”. For clarity purposes, line 2 should spell out the acronym and should recite “ground-signal-ground (GSG)”. Appropriate correction is required. Claim Rejections - 35 USC § 112 The following is a quotation of 35 U.S.C. 112(b): (b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention. The following is a quotation of 35 U.S.C. 112 (pre-AIA ), second paragraph: The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention. Claims 2 and 12 are rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention. Regarding claim 2, lines 1-3 recite “multiple ground probes are provided, among the multiple ground probes adjacent to the at least one signal probe, only one of the multiple ground probes is electrically connected to the ground point”. Claim 1, from which claim 2 depends, recites in lines 27-29 “at least one ground probe being adjacent to the at least one signal probe, wherein at least one of the ground probe is electrically connected to a ground point”. It is not clear if the newly recited “multiple ground probes” include the already recited “at least one of the ground probe” and/or if the newly recited “multiple ground probes” will have a new ground probe connected to the “ground point” and the previous “at least one of the ground probe” is no longer connected to the “ground point”. Clarification is needed. Regarding claim 12, lines 1-2 recite “wherein the coaxial needle and the at least one ground probe form a GSG shielding structure”. GSG stands for ground-signal-ground. It is used to make reference to the configuration of three probes (1st ground probe, 1st signal probe and 2nd ground probe) being adjacent to each other. As currently presented, the claim is making reference to two probes “coaxial needle” (formed by signal probe) and a “ground probe” forming a “GSG shielding structure”. It is not clear how two probes can form a three probe configuration (GSG). Clarification is needed. Allowable Subject Matter Claims 1 and 7-11 are allowed. Claims 2 and 12 would be allowable if rewritten to overcome the rejection(s) under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), 2nd paragraph, set forth in this Office action and to include all of the limitations of the base claim and any intervening claims. The following is a statement of reasons for the indication of allowable subject matter: Regarding claim 1, the prior art fails to specifically teach a probe card structure, comprising: wherein the plurality of first guide plate through holes have a second quantity of the first guide plate through holes and the plurality of second guide plate through holes have a second quantity of the second guide plate through holes, and the second quantity of the first guide plate through holes corresponds to the second quantity of the second guide plate through holes, wherein a sum of the first quantity of the first guide plate through holes and the second quantity of the first guide plate through holes is less than or equal to a total quantity of the plurality of first guide plate through holes, a sum of the first quantity of the second guide plate through holes and the second quantity of the second guide plate through holes is less than or equal to a total quantity of the plurality of second guide plate through holes; wherein the second quantity of the first guide plate through holes defines a first guide plate second area of the at least one first guide plate, the second quantity of the second guide plate through holes defines a second guide plate second area of the at least one second guide plate, and at least one of the first guide plate second area and the second guide plate second area is plated with the guide plate conductive film; wherein another at least one signal probe correspondingly passes through one part of the second quantity of the first guide plate through holes and one part of the second quantity of the second guide plate through holes, another at least one ground probe correspondingly passes through another part of the second quantity of the first guide plate through holes and another part of the second quantity of the second guide plate through holes; wherein the at least one ground probe of the first guide plate first area and the probe conductive film of the at least one signal probe are electrically connected to each other; the another at least one ground probe of the first guide plate second area and the probe conductive film of the another at least one signal probe are electrically connected to each other; the at least one ground probe of the second guide plate first area and the probe conductive film of the at least one signal probe are electrically connected to each other; the another at least one ground probe of the second guide plate second area and the probe conductive film of the another at least one signal probe are electrically connected to each other; wherein the contact elements included in the first guide plate first area are correspondingly insulated from the contact elements included in the first guide plate second area; and wherein the contact elements included in the second guide plate first area are correspondingly insulated from the contact elements included in the second guide plate second area, in combination with all the limitations of the claim. Claims 2 and 7-12 depending from claim 1 and/or dependent claims from claim 1 are allowed for the same reasons as mentioned above and the limitations included in their dependency. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. Shang et al. (US PGPUB 2026/0133222) teaches a probe needle, probe card structure and method of testing a device under test. MAGGIONI (US PGPUB 2019/0302185) teaches a probe head for a testing apparatus of electronic devices with enhanced filtering properties. Yoshida (US PGPUB 2007/0145991) teaches an inspection unit. THIS ACTION IS MADE FINAL. Applicant is reminded of the extension of time policy as set forth in 37 CFR 1.136(a). A shortened statutory period for reply to this final action is set to expire THREE MONTHS from the mailing date of this action. In the event a first reply is filed within TWO MONTHS of the mailing date of this final action and the advisory action is not mailed until after the end of the THREE-MONTH shortened statutory period, then the shortened statutory period will expire on the date the advisory action is mailed, and any nonprovisional extension fee (37 CFR 1.17(a)) pursuant to 37 CFR 1.136(a) will be calculated from the mailing date of the advisory action. In no event, however, will the statutory period for reply expire later than SIX MONTHS from the mailing date of this final action. Any inquiry concerning this communication or earlier communications from the examiner should be directed to ROBERTO VELEZ whose telephone number is (571)272-8597. The examiner can normally be reached Mon-Fri 5:30am-3:30pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Huy Phan can be reached at (571)272-7924. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /ROBERTO VELEZ/Primary Examiner, Art Unit 2858
Read full office action

Prosecution Timeline

Show 2 earlier events
Sep 23, 2025
Response Filed
Oct 07, 2025
Final Rejection mailed — §112
Jan 05, 2026
Response after Non-Final Action
Feb 03, 2026
Request for Continued Examination
Feb 10, 2026
Response after Non-Final Action
Feb 17, 2026
Non-Final Rejection mailed — §112
May 15, 2026
Response Filed
May 29, 2026
Final Rejection mailed — §112 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

5-6
Expected OA Rounds
67%
Grant Probability
88%
With Interview (+20.6%)
2y 9m (~1m remaining)
Median Time to Grant
High
PTA Risk
Based on 267 resolved cases by this examiner. Grant probability derived from career allowance rate.

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