Prosecution Insights
Last updated: October 02, 2026
Application No. 18/622,788

PHOTOELECTRIC DETECTOR, DETECTION SUBSTRATE AND MANUFACTURING METHOD THEREFOR, AND DETECTION APPARATUS

Non-Final OA §102
Filed
Mar 29, 2024
Priority
Dec 21, 2021 — continuation of PCTCN2021140244
Examiner
KEBEDE, BROOK
Art Unit
Tech Center
Assignee
BOE Technology Group Co., Ltd.
OA Round
1 (Non-Final)
89%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
93%
With Interview

Examiner Intelligence

Grants 89% — above average
89%
Career Allowance Rate
919 granted / 1035 resolved
+28.8% vs TC avg
Minimal +5% lift
Without
With
+4.6%
Interview Lift
resolved cases with interview
Fast prosecutor
2y 1m
Avg Prosecution
22 currently pending
Career history
1041
Total Applications
across all art units

Statute-Specific Performance

§101
2.2%
-37.8% vs TC avg
§103
35.8%
-4.2% vs TC avg
§102
30.3%
-9.7% vs TC avg
§112
12.1%
-27.9% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1035 resolved cases

Office Action

§102
DETAILED ACTION The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Election/Restrictions Applicant’s election without traverse of Group I, i.e., claims 1-16 and 20, in the reply filed on August 3, 2026 is acknowledged. Claims 17-19 are withdrawn from further consideration pursuant to 37 CFR 1.142(b) as being drawn to a nonelected invention, there being no allowable generic or linking claim. Election was made without traverse in the reply filed on August 3, 2026. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1-6, 10-12 and 20 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Du et al. (US 2021/0151615). PNG media_image1.png 620 793 media_image1.png Greyscale Re Claim 1, Du et al. disclose a photoelectric detector, comprising: a first electrode (13); a semiconductor layer (101) located on a side of the first electrode (13), wherein a Schottky junction is provided between the semiconductor layer (101) and the first electrode (i.e., the semiconductor layer 101 directly in contact with the first electrode 13 and Schottky junction is inherently formed) ; an intrinsic absorption layer (10, Paragraph [0073]) located on a side of the semiconductor layer (101) away from the first electrode (see Fig. 3); and a second electrode (10) being opposite to the first electrode, wherein the second electrode is adjacent to one of the intrinsic absorption layer (10) and the semiconductor layer (see Fig. 3 and related text in Paragraphs [0073]-[0074]).  Re Claim 2, as applied to claim 1 above, Du et al. disclose all the claimed limitations including wherein the second electrode(16) and the first electrode (13) are arranged in different layers and opposite to each other, and the second electrode (16) is arranged adjacent to the intrinsic absorption layer (see Fig. 3 and related text in Paragraphs [0073]-[0074]).  Re Claim 3, as applied to claim 1 above, Du et al. disclose all the claimed limitations including wherein the second electrode is arranged opposite to the first electrode in a same layer, the second electrode is arranged adjacent to the semiconductor layer, and the second electrode and the first electrode form an interdigitated electrode (see Fig. 3 and related text in Paragraphs [0073]-[0074]).  Re Claim 4, as applied to claim 3 above, Du et al. disclose all the claimed limitations including an active layer (14) disposed between the semiconductor layer and the intrinsic absorption layer. Re Claim 5, as applied to claim 4 above, Du et al. disclose all the claimed limitations including wherein an orthographic projection of the active layer on the first electrode, an orthographic projection of the semiconductor layer on the first electrode, and an orthographic projection of the intrinsic absorption layer on the first electrode are substantially coincident, and an area of the orthographic projection of the active layer on the first electrode is larger than an area of an interdigital region of the interdigitated electrode. Re Claim 6, as applied to claim 4 above, Du et al. disclose all the claimed limitations including wherein a material of the active layer is oxide (i.e., ITO, see Paragraph [0074]). Re Claim 10, as applied to claim 2 above, Du et al. disclose all the claimed limitations including wherein a material of the second electrode is a transparent conductive material (see Paragraph [0077]). Re Claim 11, as applied to claim 10 above, Du et al. disclose all the claimed limitations including wherein the transparent conductive material is indium tin oxide (see Paragraph [0077]). Re Claims 12 and 20, Du et al. disclose a detection apparatus and a detection substrate, comprising: a base substrate (12); a plurality of photoelectric detectors arranged in an array on the base substrate, wherein the photoelectric detectors are the photoelectric detector according toclaim 1 (see Figs. 3 and 4 and related text in Paragraphs [0073] 0 [0077]). Allowable Subject Matter Claims 7-9 and 13-16 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure ISHIDA et al. (US 2009/0267121) disclose a solid-state image pickup device that comprises substrate, transistor formed on the substrate and photoelectric conversion elements that include a first electrode and a second electrode stacked together. SHEN et al. (US 2009/0140123) disclose photoelectric conversion device that in ludes a first and second electrodes stacked and photoelectric conversion layer formed between the first and the second electrodes. Correspondence Any inquiry concerning this communication or earlier communications from the examiner should be directed to BROOK KEBEDE whose telephone number is 571-272-1862. The examiner can normally be reached Monday Friday 8:00 AM 5:00 PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Jeff Natalini can be reached at 571-272-2266. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /BROOK KEBEDE/ Primary Examiner, Art Unit 2894 /BK/ September 18, 2026
Read full office action

Prosecution Timeline

Mar 29, 2024
Application Filed
Sep 22, 2026
Non-Final Rejection mailed — §102 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
89%
Grant Probability
93%
With Interview (+4.6%)
2y 1m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1035 resolved cases by this examiner. Grant probability derived from career allowance rate.

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