Prosecution Insights
Last updated: July 17, 2026
Application No. 18/652,836

SEMICONDUCTOR DEVICE

Non-Final OA §103
Filed
May 02, 2024
Priority
Nov 05, 2021 — JP 2021-181316 +1 more
Examiner
VALENZUELA, PATRICIA D
Art Unit
Tech Center
Assignee
Rohm Co., Ltd.
OA Round
1 (Non-Final)
90%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
92%
With Interview

Examiner Intelligence

Grants 90% — above average
90%
Career Allowance Rate
647 granted / 717 resolved
+30.2% vs TC avg
Minimal +2% lift
Without
With
+2.1%
Interview Lift
resolved cases with interview
Typical timeline
2y 2m
Avg Prosecution
63 currently pending
Career history
794
Total Applications
across all art units

Statute-Specific Performance

§101
0.3%
-39.7% vs TC avg
§103
86.7%
+46.7% vs TC avg
§102
4.8%
-35.2% vs TC avg
§112
1.8%
-38.2% vs TC avg
Black line = Tech Center average estimate • Based on career data from 717 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 1-20 is/are rejected under 35 U.S.C. 103 as being unpatentable over Mori(USPGPUB DOCUMENT: 2019/0371885, hereinafter Mori) in view of Aketa (USPGPUB DOCUMENT: 2020/0144209, hereinafter Aketa). Re claim 1 Mori discloses a semiconductor device comprising: a chip(2) that has a main surface; a main surface electrode(37/75/56/57) that is arranged on the main surface; and a sealing insulator(21) that covers the electrode, and that has a portion directly covering the main surface electrode(37/75/56/57) (since 21 overlays or overlies, this may be interpreted as covering). Mori does not disclose a semiconductor device comprising: a terminal electrode that is arranged on the main surface electrode(37/75/56/57) such as to expose a part of the main surface electrode(37/75/56/57); and a sealing insulator that covers a periphery of the terminal electrode such as to expose a part of the terminal electrode, and that has a portion directly covering the main surface electrode(37/75/56/57). Aketa disclose a semiconductor device comprising: a terminal electrode(43/45/47 of Aketa); and a sealing insulator(8 of Aketa) that covers a periphery of the terminal electrode such as to expose a part of the terminal electrode. It would have been obvious to one of ordinary skill in the art before the effective filling date of the invention to apply the teachings of Aketa to the teachings of Mori in order to have an electronic component and a semiconductor device with which downsizing and an improvement in heat dissipation [0007, Aketa]. In doing so, a terminal electrode(43/45/47 of Aketa) that is arranged on the main surface electrode(37/75/56/57) such as to expose a part of the main surface electrode(37/75/56/57); and a sealing insulator(8 of Aketa) that covers a periphery of the terminal electrode such as to expose a part of the terminal electrode, and that has a portion directly covering (since 8 of Aketa overlays or overlies, this may be interpreted as covering) the main surface electrode(37/75/56/57). Re claim 2 Mori and Aketa disclose the semiconductor device according to Claim 1, wherein the sealing insulator(8 of Aketa) includes resin[0068 of Aketa] and a plurality of fillers. Re claim 3 Mori and Aketa disclose the semiconductor device according to Claim 2, wherein the resin[0068 of Aketa] consists of a thermosetting resin[0068 of Aketa]. Re claim 4 Mori and Aketa disclose the semiconductor device according to Claim 1, wherein the terminal electrode(43/45/47 of Aketa) is thicker than the chip(2), and the sealing insulator(8 of Aketa) is thicker than the chip(2). Re claim 5 Mori and Aketa disclose the semiconductor device according to Claim 1, wherein the terminal electrode(43/45/47 of Aketa) exposes a corner portion of the main surface electrode(37/75/56/57), and the sealing insulator(8 of Aketa) directly covers the corner portion of the main surface electrode(37/75/56/57). Re claim 6 Mori and Aketa disclose the semiconductor device according to Claim 1, wherein the main surface electrode(37/75/56/57) has an electrode surface and an electrode side wall, the terminal electrode(43/45/47 of Aketa) exposes the electrode surface and the electrode side wall, and the sealing insulator(8 of Aketa) directly covers the electrode surface and the electrode side wall. Re claim 7 Mori and Aketa disclose the semiconductor device according to Claim 1, wherein the sealing insulator(8 of Aketa) has a portion in contact only with the main surface electrode(37/75/56/57) and the terminal electrode(43/45/47 of Aketa) on the main surface electrode(37/75/56/57). Re claim 8 Mori and Aketa disclose the semiconductor device according to Claim 1, wherein the terminal electrode(43/45/47 of Aketa) has a terminal surface, and the sealing insulator(8 of Aketa) has an insulating main surface that forms a single flat surface with the terminal surface. Re claim 9 Mori and Aketa disclose the semiconductor device according to Claim 1, wherein the chip(2) has a side surface, and the sealing insulator(8 of Aketa) has an insulating side wall that forms a single flat surface with the side surface. Re claim 10 Mori and Aketa disclose the semiconductor device according to Claim 1, wherein the chip(2) includes a monocrystal of a wide bandgap semiconductor. Re claim 11 Mori discloses a semiconductor device comprising: a chip(2) that has a main surface; a main surface electrode(37/75/56/57) that is arranged on the main surface; an insulating film(21) that has a single layered structure comprising an inorganic film or an organic film(Although Mori is silent as to what material the insulating film(21) may be, since the only two options are for a material to be either an organic material or alternatively a "non-organic" material, Mori satisfies the limitation), and that directly covers the main surface electrode(37/75/56/57) (since 21 overlays or overlies, this may be interpreted as covering) such as to expose a part of the main surface electrode(37/75/56/57); Mori does not disclose a terminal electrode that is arranged on the main surface electrode(37/75/56/57); and a sealing insulator that covers a periphery of the terminal electrode such as to expose a part of the terminal electrode, and that has a portion directly covering the insulating film. Aketa disclose a terminal electrode(43/45/47 of Aketa); and a sealing insulator(8 of Aketa) that covers a periphery of the terminal electrode. It would have been obvious to one of ordinary skill in the art before the effective filling date of the invention to apply the teachings of Aketa to the teachings of Mori in order to have an electronic component and a semiconductor device with which downsizing and an improvement in heat dissipation [0007, Aketa]. In doing so, a terminal electrode(43/45/47 of Aketa) that is arranged on the main surface electrode(37/75/56/57); and a sealing insulator(8 of Aketa) that covers a periphery of the terminal electrode such as to expose a part of the terminal electrode, and that has a portion directly covering the insulating film. Re claim 12 Mori and Aketa disclose the semiconductor device according to Claim 11, wherein the sealing insulator(8 of Aketa) includes resin[0068 of Aketa] and a plurality of fillers. Re claim 13 Mori and Aketa disclose the semiconductor device according to Claim 11, wherein the insulating film has a single layered structure comprising an oxide film, a nitride film, an oxynitride film, or a photosensitive resin[0068 of Aketa] film. Re claim 14 Mori and Aketa disclose the semiconductor device according to Claim 11, wherein the terminal electrode(43/45/47 of Aketa) is thicker than the chip(2), and the sealing insulator(8 of Aketa) is thicker than the chip(2). Re claim 15 Mori and Aketa disclose the semiconductor device according to Claim 11, wherein the insulating film directly covers at least a part of a corner portion of the main surface electrode(37/75/56/57), and the sealing insulator(8 of Aketa) covers at least a part of the corner portion of the main surface electrode(37/75/56/57) across the insulating film. Re claim 16 Mori and Aketa disclose the semiconductor device according to Claim 11, wherein the main surface electrode(37/75/56/57) has an electrode surface and an electrode side wall, the insulating film directly covers the electrode surface and the electrode side wall, and the sealing insulator(8 of Aketa) covers the electrode surface and the electrode side wall across the insulating film. Re claim 17 Mori and Aketa disclose the semiconductor device according to Claim 11, wherein the terminal electrode(43/45/47 of Aketa) has a portion that is positioned on the main surface electrode(37/75/56/57) and a portion that is positioned on the insulating film. Re claim 18 Mori and Aketa disclose the semiconductor device according to Claim 11, wherein the terminal electrode(43/45/47 of Aketa) has a terminal surface, and the sealing insulator(8 of Aketa) has an insulating main surface that forms a single flat surface with the terminal surface. Re claim 19 Mori and Aketa disclose the semiconductor device according to Claim 11, wherein the chip(2) has a side surface, and the sealing insulator(8 of Aketa) has an insulating side wall that forms a single flat surface with the side surface. Re claim 20 Mori and Aketa disclose the semiconductor device according to Claim 11, wherein the chip(2) includes a monocrystal of a wide bandgap semiconductor. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to PATRICIA D VALENZUELA whose telephone number is (571)272-9242. The examiner can normally be reached Monday-Friday 10am-6pm EST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, William Partridge can be reached at 571-270-1402. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /PATRICIA D VALENZUELA/Primary Examiner, Art Unit 2812
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Prosecution Timeline

May 02, 2024
Application Filed
Jun 17, 2026
Non-Final Rejection mailed — §103 (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
90%
Grant Probability
92%
With Interview (+2.1%)
2y 2m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 717 resolved cases by this examiner. Grant probability derived from career allowance rate.

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