Prosecution Insights
Last updated: July 17, 2026
Application No. 18/617,449

INTEGRATED CIRCUIT DIE PAD CAVITY

Final Rejection §102
Filed
Mar 26, 2024
Priority
Jul 16, 2021 — divisional of 11/942,448
Examiner
ULLAH, ELIAS
Art Unit
2893
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Texas Instruments Incorporated
OA Round
2 (Final)
85%
Grant Probability
Favorable
3-4
OA Rounds
0m
Est. Remaining
93%
With Interview

Examiner Intelligence

Grants 85% — above average
85%
Career Allowance Rate
721 granted / 850 resolved
+16.8% vs TC avg
Moderate +8% lift
Without
With
+7.8%
Interview Lift
resolved cases with interview
Typical timeline
2y 4m
Avg Prosecution
21 currently pending
Career history
859
Total Applications
across all art units

Statute-Specific Performance

§101
0.1%
-39.9% vs TC avg
§103
48.0%
+8.0% vs TC avg
§102
48.2%
+8.2% vs TC avg
§112
1.3%
-38.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 850 resolved cases

Office Action

§102
DETAILED ACTION Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1-8 and 10-20 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Fusaro et al (Fusaro, Us 7,253,503). Regarding claim 1, Fusaro shows an integrated circuit (packaging device 55 in FIG. 5), comprising an electronic device (device 56 in FIG. 5) attached to the top surface of the electrically conductive die pad ( die pad 11 in FIG. 5); a metal layer (metal layer 64) on a first surface of the die pad (die pad 11); a wire bond (wire 24 as shown in FIG. 2) attached from the electronic device to the metal layer bottom surface of the cavity (see FIG. 2 with respect to FIG. 5); and a laminate layer ( layer 21) on the metal layer; and a mold compound (modeling 25) covering the laminate layer and encapsulating the electronic device (see FIG. 5). Regarding claim 2, Fusaro shows an integrated circuit (packaging device 55 in FIG. 5), comprising wherein the laminate layer (layer 21) further covers an end portion of the wire bond (wire 24) that is connected to the metal layer ( layer 64). Regarding claims 3-4, Fusaro shows an integrated circuit (packaging device 55 in FIG. 5), comprising wherein the layer comprises Ni/Pd (col. 3). Regarding claim 5, Fusaro shows an integrated circuit (packaging device 55 in FIG. 5), comprising wherein the wire bond is connected from the electronic device to the metal layer in a ground area of the die pad (see FIG. 2-5). Regarding claim 6, Fusaro shows an integrated circuit (packaging device 55 in FIG. 5), comprising wherein the laminate layer ( layer 2121) is comprised of at least one of polypropylene, polystyrene, polyester, vinyl, polyvinyl fluoride, vinyl chloride, methyl methacrylate, nylon, and polycarbonate (see FIG. 2-5). Regarding claim 7, Fusaro shows an integrated circuit (packaging device 55 in FIG. 5), comprising wherein the wire bond is connected from the electronic device to the metal layer in a ground area of the die pad (see FIG. 2-5). Regarding claim 8, Fusaro shows an integrated circuit (packaging device 55 in FIG. 5), comprising wherein further including a cavity having a bottom surface and sidewalls extending from the bottom surface of the cavity to the top surface of the die pad (see FIG. 2-5). Regarding claim 10, Fusaro shows an integrated circuit (packaging device 55 in FIG. 5), comprising further including an opening through the die pad (see FIG. 2-5). Regarding claim 11, Fusaro shows an integrated circuit (packaging device 55 in FIG. 5), comprising further mold compound further fills the opening such that the mold compound extends through the die pad to a second surface of the die pad. further including a metal plating layer on the top surface of the electrically conductive die pad and on the bottom surface of the cavity (see FIG.2-5). Regarding claim 12, Fusaro shows an integrated circuit (packaging device 55 in FIG. 5), comprising wherein the electronic device is an integrated circuit die and the die pad is electrically conductive (see FIG. 2-5). Regarding claim 13, Fusaro shows an integrated circuit (packaging device 55 in FIG. 5), comprising wherein the metal layer is a plated metal layer (see FIG. 2-3). Regarding claims 14 and 17, Fusaro shows an integrated circuit, comprising: a die pad; an electronic device attached to the die pad; a metal layer on a first surface of the die pad; a wire bond attached from the electronic device to the metal plating layer; channels or grooves cut into the metal layer and into the die pad; and a mold compound encapsulating the electronic device and extending into the channels or grooves (See FIG. 2-3). Regarding claim 15, Fusaro shows an integrated circuit, comprising, wherein the wire bond is connected from the electronic device to the metal layer in a ground area of the die pad (see FIG. 2-3). Regarding claim 16, Fusaro shows an integrated circuit, comprising, wherein the channels or grooves surround the ground area of the die pad (FIG. 2-5). Regarding claim 18, Fusaro shows an integrated circuit, comprising, wherein the laminate layer further covers an end portion of the wire bond that is connected to the metal layer (see FIG. 2-5). Regarding claim 19, Fusaro shows an integrated circuit further including an opening through the die pad (see FIG. 2-5). Regarding claim 20, Fusaro shows an integrated circuit wherein the mold compound further fills the opening such that the mold compound extends through the die pad to a second surface of the die pad (see FIG. 2-3). Allowable Subject Matter Claim 9 is objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Response to Arguments Applicant’s arguments with respect to claims 1-20 have been considered but are moot because the new ground of rejection does not rely on any reference applied in the prior rejection of record for any teaching or matter specifically challenged in the argument. Conclusion THIS ACTION IS MADE FINAL. Applicant is reminded of the extension of time policy as set forth in 37 CFR 1.136(a). A shortened statutory period for reply to this final action is set to expire THREE MONTHS from the mailing date of this action. In the event a first reply is filed within TWO MONTHS of the mailing date of this final action and the advisory action is not mailed until after the end of the THREE-MONTH shortened statutory period, then the shortened statutory period will expire on the date the advisory action is mailed, and any nonprovisional extension fee (37 CFR 1.17(a)) pursuant to 37 CFR 1.136(a) will be calculated from the mailing date of the advisory action. In no event, however, will the statutory period for reply expire later than SIX MONTHS from the mailing date of this final action. Any inquiry concerning this communication or earlier communications from the examiner should be directed to ELIAS M ULLAH whose telephone number is (571)272-1415. The examiner can normally be reached M-F at 8AM-5PM EST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Yara Green can be reached at 571-270-3035. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /ELIAS ULLAH/Primary Examiner, Art Unit 2893
Read full office action

Prosecution Timeline

Mar 26, 2024
Application Filed
Oct 23, 2024
Non-Final Rejection mailed — §102
Jun 23, 2025
Response after Non-Final Action
Jun 25, 2025
Response Filed
May 15, 2026
Final Rejection mailed — §102 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12667017
LIGHT EMITTING DEVICE MODULE AND DISPLAY APPARATUS HAVING THE SAME
2y 11m to grant Granted Jun 23, 2026
Patent 12666630
SEMICONDUCTOR DEVICE
2y 10m to grant Granted Jun 23, 2026
Patent 12667025
SEMICONDUCTOR MEMORY DEVICE
2y 1m to grant Granted Jun 23, 2026
Patent 12660722
POWER MODULE PACKAGE WITH MOLDED VIA AND DUAL SIDE PRESS-FIT PIN
3y 7m to grant Granted Jun 16, 2026
Patent 12660208
STORAGE WAFER AND MANUFACTURING METHOD OF STORAGE WAFER
3y 3m to grant Granted Jun 16, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

Strategy Recommendation AI-generated — please review before filing

Get a prosecution strategy drawn from examiner precedents, rejection analysis, and claim mapping.
Typically takes 5-10 seconds — AI-generated, attorney review required before filing

Prosecution Projections

3-4
Expected OA Rounds
85%
Grant Probability
93%
With Interview (+7.8%)
2y 4m (~0m remaining)
Median Time to Grant
Moderate
PTA Risk
Based on 850 resolved cases by this examiner. Grant probability derived from career allowance rate.

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month