Prosecution Insights
Last updated: July 17, 2026
Application No. 18/652,417

SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE MOUNTING BODY

Non-Final OA §102
Filed
May 01, 2024
Priority
Dec 14, 2021 — JP 2021-202614 +1 more
Examiner
ULLAH, ELIAS
Art Unit
Tech Center
Assignee
Rohm Co., Ltd.
OA Round
1 (Non-Final)
85%
Grant Probability
Favorable
1-2
OA Rounds
1m
Est. Remaining
93%
With Interview

Examiner Intelligence

Grants 85% — above average
85%
Career Allowance Rate
721 granted / 850 resolved
+24.8% vs TC avg
Moderate +8% lift
Without
With
+7.8%
Interview Lift
resolved cases with interview
Typical timeline
2y 4m
Avg Prosecution
21 currently pending
Career history
859
Total Applications
across all art units

Statute-Specific Performance

§101
0.1%
-39.9% vs TC avg
§103
48.0%
+8.0% vs TC avg
§102
48.2%
+8.2% vs TC avg
§112
1.3%
-38.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 850 resolved cases

Office Action

§102
DETAILED ACTION Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1-17 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Hirao et al. (Hirao, US 5,657,2023). Regarding claim 1, Hirao shows a semiconductor device ( device assembly 1 in FIG. 1) comprising: a semiconductor element ( see device connector 84/82 in FIG. 1); and a first terminal (terminal 63 in FIG. 1 with respect to FIG. 12) electrically connected to the semiconductor element ( by connector element 84/82), wherein the first terminal (terminal 63 in FIG. 1) includes a first portion ( terminal portion 63c in FIG. 12) at least a portion of which extends in a first direction and a second portion extending in the first direction (see FIG. 2 i.e. element 63c comprises x and y direction), and the second portion ( opposite of terminal portion 63c) overlaps with the first portion as viewed in a second direction orthogonal to the first direction (see terminal 63c in FIG. 12). Regarding claim 2, Hirao shows a semiconductor device ( device assembly 1 in FIG. 1) comprising, wherein the first terminal includes a third portion (terminal portion 63b) connecting the first portion and the second portion ( terminal portion 63c). Regarding claim 3, Hirao shows a semiconductor device ( device assembly 1 in FIG. 1) comprising, wherein the third portion ( terminal portion 63b) protrudes beyond the first portion and the second portion as viewed in the first direction (see FIG. 12). Regarding claim 4, Hirao shows a semiconductor device ( device assembly 1 in FIG. 1) comprising, wherein the second portion (terminal portion 63c) is spaced apart from the first portion ( both side of terminal 63c comprises space as shown in FIG. 12). Regarding claim 5, Hirao shows a semiconductor device ( device assembly 1 in FIG. 1) comprising, wherein the first terminal includes a fourth portion (terminal portion 63a/63d) located on a side opposite to the third portion in the first direction with respect to the second portion and connected to the second portion, and the fourth portion extends in the second direction toward a side opposite to the first portion (see FIG. 1 with respect to FIG. 12). Regarding claim 6, Hirao shows a semiconductor device ( device assembly 1 in FIG. 1) further comprising a sealing resin (silicon gel 16) covering a portion of the first terminal (terminal 63) and the semiconductor element, wherein the first portion extends from the sealing resin, and the second portion is spaced apart from the sealing resin (see FIG. 1 with respect to FIG. 12). Regarding claim 7, Hirao shows a semiconductor device ( device assembly 1 in FIG. 1) comprising, wherein the sealing resin ( silicon gal 16) overlaps with the first portion and the second portion (terminal portion 63c ) as viewed in the first direction (see FIG. 1 with respect to FIG. 12). Regarding claim 8, Hirao shows a semiconductor device ( device assembly 1 in FIG. 1) comprising, further comprising a second terminal (terminal 61 in FIG. 1) extending in the first direction and including a portion covered with the sealing resin (silicon gal 16), wherein the second terminal (terminal 61) is spaced apart from the first terminal (terminal 63) in a third direction orthogonal to the first direction and the second direction (see FIG. 1), the second terminal includes a first mounting portion extending from the sealing resin and a second mounting portion located on a side opposite to the sealing resin in the first direction with respect to the first mounting portion and connected to the first mounting portion, and a dimension of the second mounting portion in the third direction is smaller than a dimension of the first mounting portion in the third direction (see FIG. 1 with respect to FIG. 12). Regarding claim 9, Hirao shows a semiconductor device ( device assembly 1 in FIG. 1) comprising, wherein the first mounting portion overlaps with the first portion as viewed in the third direction (see FIG. 1 with respect to FIG. 12). Regarding claim 10, Hirao shows a semiconductor device ( device assembly 1 in FIG. 1) comprising, wherein the first mounting portion includes a first edge extending in the third direction to be connected to the second mounting portion, and the second portion lies on both sides of the first edge in the first direction(see FIG. 1 with respect to FIG. 12). Regarding claim 11, Hirao shows a semiconductor device ( device assembly 1 in FIG. 1) further comprising a die pad ( pad 84), wherein the semiconductor element is electrically bonded to the die pad (pad 84). Regarding claim 12, Hirao shows a semiconductor device ( device assembly 1 in FIG. 1) comprising, wherein the first terminal (terminal 63) is connected to the die pad (pad 84). Regarding claim 13, Hirao shows a semiconductor device ( device assembly 1 in FIG. 1) comprising, wherein the die pad (pad 84) includes a reverse surface facing opposite to the semiconductor element in the second direction, and the reverse surface is exposed from the sealing resin ( silicon gal 16). Regarding claim 14, Hirao shows a semiconductor device ( device assembly 1 in FIG. 1) comprising, wherein; a wiring board (I circuit board 52) including a substrate and a wiring (wiring 54) disposed on the substrate; and a bonding layer electrically bonding the wiring and the first terminal, wherein the substrate includes a through-hole adjacent to the wiring and extending in the first direction through the substrate, and a portion of the first portion and a portion of the second portion are accommodated in the through-hole (see FIG. 1). Regarding claim 15, Hirao shows a semiconductor device ( device assembly 1 in FIG. 1) comprising, wherein the through-hole is a slotted hole extending in the second direction (see FIG. 1). Regarding claim 16, Hirao shows a semiconductor device ( device assembly 1 in FIG. 1) comprising, wherein the first portion is located between the sealing resin and the second portion in the second direction (see FIG. 1). Regarding claim 17, Hirao shows a semiconductor device ( device assembly 1 in FIG. 1) further comprising a heat dissipating member (element 10 in FIG. 1), wherein the heat dissipating member is attached to the sealing resin (silicon gal 16). Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to ELIAS M ULLAH whose telephone number is (571)272-1415. The examiner can normally be reached M-F at 8AM-5PM EST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Yara Green can be reached at 571-270-3035. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /ELIAS ULLAH/Primary Examiner, Art Unit 2893
Read full office action

Prosecution Timeline

May 01, 2024
Application Filed
Jun 17, 2026
Non-Final Rejection mailed — §102 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12667017
LIGHT EMITTING DEVICE MODULE AND DISPLAY APPARATUS HAVING THE SAME
2y 11m to grant Granted Jun 23, 2026
Patent 12666630
SEMICONDUCTOR DEVICE
2y 10m to grant Granted Jun 23, 2026
Patent 12667025
SEMICONDUCTOR MEMORY DEVICE
2y 1m to grant Granted Jun 23, 2026
Patent 12660722
POWER MODULE PACKAGE WITH MOLDED VIA AND DUAL SIDE PRESS-FIT PIN
3y 7m to grant Granted Jun 16, 2026
Patent 12660208
STORAGE WAFER AND MANUFACTURING METHOD OF STORAGE WAFER
3y 3m to grant Granted Jun 16, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
85%
Grant Probability
93%
With Interview (+7.8%)
2y 4m (~1m remaining)
Median Time to Grant
Low
PTA Risk
Based on 850 resolved cases by this examiner. Grant probability derived from career allowance rate.

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