Tech Center 2800 • Art Units: 2891 2896
This examiner grants 79% of resolved cases
Tucker J. Wright is an examiner in Art Unit 2891 within Tech Center 2800. He has resolved 947 cases, achieving an allowance rate of 79.4%. This rate indicates a generally receptive stance toward patentability for applications in this unit. The median days to allowance is 915, which is a standard duration for the examination of electronic or physical technologies. Practitioners can use these figures to set realistic expectations for their clients.
With an interview lift of 10.8%, there is a modest benefit to speaking directly with the examiner. While the 79.4% allowance rate is already high, the lift can help resolve specific sticking points in the prosecution. The high volume of 947 resolved cases suggests a well-established pattern of practice that applicants can rely on for consistency. The 915 days to allowance indicates that the examiner maintains a steady workflow. Overall, the data points to a favorable environment where both written and oral advocacy contribute to successful outcomes.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18624328 | SEMICONDUCTOR PACKAGE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR PACKAGE | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18611146 | INTEGRATED CIRCUIT DEVICE AND METHOD OF MANUFACTURING THE SAME | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18400792 | DEVICE FOR ELECTROSTATIC DISCHARGE PROTECTION USING SILICON CONTROLLED RECTIFIER | Final Rejection | SAMSUNG ELECTRONICS CO., LTD. |
| 18609991 | INTEGRATED DEVICE WITH CONDUCTIVE PILLAR STRUCTURE FOR DIE INTERCONNECTION | Non-Final OA | QUALCOMM Incorporated |
| 18191242 | ON-PACKAGE EMBEDDED COOLING DEVICE | Non-Final OA | Intel Corporation |
| 18532332 | QUANTUM DOT IMAGE SENSOR DEVICES AND METHODS OF MANUFACTURING THE SAME | Non-Final OA | Adeia Semiconductor Bonding Technologies Inc. |
| 18603087 | STAIRCASE STRUCTURES AND METHODS FOR FORMING THE SAME | Non-Final OA | Yangtze Memory Technologies Co., Ltd. |
| 18518789 | ELECTROSTATIC DISCHARGE PROTECTION DEVICE | Final Rejection | MEDIATEK INC. |
| 18652020 | CARBON, NITROGEN AND/OR FLUORINE CO-IMPLANTS FOR LOW RESISTANCE TRANSISTORS | Non-Final OA | Texas Instruments Incorporated |
| 18772307 | SEMICONDUCTOR STACK STRUCTURE AND MANUFACTURING METHOD THEREOF | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18602854 | STACKED TRANSISTORS AND METHOD OF FORMING THE SAME | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 18398951 | METHODS AND DEVICES THAT INCLUDE A GATE CONTACT THAT ABUTS A DIELECTRIC REGION THAT HAS A LOW-K DIELECTRIC | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18029105 | SEMICONDUCTOR DEVICE AND SEMICONDUCTOR MODULE | Non-Final OA | ROHM CO., LTD. |
| 18427206 | DEVICE WITH OUTER CONDUCTIVE SPACER | Non-Final OA | GlobalFoundries U.S. Inc. |
| 18005021 | POWER ELECTRONICS MODULE, ELECTRICAL SYSTEM HAVING SUCH A MODULE, CORRESPONDING MANUFACTURING METHODS | Final Rejection | VALEO EAUTOMOTIVE FRANCE SAS |
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