Prosecution Insights
Last updated: April 19, 2026

Examiner: VELEZ, ROBERTO

Tech Center 2800 • Art Units: 2662 2829 2858

This examiner grants 66% of resolved cases

Performance Statistics

66.5%
Allow Rate
-1.5% vs TC avg
281
Total Applications
+21.6%
Interview Lift
1059
Avg Prosecution Days
Based on 260 resolved cases, 2023–2026

Rejection Statute Breakdown

2.3%
§101 Eligibility
27.9%
§102 Novelty
52.5%
§103 Obviousness
14.7%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18399204 INTERPOSER INSTRUMENTATION METHOD AND APPARATUS Non-Final OA TEXAS INSTRUMENTS INCORPORATED
18688990 ELECTRONIC CONTROL UNIT AND METHOD FOR MONITORING SOLDER JOINTS OF AN ELECTRONIC CONTROL UNIT Final Rejection Robert Bosch GmbH
18751417 MAGNETIC RESONANCE NUMERICAL SIMULATION APPARATUS AND METHOD Non-Final OA Canon Medical Systems Corporation
18484245 SYSTEM AND METHOD FOR TESTING CIRCUIT Non-Final OA STMicroelectronics International N.V.
18597283 METHODS, SYSTEMS, AND DEVICES FOR DETECTING DEFORMATION ON A SURFACE Non-Final OA HONEYWELL INTERNATIONAL INC.
18778810 Current Monitoring Device and Current Monitoring Method Based on Current Monitoring Device Non-Final OA Zhongshan Power Supply Bureau of Guangdong Power Grid Co Ltd.
18728467 COMPOSITE PROBE, METHOD FOR ATTACHING PROBE, AND METHOD FOR MANUFACTURING PROBE CARD Non-Final OA JAPAN ELECTRONIC MATERIALS CORPORATION
18430740 INTEGRATED CIRCUIT PIN FOR REFERENCE VOLTAGE AND FAULT COMMUNICATION Final Rejection Allegro MicroSystems, LLC
18567345 ELECTRICALLY CONDUCTIVE CONTACT PIN Non-Final OA POINT ENGINEERING CO., LTD.
18278173 COMPOSITE MOLD, METAL MOLDED ARTICLE, AND METHOD FOR MANUFACTURING SAME Final Rejection POINT ENGINEERING CO., LTD.
18622296 SYSTEM AND METHODS FOR TESTING OF A RECHARGEABLE BATTERY Non-Final OA Cox Automotive, Inc.
18525269 ANALYZING TRANSMISSION LINES Final Rejection Teradyne, Inc.
18696008 SYSTEMS AND METHODS FOR TEST SOCKETS HAVING SCRUBBING CONTACTS Final Rejection Smiths Interconnect Americas, Inc.
18696015 TEST SOCKET AND PROBE WITH STEPPED COLLAR FOR SEMICONDUCTOR INTEGRATED CIRCUITS Non-Final OA Antares Advanced Test Technologies (Suzhou) Limited
18689357 Probe Structure and Electronic Device with Probe Structure Final Rejection Leayun Technology Co., Ltd. of Zhuhai
18541146 PROBE CARD STRUCTURE Non-Final OA STAR TECHNOLOGIES, INC.

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