Prosecution Insights
Last updated: July 17, 2026
Application No. 18/592,460

DATA AND POWER ISOLATION WITH DOUBLE ISOLATION BARRIER

Non-Final OA §102§103
Filed
Feb 29, 2024
Examiner
DIAZ, JOSE R
Art Unit
2815
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Texas Instruments Incorporated
OA Round
1 (Non-Final)
87%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
94%
With Interview

Examiner Intelligence

Grants 87% — above average
87%
Career Allowance Rate
820 granted / 946 resolved
+18.7% vs TC avg
Moderate +8% lift
Without
With
+7.8%
Interview Lift
resolved cases with interview
Typical timeline
2y 5m
Avg Prosecution
14 currently pending
Career history
968
Total Applications
across all art units

Statute-Specific Performance

§101
0.2%
-39.8% vs TC avg
§103
56.2%
+16.2% vs TC avg
§102
18.7%
-21.3% vs TC avg
§112
3.2%
-36.8% vs TC avg
Black line = Tech Center average estimate • Based on career data from 946 resolved cases

Office Action

§102 §103
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(2) the claimed invention was described in a patent issued under section 151, or in an application for patent published or deemed published under section 122(b), in which the patent or application, as the case may be, names another inventor and was effectively filed before the effective filing date of the claimed invention. Claims 15-19 are rejected under 35 U.S.C. 102(a)(2) as being anticipated by Cheng et al. (US 2024/0014126). Regarding claim 15, Cheng discloses a packaged integrated circuit including: a package substrate (RDL) including: pins (V4/60) [Fig. 4b, annotated below]; a first metal layer (RDL3) on the pins [Fig. 4b, annotated below]; a second metal layer (RDL2/RDL1) on the first metal layer [Fig. 4b, annotated below]; vias (V2/V1/V0) on the second metal layer [Fig. 4b, annotated below]; an insulation material (50) covering the pins, the first metal layer, the second metal layer, and the vias, and exposing surfaces of the pins (V4/60) and the vias (V0) [Fig. 4b, annotated below]; a semiconductor die (300/200) on the package substrate, the semiconductor die having a surface (Top surface) opposing the second metal layer [Fig. 4b, annotated below]; metal posts (Pad) coupled between the semiconductor die (300/200) and the exposed surfaces of the vias (V0) [Fig. 4b, annotated below]; and a mold compound (glass 40) covering the semiconductor die and the metal posts, in which the surface is separated from the second metal layer by the insulation material (50) and the mold compound (40) [Fig. 4b, annotated below, and paragraph 0068]. [AltContent: textbox (V0)][AltContent: arrow] PNG media_image1.png 226 580 media_image1.png Greyscale Regarding claim 16, Cheng discloses wherein the first metal layer (RDL3) has a first winding of a transformer (Ls), and wherein the second metal layer (RDL1) includes a second winding of the transformer (Lp) [Figs. 4a-4b]. Regarding claim 17, Cheng discloses: wherein the transformer is a first transformer (T1) [Fig. 4a. annotated below], wherein the package substrate includes a second transformer (T2) having a first winding (Ls) on the first metal layer and a second winding (Lp) on the second metal layer [Figs. 4a (annotated below) and Fig. 4b (annotated below)]. [AltContent: textbox (T2)][AltContent: arrow][AltContent: textbox (T1)][AltContent: arrow] PNG media_image2.png 398 484 media_image2.png Greyscale Regarding claim 18, Cheng discloses wherein portions of the first and second windings (Ls/Lp) of the second transformer (T2) are within footprints of the first and second windings of the first transformer (T1) [Fig. 4a, annotated above]. Regarding claim 19, Cheng discloses: wherein the semiconductor die (300/200) is a first semiconductor die (300), wherein the metal posts (Pad) are a first set of metal posts (Pad), wherein the vias (V0) are a first set of vias (V0) [Fig. 4b, annotated above], wherein the package integrated circuit includes a second semiconductor die (200) on the package substrate (RDL), the second semiconductor die (200) having a surface (Top surface) opposing the second metal layer (RDL2/RDL1) [Fig. 4b, annotated above], wherein the package substrate includes a second set of vias (V0) on the first metal layer (T3) [Fig. 4b, annotated above], wherein the package integrated circuit includes a second set of metal posts (Pad) coupled between the second semiconductor die (200) and exposed surface of the second set of vias [Fig. 4b, annotated above]. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 15 and 19 are rejected under 35 U.S.C. 103 as being unpatentable over Tang et al. (US 2022/0028593) in view of Cheng et al. (US 2024/0014126). Regarding claim 15, Tang discloses a packaged integrated circuit including: a package substrate (107) including: pins (V3/131/138) [Fig. 1A]; a first metal layer (T3) on the pins [Fig. 1A]; a second metal layer (T2) on the first metal layer [Fig. 1A]; vias (V2/V1) on the second metal layer [Fig. 1A and paragraph 0019]; an insulation material (501/901/1301) covering the pins, the first metal layer, the second metal layer, and the vias, and exposing surfaces of the pins a semiconductor die (102/106) on the package substrate, the semiconductor die having a surface (Top surface) opposing the second metal layer [Fig. 1A]; metal posts (116) coupled between the semiconductor die (116) a mold compound (120) covering the semiconductor die and the metal posts, in which the surface is separated from the second metal layer by the insulation material (901/1301) and the mold compound (120) [Fig. 1A]. PNG media_image3.png 302 975 media_image3.png Greyscale However, Tang does not teach exposing surfaces of the vias. Cheng teaches an insulation material (50) covering the first, second, and third metal layers (RDL3,RDL2,RDL1) and vias (V3,V1,V0), and exposing surfaces of the pins (V4/60) and the vias (V0) [Fig. 4b, rotated and annotated below]. In addition, Cheng teaches first and second dies (300/200) couple to exposed third vias (V0) [Fig. 4b, rotated and annotated below]. Therefore, one of ordinary skill in the art, before the effective filing date of the claimed invention, would have been motivated to modify Tang by including exposed third vias as taught by Cheng because it helps to improve power density [paragraph 0004]. Regarding claim 19, Tang discloses: wherein the semiconductor die (102/106) is a first semiconductor die (102), wherein the metal posts (116) are a first set of metal posts (116), wherein the vias are a first set of vias (V2/V1) [Fig. 1A], wherein the package integrated circuit includes a second semiconductor die (106) on the package substrate (107), the second semiconductor die (106) having a surface (Top surface) opposing the second metal layer (T2) [Fig. 1A], wherein the package substrate includes a second set of vias (V2/V1) on the first metal layer (T3) [Fig. 1A], wherein the package integrated circuit includes a second set of metal posts (116) coupled between the second semiconductor die (106) However, Tang does not teach exposing surfaces of the vias. Cheng, as stated above, teaches first and second dies (300/200) couple to exposed third vias (V0) [Fig. 4b, rotated and annotated above]. Therefore, one of ordinary skill in the art, before the effective filing date of the claimed invention, would have been motivated to modify Tang by including exposed third vias as taught by Cheng because it helps to improve power density [paragraph 0004]. Allowable Subject Matter Claims 1-14 and 20-24 are allowed. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. Bertoni et al. (US 2025/0201792) is related to the current application and teaches a packaged integrated circuit (400) in Figure 4. Correspondence Any inquiry concerning this communication or earlier communications from the examiner should be directed to JOSE R DIAZ whose telephone number is (571)272-1727. The examiner can normally be reached Monday-Friday. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Joshua Benitez can be reached at 571-270-1435. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /Jose R Diaz/Primary Examiner, Art Unit 2815
Read full office action

Prosecution Timeline

Feb 29, 2024
Application Filed
Jun 17, 2026
Non-Final Rejection mailed — §102, §103 (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
87%
Grant Probability
94%
With Interview (+7.8%)
2y 5m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 946 resolved cases by this examiner. Grant probability derived from career allowance rate.

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