Notice of Pre-AIA or AIA Status
The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA .
Claim Rejections - 35 USC § 112
The following is a quotation of 35 U.S.C. 112(b):
(b) CONCLUSION.-The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention.
The following is a quotation of 35 U.S.C. 112 (pre-AIA ), second paragraph:
The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention.
Claims 1-14 are rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention.
In claim 1, line 7, the phrase “the n-th film region” lacks proper antecedent basis. For the purpose of examination, the phrase “a n-th film region” is assumed.
In claim 1, lines 8-9, the phrase “the n-th collecting signal” lacks proper antecedent basis. For the purpose of examination, the phrase “a n-th collecting signal” is assumed.
Allowable Subject Matter
Claim 1 would be allowable if rewritten or amended to overcome the rejection(s) under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), 2nd paragraph, set forth in this Office action.
Claims 2-14 would be allowable if rewritten to overcome the rejection(s) under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), 2nd paragraph, set forth in this Office action and to include all of the limitations of the base claim and any intervening claims.
The following is a statement of reasons for the indication of allowable subject matter: Ofuji et al (US 2013/0328612A1) teaches (see Figs 12A and 12B and para [0119]) a radiation detection apparatus including switching element (112) having a conductive layer having N film regions (first and second conductive layers 304,306) on an insulating substrate 101 and signal lines (170). EP 0,590,524 A1 also teaches (see Figs 1 and 4) a defect detection apparatus having a signal generator (laser generating means 43 with scanning mechanism deflecting laser beam 47) and signal receiver (probes 48-55) detecting defect of thin films laminated on the substrate of electronic device with a multi-lamination layer of metal (see claim 1, Fig 1, column 4, line 38-column 5, line 4; column 6, lines 17-46), wherein defect is determined on the basis of scanning position of the laser beam (see Abstract). Lim et al (US 9,689,825) teaches (see claim 1 and Figs 6-7) a capacitive sensing device including dielectric layers, a power supply, the capacitive sensing device form a capacitor having measured capacitance based on dielectric layers including a defect and measured capacitance received by a processing device (602). However, none of Ofuji, EP’524, Lim et al, and other references cited in the ISP of PCT/CN2022/124617 teaches the specific configurations of the signal generator and receiver as claimed (see claim 1), wherein a signal generator configured to transmit a first electromagnetic signal to the conductive film; and a signal receiver comprising N collecting units, wherein a n-th film region corresponds to a n-th collecting unit, and the signal receiver is configured to obtain a n-th collecting signal from a second electromagnetic signal generated after the first electromagnetic signal undergoes actions of the conductive film, the insulating layer, and the metal layer; wherein n is a positive integer less than or equal to N; wherein the signal receiver is configured to use the n-th collecting signal to determine whether there is a predetermined defect in a region of the insulating layer covered by the n-th film region; and to use position information of the n-th film region to determine position information of the predetermined defect on the insulating layer.
Any inquiry concerning this communication or earlier communications from the examiner should be directed to YEWEBDAR T TADESSE whose telephone number is (571)272-1238. The examiner can normally be reached 7.00-3:30 PM.
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YEWEBDAR T. TADESSE
Primary Examiner
Art Unit 1717
/YEWEBDAR T TADESSE/