Prosecution Insights
Last updated: October 02, 2026
Application No. 18/652,081

BOND WIRE INDUCTION APPARATUS

Non-Final OA §102
Filed
May 01, 2024
Priority
May 02, 2023 — provisional 63/463,431
Examiner
HA, NATHAN W
Art Unit
Tech Center
Assignee
Micron Technology Inc.
OA Round
1 (Non-Final)
91%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 91% — above average
91%
Career Allowance Rate
1078 granted / 1181 resolved
+31.3% vs TC avg
Moderate +8% lift
Without
With
+7.7%
Interview Lift
resolved cases with interview
Typical timeline
2y 2m
Avg Prosecution
17 currently pending
Career history
1193
Total Applications
across all art units

Statute-Specific Performance

§101
0.9%
-39.1% vs TC avg
§103
44.5%
+4.5% vs TC avg
§102
32.7%
-7.3% vs TC avg
§112
8.1%
-31.9% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1181 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Election/Restrictions Applicant's election with traverse of claims 1-14 in the reply filed on 7/28/26 is acknowledged. The traversal is on the ground(s) that the search and examination of the entire claims can be made without serious burden. The argument does not directly address the reason for the restriction as previously indicated, in two separate classification areas (see the previous office action.) Thus, this is not found persuasive. The requirement is still deemed proper and is therefore made FINAL. Claim Rejections - 35 USC § 102 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1-14 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Wang (US 2008/0079115.) In regard to claims 1 and 8, in figs. 5-13, Wang discloses an apparatus (semiconductor device), comprising: a memory package comprising a substrate 200 and a plurality of memory layers (layers above the substrate, fig. 11); a plurality of conductive nodes 964, for example, connected by a plurality of conductive traces 96 to form a first portion of an induction device, wherein the first portion of the inductive device comprises an inductive coil within at least two layers of the plurality of memory layers of the memory package, fig. 8; and a plurality of bond traces to couple a first portion of the plurality of conductive nodes to a second portion of the plurality of conductive nodes to form a second portion of the inductive device, fig. 8, wherein the second portion of the inductive device comprises an inductive bond wire at 1122/1124 in a physical area that is physically outside the memory package, fig. 12. Furthermore, the device as disclosed by Wang is capable of receiving signaling having a first voltage value associated therewith, and apply signaling having a second voltage value associated therewith to the controller. Regarding claims 2 and 11, wherein the plurality of bond traces each include a plurality of parallel bond traces. Fig. 8. Regarding claims 3 and 13, wherein the plurality of bond traces formed an arc above an aperture of the memory package. See figs. 8 and 9. Regarding claim 4, wherein the memory package includes a first portion along a first edge of the plurality of conductive nodes and a second portion along a second edge of the plurality of conductive nodes. Fig. 8. Regarding claim 5, wherein the first portion of the memory package separates a portion of the plurality of conductive traces from the plurality of bond traces. Figs. 5 and 8. Regarding claim 6, wherein the inductive coil is capable of generating a first quantity of induction and the inductive bond wire generates a second quantity of induction. Regarding claim 7, wherein the first quantity of induction and the second quantity of induction are capable of being utilized to form a DC/DC boost converter circuit. 8. (Original) A system, comprising: a controller resident on a memory device; and an induction apparatus resident on the memory device, the induction apparatus comprising: a first plurality of conductive nodes connected to a second plurality of conductive nodes by a plurality of conductive traces to form an inductive; a plurality of bond traces to couple the first plurality of conductive nodes to the second plurality of conductive nodes to form an inductive bond wire; and a memory package positioned between the plurality of conductive traces and the plurality of bond traces, wherein the induction apparatus is configured to: receive signaling having a first voltage value associated therewith, and apply signaling having a second voltage value associated therewith to the controller. Regarding claims 9 and 10, Wang further discloses the plurality of conductive traces are capable of generating a first inductance from the received signaling having the first voltage and the plurality of bond traces generate a second inductance from the received signaling having the first voltage. Regarding claim 12, wherein the memory package includes an aperture between a portion of the plurality of conductive traces and the plurality of bond traces. Figs. 5 and 8. Regarding claim 14, wherein a non-conductive material 244, for example, is positioned between the memory package and the plurality of bond traces. Figs. 8 and 11. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to NATHAN W HA whose telephone number is (571)272-1707. The examiner can normally be reached M-T: 8:00AM-6:00PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, WAEL FAHMY can be reached at (571)-272-1705. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /NATHAN W HA/Primary Examiner, Art Unit 2814
Read full office action

Prosecution Timeline

May 01, 2024
Application Filed
Sep 09, 2026
Non-Final Rejection mailed — §102 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
91%
Grant Probability
99%
With Interview (+7.7%)
2y 2m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1181 resolved cases by this examiner. Grant probability derived from career allowance rate.

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