Prosecution Insights
Last updated: May 29, 2026
Application No. 18/627,120

METHOD OF MEASURING DROPLET AND DROPLET MEASUREMENT SYSTEM

Non-Final OA §103
Filed
Apr 04, 2024
Priority
Jun 26, 2023 — RE 10-2023-0081548
Examiner
AKHAVANNIK, HADI
Art Unit
2676
Tech Center
2600 — Communications
Assignee
Samsung Display Co., Ltd.
OA Round
1 (Non-Final)
86%
Grant Probability
Favorable
1-2
OA Rounds
6m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 86% — above average
86%
Career Allowance Rate
856 granted / 996 resolved
+23.9% vs TC avg
Moderate +13% lift
Without
With
+12.9%
Interview Lift
resolved cases with interview
Typical timeline
2y 8m
Avg Prosecution
21 currently pending
Career history
1026
Total Applications
across all art units

Statute-Specific Performance

§101
2.4%
-37.6% vs TC avg
§103
70.1%
+30.1% vs TC avg
§102
6.9%
-33.1% vs TC avg
§112
1.0%
-39.0% vs TC avg
Black line = Tech Center average estimate • Based on career data from 996 resolved cases

Office Action

§103
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Examiner Note’s The examiner believes that the claims are have a practical application of optical droplet metrology. Therefore a 101 rejection does not apply. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 1 and 16 are rejected under 35 U.S.C. 103 as being unpatentable over Hauf (200150373305) in view of Saylor (“A method for increasing depth of field during droplet imaging”). Regarding claim 1, Hauf teaches a method of measuring a droplet, the method comprising (see par. 23): discharging a droplet onto a substrate (par. 23, medium capable of receiving droplets); imaging the droplet with a measurement part spaced apart from the droplet in one direction (see figure 2 and pars. 42-43, camera); Saylor teaches measuring a distance between the droplet and the measurement part (see section 2, distance between sphere and camera); and correcting an area of the droplet (section III and IV, section III says that if zd is known and appropriate magnification can be applied. Section IV says the appropriate magnification ratio can be applied to the drop image size to provide accurate drop size measurements). It would have been obvious prior to the effective filing date of the invention to one of ordinary skill in the art to include in Hauf the magnification correction technique as taught by Saylor in order to improve accuracy based on distance. Regarding claim 16, see the rejection of claim 1. Claim(s) 2-3, 18 and 20 are rejected under 35 U.S.C. 103 as being unpatentable over Hauf (200150373305) in view of Saylor (“A method for increasing depth of field during droplet imaging”) in further view of Sasaki (20130308018). Regarding claim 2, Sasaki teaches wherein the measuring of the distance between the droplet and the measurement part includes: measuring a distance in which the droplet deviates from a focal position of the measurement part (see par. 43 and 47, measuring at a defocused state). It would have been obvious prior to the effective filing date of the invention to one of ordinary skill in the art to include in Hauf and Saylor the ability to measure distance when there is a deviation from a focal position as taught by Sasaki. The reason is to measure allow measurement from both focus position as taught by Saylor and an unfocused position taught by Sasaki. Regarding claim 3, see pars. 43-44 of Sasaki. Regarding claim 18, see the rejection of claim 3 Regarding claim 20, pars. 43 and 47 of Sasaki which teaches calculating how much out of focus it is. Allowable Subject Matter Claims 4-15, 17 and 19 objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. The limitation of determining of the grayscale change of the edge part of the first image of the droplet imaged by the measurement part, the grayscale change of the edge part of the first image is compared with a grayscale change of an edge part of a second image of the droplet imaged by the measurement part at the focal position. Other dependent claims depend upon claim 4 and are allowable because of its dependencies. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to HADI AKHAVANNIK whose telephone number is (571)272-8622. The examiner can normally be reached 9 AM - 5 PM Monday to Friday. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Henok Shiferaw can be reached at (571) 272-4637. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /HADI AKHAVANNIK/Primary Examiner, Art Unit 2676
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Prosecution Timeline

Apr 04, 2024
Application Filed
Feb 26, 2026
Non-Final Rejection mailed — §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
86%
Grant Probability
99%
With Interview (+12.9%)
2y 8m (~6m remaining)
Median Time to Grant
Low
PTA Risk
Based on 996 resolved cases by this examiner. Grant probability derived from career allowance rate.

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