Prosecution Insights
Last updated: April 19, 2026
Application No. 18/574,564

SEMICONDUCTOR DEVICE

Non-Final OA §103
Filed
Dec 27, 2023
Examiner
MCCALL SHEPARD, SONYA D
Art Unit
2898
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Semiconductor Energy Laboratory Co. Ltd.
OA Round
1 (Non-Final)
93%
Grant Probability
Favorable
1-2
OA Rounds
2y 3m
To Grant
97%
With Interview

Examiner Intelligence

Grants 93% — above average
93%
Career Allow Rate
1082 granted / 1164 resolved
+25.0% vs TC avg
Minimal +4% lift
Without
With
+3.6%
Interview Lift
resolved cases with interview
Typical timeline
2y 3m
Avg Prosecution
24 currently pending
Career history
1188
Total Applications
across all art units

Statute-Specific Performance

§101
0.3%
-39.7% vs TC avg
§103
47.3%
+7.3% vs TC avg
§102
36.1%
-3.9% vs TC avg
§112
13.0%
-27.0% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1164 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Specification The title of the invention is not descriptive. A new title is required that is clearly indicative of the invention to which the claims are directed. The lengthy specification has not been checked to the extent necessary to determine the presence of all possible minor errors. Applicant’s cooperation is requested in correcting any errors of which applicant may become aware in the specification. Claim Objections Claims 1, 2 and 3 are objected to because of the following informalities: 1. A semiconductor device comprising: a display portion, wherein the display portion comprises a plurality of subpixels, wherein each of the plurality of subpixels comprises a first transistor, a second transistor, a first capacitor, a second capacitor, a third capacitor, a first insulating layer, and a wiring, wherein the first transistor is electrically connected to the second transistor, the first capacitor, the second capacitor, and the third capacitor, wherein each of the first capacitor, the second capacitor and wherein the first conductive layers of the first capacitor, the second capacitor, wherein in a top view, a proportion of a total area of the first conductive layers of the first capacitor, the second capacitor, wherein an area of the first conductive layer of the second capacitor is greater than or equal to twice an area of the first conductive layer of the first capacitor, and wherein an area of the first conductive layer of the third capacitor is greater than or equal to twice the area of the first conductive layer of the first capacitor. Appropriate correction is required. 2. A semiconductor device comprising: a display portion, wherein the display portion comprises a plurality of subpixels and a substrate, wherein each of the plurality of subpixels comprises a first transistor, a second transistor, a third transistor, a first capacitor, a second capacitor, a third capacitor, a first insulating layer, and a wiring, wherein each of the first transistor, second transistor, wherein the third transistor is electrically floating, wherein each of the first capacitor, the second capacitor and wherein the first insulating layer is provided over the first transistor and the second transistor, wherein the first conductive layers of the first capacitor, the second capacitor, wherein in a top view, a proportion of a total area of the first conductive layers of the first capacitor to the third capacitor and the wiring to an area of the subpixel is greater than or equal to15%, wherein an area of the first conductive layer of the second capacitor is greater than or equal to twice an area of the first conductive layer of the first capacitor, wherein an area of the first conductive layer of the third capacitor is greater than or equal to twice the area of the first conductive layer of the first capacitor, wherein each of the first transistor, the second transistor and wherein in the top view, a proportion of a total area of the semiconductor layers of the first transistor, the second transistor and Appropriate correction is required. 3. A semiconductor device comprising: a display portion, wherein the display portion comprises a plurality of subpixels and a substrate, wherein each of the plurality of subpixels comprises a first transistor, a second transistor, a third transistor, a first capacitor, a second capacitor, a third capacitor, a first insulating layer, and a wiring, wherein each of the first transistor, second transistor, wherein the third transistor is electrically floating, wherein each of the first capacitor, the second capacitor and wherein the first insulating layer is provided over the first transistor and the second transistor, wherein the first conductive layers of the first capacitor, the second capacitor, wherein in a top view, a proportion of a total area of the first conductive layers of the first capacitor, the second capacitor, the third capacitor and the wiring to an area of the subpixel is greater than or equal to15%, wherein an area of the first conductive layer of the second capacitor is greater than or equal to twice an area of the first conductive layer of the first capacitor, wherein an area of the first conductive layer of the third capacitor is greater than or equal to twice the area of the first conductive layer of the first capacitor, wherein each of the first transistor, the second transistor and wherein the semiconductor layer of the third transistor comprises a region shared with the semiconductor layer of the first transistor, and wherein in the top view, a proportion of a total area of the semiconductor layers of the first transistor, the second transistor and Appropriate correction is required. Claim Rejections - 35 USC § 103 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 1 is/are rejected under 35 U.S.C. 103 as being unpatentable over Kubota et al. JP2016042202A. Regarding claim 1, Kubota et al. in Figs. 1, 11-13 and [0006]-[0091] discloses a semiconductor device 10 comprising: a display portion 100, Fig. 2, wherein the display portion comprises a plurality of subpixels, wherein each of the plurality of subpixels comprises a first transistor 42P, a second transistor 34P, a first capacitor 44, a second capacitor 411, a third capacitor 412, a first insulating layer 180, and a wiring 184, Figs. 11-13, wherein the first transistor 42P is electrically connected to the second transistor 34P, the first capacitor 44, the second capacitor 411, and the third capacitor 412, wherein each of the first capacitor to the third capacitor 44, 411, 412 comprises a first conductive layer 44(194), 411(411a), 412(412a), a second conductive layer 44(195), 411(411b), 412(412b) and a second insulating layer 44(190), 411(190), 412(210) sandwiched between the first conductive layer and the second conductive layer [0068]-[0071], wherein the first insulating layer 180 is provided over the first transistor 42P and the second transistor 34P, wherein the first conductive layers of the first capacitor to the third capacitor 44(194), 411(411a), 412(412a), and the wiring 184 are each provided over the first insulating layer 180. Kubota et al. does not expressly disclose wherein in a top view, a proportion of a total area of the first conductive layers of the first capacitor to the third capacitor and the wiring to an area of the subpixel is greater than or equal to 15 %, wherein an area of the first conductive layer of the second capacitor is greater than or equal to twice an area of the first conductive layer of the first capacitor, and wherein an area of the first conductive layer of the third capacitor is greater than or equal to twice the area of the first conductive layer of the first capacitor. Applicant has not disclosed that in a top view, a proportion of a total area of the first conductive layers of the first capacitor to the third capacitor and the wiring to an area of the subpixel is greater than or equal to 15 %, wherein an area of the first conductive layer of the second capacitor is greater than or equal to twice an area of the first conductive layer of the first capacitor, and wherein an area of the first conductive layer of the third capacitor is greater than or equal to twice the area of the first conductive layer of the first capacitor. However, Kubota et al. teaches in [0006], [0008], [0010], [0068]-[0070] and [0072] teaches that the arrangement of the capacitors in the electro-optical device viewed in a direction perpendicular to the first main surface achieve a large capacitance value with a small area. As a result, the ratio of the area of the pixel circuit to the substrate can be increased. This demonstrates that to achieve large capacitance the area of the conductive layers of the capacitors and the wiring would be considered result effective variables. Accordingly, the claim is obvious without showing that the claimed range(s) achieve unexpected results relative to the prior art range. In re Woodruff, 16 USPQ2d 1935, 1937 (Fed. Cir. 1990). See also In re Huang, 40 USPQ2d 1685, 1688 (Fed. Cir. 1996) (claimed ranges of a result effective variable, which do not overlap the prior art ranges, are unpatentable unless they produce a new and unexpected result which is different in kind and not merely in degree from the results of the prior art). See also In re Boesch, 205 USPQ 215 (CCPA) (discovery of optimum value of result effective variable in known process is ordinarily within skill of art) and In re Aller, 105 USPQ 233 (CCPA 1955) (selection of optimum ranges within prior art general conditions is obvious). Therefore, one of ordinary skill in the art, before the effective filing date of the claimed invention, would recognize that it would be obvious to adjust the area of the capacitors and wiring in order “to increase the capacitance and improve the device performance” thereof and optimize “in a top view, a proportion of a total area of the first conductive layers of the first capacitor to the third capacitor and the wiring to an area of the subpixel is greater than or equal to 15 %, wherein an area of the first conductive layer of the second capacitor is greater than or equal to twice an area of the first conductive layer of the first capacitor, and wherein an area of the first conductive layer of the third capacitor is greater than or equal to twice the area of the first conductive layer of the first capacitor” as “result effective variables”, and arrives at the recited limitation. Claim(s) 2, 3 and 6 is/are rejected under 35 U.S.C. 103 as being unpatentable over Kubota et al. JP2016042202A in view of Lim et al. US 2022/0020328. Regarding claim 2, Kubota et al. in Figs. 1, 11-13 and [0006]-[0091] discloses a semiconductor device 10 comprising: a display portion 100, Fig. 2, wherein the display portion comprises a plurality of subpixels, wherein each of the plurality of subpixels comprises a first transistor 42P, a second transistor 34P, a first capacitor 44, a second capacitor 411, a third capacitor 412, a first insulating layer 180, and a wiring 184, Figs. 11-13, wherein the first transistor 42P is electrically connected to the second transistor 34P, the first capacitor 44, the second capacitor 411, and the third capacitor 412, wherein each of the first capacitor to the third capacitor 44, 411, 412 comprises a first conductive layer 44(194), 411(411a), 412(412a), a second conductive layer 44(195), 411(411b), 412(412b) and a second insulating layer 44(190), 411(190), 412(210) sandwiched between the first conductive layer and the second conductive layer [0068]-[0071], wherein the first insulating layer 180 is provided over the first transistor 42P and the second transistor 34P, wherein the first conductive layers of the first capacitor to the third capacitor 44(194), 411(411a), 412(412a), and the wiring 184 are each provided over the first insulating layer 180. Kubota et al. does not expressly disclose wherein in a top view, a proportion of a total area of the first conductive layers of the first capacitor to the third capacitor and the wiring to an area of the subpixel is greater than or equal to 15 %, wherein an area of the first conductive layer of the second capacitor is greater than or equal to twice an area of the first conductive layer of the first capacitor, and wherein an area of the first conductive layer of the third capacitor is greater than or equal to twice the area of the first conductive layer of the first capacitor. Applicant has not disclosed that in a top view, a proportion of a total area of the first conductive layers of the first capacitor to the third capacitor and the wiring to an area of the subpixel is greater than or equal to 15 %, wherein an area of the first conductive layer of the second capacitor is greater than or equal to twice an area of the first conductive layer of the first capacitor, and wherein an area of the first conductive layer of the third capacitor is greater than or equal to twice the area of the first conductive layer of the first capacitor. However, Kubota et al. teaches in [0006], [0008], [0010], [0068]-[0070] and [0072] teaches that the arrangement of the capacitors in the electro-optical device viewed in a direction perpendicular to the first main surface achieve a large capacitance value with a small area. As a result, the ratio of the area of the pixel circuit to the substrate can be increased. This demonstrates that to achieve large capacitance the area of the conductive layers of the capacitors and the wiring would be considered result effective variables. Accordingly, the claim is obvious without showing that the claimed range(s) achieve unexpected results relative to the prior art range. In re Woodruff, 16 USPQ2d 1935, 1937 (Fed. Cir. 1990). See also In re Huang, 40 USPQ2d 1685, 1688 (Fed. Cir. 1996) (claimed ranges of a result effective variable, which do not overlap the prior art ranges, are unpatentable unless they produce a new and unexpected result which is different in kind and not merely in degree from the results of the prior art). See also In re Boesch, 205 USPQ 215 (CCPA) (discovery of optimum value of result effective variable in known process is ordinarily within skill of art) and In re Aller, 105 USPQ 233 (CCPA 1955) (selection of optimum ranges within prior art general conditions is obvious). Therefore, one of ordinary skill in the art, before the effective filing date of the claimed invention, would recognize that it would be obvious to adjust the area of the capacitors and wiring in order “to increase the capacitance and improve the device performance” thereof and optimize “in a top view, a proportion of a total area of the first conductive layers of the first capacitor to the third capacitor and the wiring to an area of the subpixel is greater than or equal to 15 %, wherein an area of the first conductive layer of the second capacitor is greater than or equal to twice an area of the first conductive layer of the first capacitor, and wherein an area of the first conductive layer of the third capacitor is greater than or equal to twice the area of the first conductive layer of the first capacitor” as “result effective variables”, and arrives at the recited limitation. Kubota et al. does not expressly disclose a third transistor provided over the substrate and electrically floating, wherein each of the first transistor to the third transistor comprises a semiconductor layer, and wherein in the top view, a proportion of a total area of the semiconductor layers of the first transistor to the third transistor to the area of the subpixel is greater than or equal to 15 %. However, in analogous art, Lim et al. in Figs. 3, 5, 8 and [0089]-[0134] teaches a display device capable of reducing a leakage current that includes a first transistor, second transistor and a dummy (i.e. third) transistor and semiconductor layers which form the active areas of the transistors [0156]. Lim et al. does not expressly teach wherein in the top view, a proportion of a total area of the semiconductor layers of the first transistor to the third transistor to the area of the subpixel is greater than or equal to 15 %. Lim et al. teaches that when two gate electrodes are connected to each other having the same potential the channel length may be elongated which may increase the resistance and the leakage current may be reduced to secure the stability of an operation. This demonstrates that to achieve increased resistance and reduced leakage current the area of the channel (i.e. semiconductor layer) would be considered result effective variables. Accordingly, the claim is obvious without showing that the claimed range(s) achieve unexpected results relative to the prior art range. In re Woodruff, 16 USPQ2d 1935, 1937 (Fed. Cir. 1990). See also In re Huang, 40 USPQ2d 1685, 1688 (Fed. Cir. 1996) (claimed ranges of a result effective variable, which do not overlap the prior art ranges, are unpatentable unless they produce a new and unexpected result which is different in kind and not merely in degree from the results of the prior art). See also In re Boesch, 205 USPQ 215 (CCPA) (discovery of optimum value of result effective variable in known process is ordinarily within skill of art) and In re Aller, 105 USPQ 233 (CCPA 1955) (selection of optimum ranges within prior art general conditions is obvious). Therefore, one of ordinary skill in the art, before the effective filing date of the claimed invention, would recognize that it would be obvious to adjust the area of the semiconductor layers in order “to reduce leakage current and improve the device performance” thereof and optimize “a proportion of a total area of the semiconductor layers of the first transistor to the third transistor to the area of the subpixel is greater than or equal to 15 %” as “result effective variables”, and arrives at the recited limitation. Therefore, it would have been obvious to one having ordinary skill in the art before the effective filing date of the claimed invention to incorporate the teachings of Lim et al. in the semiconductor device of Kubota et al. for the purpose of reducing leakage current. Regarding claim 3, Kubota et al. in Figs. 1, 11-13 and [0006]-[0091] discloses a semiconductor device 10 comprising: a display portion 100, Fig. 2, wherein the display portion comprises a plurality of subpixels, wherein each of the plurality of subpixels comprises a first transistor 42P, a second transistor 34P, a first capacitor 44, a second capacitor 411, a third capacitor 412, a first insulating layer 180, and a wiring 184, Figs. 11-13, wherein the first transistor 42P is electrically connected to the second transistor 34P, the first capacitor 44, the second capacitor 411, and the third capacitor 412, wherein each of the first capacitor to the third capacitor 44, 411, 412 comprises a first conductive layer 44(194), 411(411a), 412(412a), a second conductive layer 44(195), 411(411b), 412(412b) and a second insulating layer 44(190), 411(190), 412(210) sandwiched between the first conductive layer and the second conductive layer [0068]-[0071], wherein the first insulating layer 180 is provided over the first transistor 42P and the second transistor 34P, wherein the first conductive layers of the first capacitor to the third capacitor 44(194), 411(411a), 412(412a), and the wiring 184 are each provided over the first insulating layer 180. Kubota et al. does not expressly disclose wherein in a top view, a proportion of a total area of the first conductive layers of the first capacitor to the third capacitor and the wiring to an area of the subpixel is greater than or equal to 15 %, wherein an area of the first conductive layer of the second capacitor is greater than or equal to twice an area of the first conductive layer of the first capacitor, and wherein an area of the first conductive layer of the third capacitor is greater than or equal to twice the area of the first conductive layer of the first capacitor. Applicant has not disclosed that in a top view, a proportion of a total area of the first conductive layers of the first capacitor to the third capacitor and the wiring to an area of the subpixel is greater than or equal to 15 %, wherein an area of the first conductive layer of the second capacitor is greater than or equal to twice an area of the first conductive layer of the first capacitor, and wherein an area of the first conductive layer of the third capacitor is greater than or equal to twice the area of the first conductive layer of the first capacitor. However, Kubota et al. teaches in [0006], [0008], [0010], [0068]-[0070] and [0072] teaches that the arrangement of the capacitors in the electro-optical device viewed in a direction perpendicular to the first main surface achieve a large capacitance value with a small area. As a result, the ratio of the area of the pixel circuit to the substrate can be increased. This demonstrates that to achieve large capacitance the area of the conductive layers of the capacitors and the wiring would be considered result effective variables. Accordingly, the claim is obvious without showing that the claimed range(s) achieve unexpected results relative to the prior art range. In re Woodruff, 16 USPQ2d 1935, 1937 (Fed. Cir. 1990). See also In re Huang, 40 USPQ2d 1685, 1688 (Fed. Cir. 1996) (claimed ranges of a result effective variable, which do not overlap the prior art ranges, are unpatentable unless they produce a new and unexpected result which is different in kind and not merely in degree from the results of the prior art). See also In re Boesch, 205 USPQ 215 (CCPA) (discovery of optimum value of result effective variable in known process is ordinarily within skill of art) and In re Aller, 105 USPQ 233 (CCPA 1955) (selection of optimum ranges within prior art general conditions is obvious). Therefore, one of ordinary skill in the art, before the effective filing date of the claimed invention, would recognize that it would be obvious to adjust the area of the capacitors and wiring in order “to increase the capacitance and improve the device performance” thereof and optimize “in a top view, a proportion of a total area of the first conductive layers of the first capacitor to the third capacitor and the wiring to an area of the subpixel is greater than or equal to 15 %, wherein an area of the first conductive layer of the second capacitor is greater than or equal to twice an area of the first conductive layer of the first capacitor, and wherein an area of the first conductive layer of the third capacitor is greater than or equal to twice the area of the first conductive layer of the first capacitor” as “result effective variables”, and arrives at the recited limitation. Kubota et al. does not expressly disclose a third transistor provided over the substrate and electrically floating, wherein each of the first transistor to the third transistor comprises a semiconductor layer, wherein the semiconductor layer of the third transistor comprises a region shared with the semiconductor layer of the first transistor, and wherein in the top view, a proportion of a total area of the semiconductor layers of the first transistor to the third transistor to the area of the subpixel is greater than or equal to 15 %. However, in analogous art, Lim et al. in Figs. 3, 5, 8 and [0089]-[0134] teaches a display device capable of reducing a leakage current that includes a first transistor, second transistor and a dummy (i.e. third) transistor and semiconductor layers which form the active areas of the transistors [0156]. Lim et al. further teaches a channel (i.e. semiconductor layer) of a transistor T3 comprising a region shared with the channel (i.e. semiconductor layer) of a transistor T3-1 creating an elongated channel length. Lim et al. does not expressly teach wherein in the top view, a proportion of a total area of the semiconductor layers of the first transistor to the third transistor to the area of the subpixel is greater than or equal to 15 %. Lim et al. teaches that when two gate electrodes are connected to each other having the same potential the channel length may be elongated which may increase the resistance and the leakage current may be reduced to secure the stability of an operation. This demonstrates that to achieve increased resistance and reduced leakage current the area of the channel (i.e. semiconductor layer) would be considered result effective variables. Accordingly, the claim is obvious without showing that the claimed range(s) achieve unexpected results relative to the prior art range. In re Woodruff, 16 USPQ2d 1935, 1937 (Fed. Cir. 1990). See also In re Huang, 40 USPQ2d 1685, 1688 (Fed. Cir. 1996) (claimed ranges of a result effective variable, which do not overlap the prior art ranges, are unpatentable unless they produce a new and unexpected result which is different in kind and not merely in degree from the results of the prior art). See also In re Boesch, 205 USPQ 215 (CCPA) (discovery of optimum value of result effective variable in known process is ordinarily within skill of art) and In re Aller, 105 USPQ 233 (CCPA 1955) (selection of optimum ranges within prior art general conditions is obvious). Therefore, one of ordinary skill in the art, before the effective filing date of the claimed invention, would recognize that it would be obvious to adjust the area of the semiconductor layers in order “to reduce leakage current and improve the device performance” thereof and optimize “a proportion of a total area of the semiconductor layers of the first transistor to the third transistor to the area of the subpixel is greater than or equal to 15 %” as “result effective variables”, and arrives at the recited limitation. Therefore, it would have been obvious to one having ordinary skill in the art before the effective filing date of the claimed invention to incorporate the teachings of Lim et al. in the semiconductor device of Kubota et al. for the purpose of reducing leakage current. Regarding claim 6, Kubota et al. in view of Lim et al. teaches the semiconductor device according to any one of claim 3. Kubota et al. teach the semiconductor device further comprising a light-emitting device, wherein one terminal of the light-emitting device is electrically connected to one of a source and a drain P3 of the first transistor 42P [0007]. Claim(s) 5 is/are rejected under 35 U.S.C. 103 as being unpatentable over Kubota et al. in view of Lim et al. as applied to claim 3 above, and further in view of Shin US 2018/0337288. Regarding claim 5, Kubota et al. in view of Lim et al. teaches the semiconductor device according to claim 3. Kubota et al. in [0019]-[0032] teaches a driving circuit but does not teach wherein the second transistor is a multi-channel transistor. Shin teaches in [0040]-[0155] a semiconductor device having improved driving performance and a high-resolution display device with improved display quality that includes a multi-channel transistor. Therefore, it would have been obvious to one having ordinary skill in the art before the effective filing date of the claimed invention to incorporate the teachings of Shin in the semiconductor device of Kubota et al. and Lim et al. for the purpose of improving the driving performance of the display and providing a high-resolution display device. Claim(s) 7 and 8 is/are rejected under 35 U.S.C. 103 as being unpatentable over Kubota et al. in view of Lim et al. as applied to claim 3 above, and further in view of Kamatani et al. US 2017/0263870. Regarding claims 7 and 8, Kubota et al. in view of Lim et al. teaches the semiconductor device according claim 3 but does not expressly teach wherein one or more of the semiconductor layer of the first transistor and the semiconductor layer of the second transistor comprise a metal oxide, wherein the metal oxide comprises one or more of indium and zinc. Kamatani et al. teaches in Fig. 1 and [0145] a display device 1 including an active layer 13 in transistors 18 comprising indium zinc oxide, a transparent conductive oxide known to offer excellent electrical conductivity and optical transparency. Therefore, it would have been obvious to one having ordinary skill in the art before the effective filing date of the claimed invention, to try IZO as the semiconductor layer of Kubota et al. and Lim et al., as the court has held that choosing from a finite number of identified, predictable solutions, with a reasonable expectation of success is prima facie obvious. KSR Int'l Co. v. Teleflex Inc., 550 U.S. 398, 415-421, 82 USPQ2d 1385, 1395-97 (2007). Furthermore, it has been held to be within the general skill of a worker in the art to select a known material on the basis of its suitability for the intended use as a matter of obvious design choice. In re Leshin, 125 USPQ 416 (CCPA 1960). Allowable Subject Matter Claims 4 and 9 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. The following is a statement of reasons for the indication of allowable subject matter: Regarding claim 4, The prior art neither anticipates nor renders obvious, in the context of the claims, wherein a gate of the first transistor is electrically connected to the other terminal of the first capacitor, wherein the other of the source and the drain of the first transistor is electrically connected to one of a source and a drain of the second transistor, one terminal of the second capacitor, and one terminal of the third capacitor, wherein a gate of the second transistor is electrically connected to the other terminal of the second capacitor, and wherein a back gate of the second transistor is electrically connected to the other terminal of the third capacitor. Regarding claim 9, The prior art neither anticipates nor renders obvious, in the context of the claims, wherein the second transistor comprises: a first conductor and a second conductor placed apart from each other over the semiconductor layer of the second transistor; a first insulator placed over the first conductor and the second conductor and having an opening formed between the first conductor and the second conductor; a third conductor placed in the opening of the first conductor; and a second insulator placed between the third conductor and the semiconductor layer, the first conductor, the second conductor, and the first insulator. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to SONYA D MCCALL-SHEPARD whose telephone number is (571)272-9801. The examiner can normally be reached M-F: 8:30 AM-5:00 PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Julio J. Maldonado can be reached at (571)272-1864. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /Sonya McCall-Shepard/ Primary Examiner, Art Unit 2898
Read full office action

Prosecution Timeline

Dec 27, 2023
Application Filed
Mar 06, 2026
Non-Final Rejection — §103 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12604719
SEMICONDUCTOR DEVICE HAVING A THROUGH-VIA STRUCTURE ELECTRICALLY CONNECTED TO A CONTACT STRUCTURE
2y 5m to grant Granted Apr 14, 2026
Patent 12604783
SEMICONDUCTOR DEVICE
2y 5m to grant Granted Apr 14, 2026
Patent 12604546
DEPTH SENSOR
2y 5m to grant Granted Apr 14, 2026
Patent 12598931
SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME
2y 5m to grant Granted Apr 07, 2026
Patent 12593494
MULTI-GATE DEVICE AND RELATED METHODS
2y 5m to grant Granted Mar 31, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

AI Strategy Recommendation

Get an AI-powered prosecution strategy using examiner precedents, rejection analysis, and claim mapping.
Powered by AI — typically takes 5-10 seconds

Prosecution Projections

1-2
Expected OA Rounds
93%
Grant Probability
97%
With Interview (+3.6%)
2y 3m
Median Time to Grant
Low
PTA Risk
Based on 1164 resolved cases by this examiner. Grant probability derived from career allow rate.

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month