Prosecution Insights
Last updated: August 17, 2026
Application No. 18/609,991

INTEGRATED DEVICE WITH CONDUCTIVE PILLAR STRUCTURE FOR DIE INTERCONNECTION

Non-Final OA §102
Filed
Mar 19, 2024
Examiner
WRIGHT, TUCKER J
Art Unit
Tech Center
Assignee
Qualcomm Incorporated
OA Round
1 (Non-Final)
79%
Grant Probability
Favorable
1-2
OA Rounds
1m
Est. Remaining
90%
With Interview

Examiner Intelligence

Grants 79% — above average
79%
Career Allowance Rate
743 granted / 936 resolved
+19.4% vs TC avg
Moderate +11% lift
Without
With
+10.8%
Interview Lift
resolved cases with interview
Typical timeline
2y 6m
Avg Prosecution
26 currently pending
Career history
961
Total Applications
across all art units

Statute-Specific Performance

§101
0.3%
-39.7% vs TC avg
§103
47.0%
+7.0% vs TC avg
§102
33.3%
-6.7% vs TC avg
§112
16.7%
-23.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 936 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Election/Restrictions The 6/30/2026 "Reply" elects with traverse Invention I and identifies as reading on claims 1-13. In the restriction requirement Examiner has set forth why the restriction requirement is proper. Applicant contends that the Office action merely restates a structural feature already recited in claim 1 and as such has not shown that the product can be made my another and materially different process and that serious burden has not been shown. This argument is not persuasive. In the instant case the product as claimed can be made by another and materially different process such as a process that separates a set of metal layers from each other by a set of dielectric layers. Product claim 1 requires this and nothing in method claim 14 requires such a feature. As such, the Office action has shown the product as claimed can be made by another and materially different process. Further, there would be a serious search and/or examination burden if restriction were not required because at least the following reason(s) apply: the inventions require a different field of search (e.g., searching different classes/subclasses or electronic resources, or employing different search strategies or search queries). Accordingly, the restriction requirement is maintained and Examiner has withdrawn claims 14-20 from further consideration as being drawn to a non-elected invention. See, for example, 37 CFR § 1.142(b). Claim Rejections - 35 USC § 102 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1, 3, 6, 8-10, 12, and 13 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Ecton (US Pub. No. 2024/0079334). Regarding claim 1, in FIG. 2, Ecton discloses a device comprising: a substrate (201/204) including: a set of metal layers (236/224/236/244), separated from one another by a set of dielectric layers (222/207), the set of metal layers defining a first set of metal lines and a second set of metal lines; a first set of conductive pillars (256) configured to be electrically connected to a first die (208); a second set of conductive pillars (240) interconnecting the first set of metal lines to the first set of conductive pillars; a first set of pads (210) configured to be electrically connected to the first die; and a first set of conductive vias (232) interconnecting the second set of metal lines to the first set of pads; wherein the first set of conductive pillars extend from a surface of the substrate. Regarding claim 3, in FIG. 2, Ecton discloses a second set of pads (220) configured to be electrically coupled to a second die (216); a third set of conductive pillars (260) configured to be electrically connected to the second die; and a fourth set of conductive pillars (248) interconnecting the first set of metal lines to the third set of conductive pillars to interconnect the first die to the second die. Regarding claim 6, in FIG. 2, Ecton discloses that the first set of pads have first characteristic dimensions (e.g. width) and the first set of conductive pillars have second characteristic dimensions (e.g. width), and wherein the first characteristic dimensions are greater than the second characteristic dimensions. Regarding claim 8, in FIG. 2, Ecton discloses that a conductive pillar of the second set of conductive pillars (240) includes a conductive material extending from a lower line (e.g. 224) formed at a lower metal layer to an upper line (244) formed at an upper metal layer, wherein a dielectric layer (207) is between the lower metal layer and the upper metal layer, and wherein an interface between the upper line and the conductive material is below an upper surface (surface that faces 208) of the dielectric layer. Regarding claim 9, in FIG. 2, Ecton discloses that the first die corresponds to a first chiplet and the second die corresponds to a second chiplet (paragraph [0017]). Regarding claim 10, in FIGs. 2-3, Ecton discloses a device comprising: a first die (208) comprising first circuitry (integrated circuit, paragraph [0031]); a second die (216) comprising second circuitry (integrated circuit, paragraph [0031]); and a substrate (201/204) configured to electrically connect the first circuitry to the second circuitry and to electrically connect the first circuitry, the second circuitry, or both, to one or more off-package devices (paragraph [0040]), the substrate comprising: a set of metal layers (236/224/236/244), separated from one another by a set of dielectric layers (222/207), the set of metal layers defining a first set of metal lines and a second set of metal lines; a first set of conductive pillars (256) electrically connected to the first die; a first set of pads (210) electrically connected to the first die; a second set of conductive pillars (240) interconnecting the first set of metal lines to the first set of conductive pillars; a first set of conductive vias (232) interconnecting the second set of metal lines to the first set of pads; a third set of conductive pillars (260) electrically connected to the second die; a second set of pads (220) electrically connected to the second die; a fourth set of conductive pillars (248) interconnecting the first set of metal lines to the third set of conductive pillars to interconnect the first die to the second die; and a second set of conductive vias (rightmost 232s) interconnecting the second set of metal lines to the second set of pads; wherein the first set of conductive pillars and the third set of conductive pillars extend from a surface of the substrate. Regarding claim 12, in FIGs. 2-3, Ecton discloses that the first set of pads (210) have first characteristic dimensions (e.g. width) and the first set of conductive pillars (256) have second characteristic dimensions (e.g. width), and wherein the first characteristic dimensions are greater than the second characteristic dimensions. Regarding claim 13, in FIGs. 2-3, Ecton discloses that the first die corresponds to a first chiplet and the second die corresponds to a second chiplet (paragraph [0017]). Allowable Subject Matter Claims 2, 4-5, 7, and 11 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. The following is a statement of reasons for the indication of allowable subject matter: Regarding claim 2, the prior art failed to disclose or reasonably suggest the claimed device particularly characterized by a smallest distance between pillars of the first set of conductive pillars is smaller than a smallest distance between pads of the first set of pads. Regarding claim 4, the prior art failed to disclose or reasonably suggest the claimed device particularly characterized by multiple metal lines of the first set of metal lines are between the first pillar and the second pillar. Regarding claim 5, the prior art failed to disclose or reasonably suggest the claimed device particularly characterized by a first pitch of the first set of pads is greater than 90 micrometers, and wherein a second pitch of the first set of conductive pillars is less than 80 micrometers, in combination with the features of claim 1. Regarding claim 7, the prior art failed to disclose or reasonably suggest the claimed device particularly characterized by the second set of conductive pillars have a first characteristic horizonal dimension and the first set of conductive vias have a second characteristic horizonal dimension, and wherein the first characteristic horizonal dimension is smaller than the second characteristic horizonal dimension, in combination with the features of claim 1. Regarding claim 11, the prior art failed to disclose or reasonably suggest the claimed device particularly characterized by multiple metal lines of the first set of metal lines are between the first pillar and the second pillar. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to TUCKER J WRIGHT whose telephone number is (571)270-3234. The examiner can normally be reached 8:30am-5:00pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Matthew Landau can be reached at 571-272-1731. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /TUCKER J WRIGHT/ Primary Examiner, Art Unit 2891
Read full office action

Prosecution Timeline

Mar 19, 2024
Application Filed
Mar 25, 2025
Response after Non-Final Action
Jul 27, 2026
Non-Final Rejection mailed — §102 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12701691
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
3y 8m to grant Granted Aug 04, 2026
Patent 12701811
PHOTOELECTRIC CONVERSION DEVICE
3y 1m to grant Granted Aug 04, 2026
Patent 12696563
IMAGE SENSOR
2y 11m to grant Granted Jul 28, 2026
Patent 12696752
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
2y 6m to grant Granted Jul 28, 2026
Patent 12690288
IMAGING ELEMENT AND IMAGING DEVICE
2y 10m to grant Granted Jul 21, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

Strategy Recommendation AI-generated — please review before filing

Get a prosecution strategy drawn from examiner precedents, rejection analysis, and claim mapping.
Typically takes 5-10 seconds — AI-generated, attorney review required before filing

Prosecution Projections

1-2
Expected OA Rounds
79%
Grant Probability
90%
With Interview (+10.8%)
2y 6m (~1m remaining)
Median Time to Grant
Low
PTA Risk
Based on 936 resolved cases by this examiner. Grant probability derived from career allowance rate.

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month