Prosecution Insights
Last updated: April 19, 2026

Examiner: KEBEDE, BROOK

Tech Center 2800 • Art Units: 2818 2823 2894

This examiner grants 89% of resolved cases

Performance Statistics

88.7%
Allow Rate
+20.7% vs TC avg
1028
Total Applications
+4.3%
Interview Lift
845
Avg Prosecution Days
Based on 1000 resolved cases, 2023–2026

Rejection Statute Breakdown

1.6%
§101 Eligibility
31.0%
§102 Novelty
33.9%
§103 Obviousness
11.6%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18308453 INTEGRATED CIRCUIT DEVICE AND METHOD OF MANUFACTURING THE SAME Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
19351203 METHODS OF FABRICATING 3D SEMICONDUCTOR DEVICES AND STRUCTURES WITH METAL LAYERS AND MEMORY CELLS Non-Final OA Monolithic 3D Inc.
19351167 3D SEMICONDUCTOR DEVICES AND STRUCTURES WITH TRANSISTORS, METAL LAYERS, AND SINGLE CRYSTAL TRANSISTOR CHANNELS Non-Final OA Monolithic 3D Inc.
18283970 Display Substrate, Manufacturing Method Thereof, and Display Device Non-Final OA BOE Technology Group Co., Ltd.
18284068 POWER SEMICONDUCTOR DEVICE Non-Final OA Mitsubishi Electric Corporation
18325291 METHOD OF MANUFACTURING QUANTUM DOT-CONTAINING COMPLEX, QUANTUM DOT-CONTAINING COMPLEX MANUFACTURED THEREBY, LIGHT-EMITTING DEVICE INCLUDING QUANTUM DOT-CONTAINING COMPLEX AND ELECTRONIC APPARATUS INCLUDING QUANTUM DOT-CONTAINING COMPLEX Non-Final OA Samsung Display Co., Ltd.
18554660 DISPLAY DEVICE AND ELECTRONIC DEVICE Non-Final OA SONY SEMICONDUCTOR SOLUTIONS CORPORATION
18533185 TRANSPARENT DISPLAY APPARATUS Non-Final OA AUO Corporation
18037638 OXIDE SEMICONDUCTOR HAVING OHMIC JUNCTION STRUCTURE, THIN-FILM TRANSISTOR HAVING SAME, AND MANUFACTURING METHODS THEREFOR Non-Final OA IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY)
18283897 POWER SEMICONDUCTOR MODULE COMPRISING SWITCH ELEMENTS AND DIODES Non-Final OA Hitachi Energy Ltd
18275908 SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD Non-Final OA Tokyo Electron Limited
18148687 METAL-ON-METAL DEPOSITION METHODS FOR FILLING A GAP FEATURE ON A SUBSTRATE SURFACE Non-Final OA ASM IP Holding B.V.
18147038 SYSTEMS AND METHODS FOR CLEANING AND TREATING A SURFACE OF A SUBSTRATE Non-Final OA ASM IP Holding B.V.
18041391 COMBINED SELF-FORMING BARRIER AND SEED LAYER BY ATOMIC LAYER DEPOSITION Non-Final OA Lam Research Corporation
18078561 METHOD OF MANUFACTURING A REDISTRIBUTION LAYER, REDISTRIBUTION LAYER, INTEGRATED CIRCUIT AND METHODS FOR ELECTRICALLY TESTING AND PROTECTING THE INTEGRATED CIRCUIT Non-Final OA STMicroelectronics S.r.l.
18006234 METHOD FOR PRODUCING A SOLAR CELL Final Rejection HANWHA Q CELLS GMBH
18283972 METHOD FOR MOUNTING AN ELECTRONIC COMPONENT ONTO A SUBSTRATE BY MEANS OF SINTERING Non-Final OA SAFRAN ELECTRONICS & DEFENSE
18554788 A diode radiation sensor Non-Final OA Fondazione Bruno Kessler

Facing This Examiner?

IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.

Build Your Strategy

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month