Prosecution Insights
Last updated: July 17, 2026
Application No. 18/601,053

ARRAY SUBSTRATE AND DISPLAY PANEL

Non-Final OA §102
Filed
Mar 11, 2024
Priority
Jun 28, 2023 — CN 202310786823.0
Examiner
OH, JAEHWAN
Art Unit
2899
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Hubei Yangtze Industrial Innovation Center Of Advanced Display Co., Ltd.
OA Round
1 (Non-Final)
85%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
95%
With Interview

Examiner Intelligence

Grants 85% — above average
85%
Career Allowance Rate
568 granted / 669 resolved
+16.9% vs TC avg
Moderate +10% lift
Without
With
+10.2%
Interview Lift
resolved cases with interview
Fast prosecutor
2y 2m
Avg Prosecution
18 currently pending
Career history
687
Total Applications
across all art units

Statute-Specific Performance

§101
0.9%
-39.1% vs TC avg
§103
68.3%
+28.3% vs TC avg
§102
19.3%
-20.7% vs TC avg
§112
3.0%
-37.0% vs TC avg
Black line = Tech Center average estimate • Based on career data from 669 resolved cases

Office Action

§102
The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . DETAILED ACTION Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale or otherwise available to the public before the effective filing date of the claimed invention. (a)(2) the claimed invention was described in a patent issued under section 151, or in an application for patent published or deemed published under section 122(b), in which the patent or application, as the case may be, names another inventor and was effectively filed before the effective filing date of the claimed invention. Claims 1-2, 13-15, 18-20 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Wang (U.S. Patent Application Publication 2024/0046861, hereinafter referred to as Wang). As to claim 1, Wang teaches 1. An array substrate, comprising a substrate, a semiconductor layer over the substrate, a gate over a side of the semiconductor layer away from the substrate, and a source and a drain on sides of the gate, wherein the semiconductor layer comprises a channel region, a first doping region, and a first ohmic contact region, which are sequentially connected; and a shielding layer between the substrate and the semiconductor layer, wherein the shielding layer is connected to a fixed potential, and the shielding layer at least partially overlaps with the first doping region in a direction perpendicular to a plane of the substrate. [see 20, 51 in Fig. 3A for example; ¶0085] As to claim 2, Wang teaches 2. The array substrate according to claim 1, wherein a first junction is a junction of the first doping region and the channel region, a second junction is a junction of the first doping region and the first ohmic contact region, and the shielding layer cover the first junction and/or second junction in the direction perpendicular to the plane of the substrate. [see 211, 212, 213, and 51 in Fig. 3A for example; ¶0085] As to claim 13, Wang teaches 13. The array substrate according to claim 1, wherein the first ohmic contact region is electrically connected to the drain. [see 23, 211 in Fig3B] As to claim 14, Wang teaches 14. The array substrate according to claim 1, wherein the semiconductor layer further comprises a second doping region and a second ohmic contact region over a side of the channel away from the first doping region, and the second ohmic contact region is electrically connected to the source. [see 23, 212 in Fig3B] As to claim 15, Wang teaches 15. The array substrate according to claim 14, wherein along the direction from the channel region to the first ohmic contact region, a length of the first doping region is D1, and along the direction from the second ohmic contact region to the channel region, a length of the second doping region is D2, wherein D1>D2. [see 23, 211, 212 in Fig3B] As to claim 18, Wang teaches 18. The array substrate according to claim 1, wherein the array substrate comprises a plurality of first signal lines, the first signal line is on the same layer as the source and the drain, and the first signal line is electrically connected to the shielding layer. [¶0020] As to claim 19, Wang teaches 19. A display panel comprising: an array substrate, comprising: a substrate, a semiconductor layer over the substrate, a gate over a side of the semiconductor layer away from the substrate, and a source and a drain on sides of the gate, wherein the semiconductor layer comprises a channel region, a first doping region, and a first ohmic contact region, which are sequentially connected; and a shielding layer between the substrate and the semiconductor layer, wherein the shielding layer is connected to a fixed potential, and the shielding layer at least partially overlaps with the first doping region in a direction perpendicular to a plane of the substrate. [see 20, 51 in Fig. 3A for example; ¶0085] As to claim 20, Wang teaches 20. The display panel according to claim 19, wherein a first junction is a junction of the first doping region and the channel region, a second junction is a junction of the first doping region and the first ohmic contact region, and the shielding layer cover the first junction and/or second junction in the direction perpendicular to the plane of the substrate. [see 20, 51 in Fig. 3A for example; ¶0085] Allowable Subject Matter Claims 3-12, 16-17 objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Conclusion Claims 1-2, 13-15, 18-20 are rejected as explained above. The prior art made of record in the PTO-892 form and not relied upon is considered pertinent to applicant's disclosure. Any inquiry concerning this communication or earlier communications from the examiner should be directed to JAEHWAN OH whose telephone number is (571) 270-5800. The examiner can normally be reached on Monday - Friday 9:00 AM-5:00PM. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Brent Fairbanks can be reached on 408-918-7532. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of an application may be obtained from the Patent Application Information Retrieval (PAIR) system. Status information for published applications may be obtained from either Private PAIR or Public PAIR. Status information for unpublished applications is available through Private PAIR only. For more information about the PAIR system, see http://pair-direct.uspto.gov. Should you have questions on access to the Private PAIR system, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative or access to the automated information system, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /JAEHWAN OH/ Primary Examiner, Art Unit 2899
Read full office action

Prosecution Timeline

Mar 11, 2024
Application Filed
Jun 03, 2026
Non-Final Rejection mailed — §102 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
85%
Grant Probability
95%
With Interview (+10.2%)
2y 2m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 669 resolved cases by this examiner. Grant probability derived from career allowance rate.

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