Prosecution Insights
Last updated: October 02, 2026
Application No. 18/617,964

SEMICONDUCTOR PACKAGE

Non-Final OA §102§103
Filed
Mar 27, 2024
Priority
Jun 13, 2023 — RE 10-2023-0075623 +1 more
Examiner
PHAM, LONG
Art Unit
Tech Center
Assignee
Samsung Electronics Co., Ltd.
OA Round
1 (Non-Final)
92%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
97%
With Interview

Examiner Intelligence

Grants 92% — above average
92%
Career Allowance Rate
1530 granted / 1671 resolved
+31.6% vs TC avg
Moderate +6% lift
Without
With
+5.5%
Interview Lift
resolved cases with interview
Typical timeline
2y 4m
Avg Prosecution
40 currently pending
Career history
1697
Total Applications
across all art units

Statute-Specific Performance

§101
0.1%
-39.9% vs TC avg
§103
42.7%
+2.7% vs TC avg
§102
39.7%
-0.3% vs TC avg
§112
10.3%
-29.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1671 resolved cases

Office Action

§102 §103
CTNF 18/617,964 CTNF 69602 DETAILED ACTION Notice of Pre-AIA or AIA Status 07-03-aia AIA 15-10-aia The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA. Claim Rejections - 35 USC § 102 07-07-aia AIA 07-07 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – 07-08-aia AIA (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. 07-15-aia AIA Claim(s) 1-5, 8, 11, and 16 is/are rejected under 35 U.S.C. 102 (a)(1) as being anticipated by Yu et al. (US pub 20140167254) . With respect to claim 1, Yu et al. teach a semiconductor package comprising (see figs. 1-9, particularly figs. 1 and 4 and associated text): a printed circuit board 200A comprising a first pad portion (lower or bottom portion of 208A); a semiconductor chip 10 that is mounted on the printed circuit board and comprises a second pad portion 28A; a coupling part 302 that is between the first pad portion and the second pad portion; and a spacer (upper or top portion of 208A) that is between the coupling part and the first pad portion, wherein the first pad portion and the second pad portion are electrically coupled to each other through the coupling part and the spacer. With respect to claim 2, Yu et al. teach the first pad portion and the spacer comprise the same conductive material. See figs. 1 and 4 and associated text. With respect to claim 3, Yu et al. teach the first pad portion and the spacer comprise portions of a same layer. See figs. 1 and 4 and associated text. With respect to claim 4, Yu et al. teach the spacer protrudes from the first pad portion toward the semiconductor chip. See figs. 1 and 4 and associated text. With respect to claim 5, Yu et al. teach the semiconductor chip extends in a first direction (into page) and a second direction (lateral) different from the first direction, the coupling part and the spacer are included among a plurality of coupling parts (see fig. 1) and a plurality of spacers, respectively, that are arranged along a direction parallel with the first direction, and the plurality of coupling parts and the plurality of spacers are provided at a central region of the semiconductor chip in the second direction. See figs. 1 and 4 and associated text. With respect to claim 8, Yu et al. teach the semiconductor chip extends in a first direction (into the page) and a second direction (lateral) different from the first direction, the coupling part and the spacer are included among a plurality of coupling parts and a plurality of spacers (see fig. 1), respectively, that are arranged along a direction parallel with the first direction, and the plurality of coupling parts and the plurality of spacers are adjacent to an edge of the semiconductor chip in the second direction. See figs. 1 and 4 and associated text. With respect to claim 11, Yu et al. teach the printed circuit board further comprises a passivation layer 206, the first pad portion is exposed by the passivation layer, and the spacer protrudes away from a surface of the passivation layer toward the semiconductor chip. See figs. 1 and 4 and associated text. With respect to claim 16, Yu et al. teach the printed circuit board further comprises a passivation layer 206, the first pad portion is exposed by the passivation layer, and the spacer protrudes away from a surface of the passivation layer toward the semiconductor chip. See figs. 1 and 4 and associated text . Claim Rejections - 35 USC § 103 07-20-aia AIA The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. 07-21-aia AIA Claim (s) 6, 7, 9, 10, 12, 14, 15, and 19-20 is/are rejected under 35 U.S.C. 103 as being unpatentable over Yu et al. (US pub 20140167254) . With respect to claims 6, 7, 9, 10, 12, 14, 15, and 19-20, Yu et al. fail to teach the ranges for the spacer thicknesses and coupling part thicknesses. However, it would have been obvious to one of ordinary skill in the art of making semiconductor devices to determine the workable or optimal values or ranges for the spacer thicknesses and coupling part thicknesses through routine experimentation and optimization to obtain optimal or desired device performance because there is no evidence indicating that claimed ranges critical or produce any unexpected results and it has been held that it is not inventive to discover the optimum or workable ranges of a result-effective variable within given prior art conditions by routine experimentation. See MPEP 2144.05. With respect to claims 12 and 17, Yu et al. fail to teach the ranges for the first pad portion thicknesses and the passivation layer thicknesses. However, it would have been obvious to one of ordinary skill in the art of making semiconductor devices to determine the workable or optimal values or ranges for the first pad portion thicknesses and the passivation layer thicknesses through routine experimentation and optimization to obtain optimal or desired device performance because there is no evidence indicating that claimed ranges critical or produce any unexpected results and it has been held that it is not inventive to discover the optimum or workable ranges of a result-effective variable within given prior art conditions by routine experimentation. See MPEP 2144.05. With respect to claims 13 and 18, Yu et al. fail to teach the passivation layer includes a resin. However, the use of dielectric or resin as passivation material is well-known in semiconductor art. Examiner’s Cited References The cited references generally show the similar or related structure having a board having a first pad and a chip having a second pad, having a coupling part and a spacer between the first and second pads as presently claimed by applicant. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to LONG PHAM whose telephone number is (571)272-1714. The examiner can normally be reached Mon-Friday. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Jacob Choi can be reached at 469-295-9060. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. LONG . PHAM Examiner Art Unit 2823 /LONG PHAM/Primary Examiner, Art Unit 2897 Application/Control Number: 18/617,964 Page 2 Art Unit: 2897 Application/Control Number: 18/617,964 Page 3 Art Unit: 2897 Application/Control Number: 18/617,964 Page 4 Art Unit: 2897 Application/Control Number: 18/617,964 Page 5 Art Unit: 2897 Application/Control Number: 18/617,964 Page 6 Art Unit: 2897
Read full office action

Prosecution Timeline

Mar 27, 2024
Application Filed
May 07, 2026
Non-Final Rejection mailed — §102, §103
May 29, 2026
Interview Requested
Jun 10, 2026
Examiner Interview Summary
Jun 10, 2026
Applicant Interview (Telephonic)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12751320
CHIP-ON-WAFER-ON-BOARD STRUCTURE USING SPACER DIE AND METHODS OF FORMING THE SAME
4y 3m to grant Granted Sep 29, 2026
Patent 12745645
Integrated Circuit Packages and Methods of Forming the Same
3y 8m to grant Granted Sep 22, 2026
Patent 12745684
SEMICONDUCTOR PACKAGE AND METHOD OF MANUFACTURING THE SAME
3y 6m to grant Granted Sep 22, 2026
Patent 12740475
SILICON NITRIDE LINER FOR PROMOTION OF MOLD ADHESION IN INTEGRATED CIRCUITS
5y 0m to grant Granted Sep 15, 2026
Patent 12738918
DIE PACKAGE WITH SEALED DIE ENCLOSURES
4y 0m to grant Granted Sep 15, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
92%
Grant Probability
97%
With Interview (+5.5%)
2y 4m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1671 resolved cases by this examiner. Grant probability derived from career allowance rate.

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