Prosecution Insights
Last updated: August 17, 2026
Application No. 18/658,874

APPARATUSES AND METHODS FOR COUPLING A PLURALITY OF SEMICONDUCTOR DEVICES

Non-Final OA §102§103
Filed
May 08, 2024
Priority
Mar 03, 2020 — provisional 62/984,738 +2 more
Examiner
SUN, YU-HSI DAVID
Art Unit
2817
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Micron Technology Inc.
OA Round
1 (Non-Final)
77%
Grant Probability
Favorable
1-2
OA Rounds
4m
Est. Remaining
86%
With Interview

Examiner Intelligence

Grants 77% — above average
77%
Career Allowance Rate
673 granted / 871 resolved
+9.3% vs TC avg
Moderate +8% lift
Without
With
+8.5%
Interview Lift
resolved cases with interview
Typical timeline
2y 8m
Avg Prosecution
31 currently pending
Career history
892
Total Applications
across all art units

Statute-Specific Performance

§101
3.6%
-36.4% vs TC avg
§103
45.9%
+5.9% vs TC avg
§102
22.3%
-17.7% vs TC avg
§112
20.3%
-19.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 871 resolved cases

Office Action

§102 §103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1-7, 9, 11 and 12 are rejected under 35 U.S.C. 102 as being anticipated by SONG et al. (US PG Pub 2012/0080806, hereinafter Song). Regarding claim 1, figures 1 and 3 (partially reproduced below) of Song disclose an apparatus, comprising: a volatile memory (¶ 41); a first redistribution layer structure (a) coupled. to the volatile memory (¶ 54); a second redistribution layer structure (b) coupled to the volatile memory and coupled to the first redistribution layer structure at a same node; and a third redistribution layer structure (c) coupled in series with the first redistribution layer structure. PNG media_image1.png 399 272 media_image1.png Greyscale Regarding claim 2, figure 3 of Song discloses a plurality of bond pads (210) between the first redistribution layer structure (a) and the third redistribution layer structure (c). Regarding claim 3, figure 3 of Song discloses the plurality of bond pads (210) are located at an edge. Regarding claim 4, figures 1 and 3 of Song disclose a die pad (312) coupled to the volatile memory, wherein the volatile memory is coupled to the first redistribution layer structure and the second redistribution layer structure via the die pad (¶ 54). Regarding claim 5, figure 3 of Song discloses the volatile memory comprises a memory array (would be within the memory chips), and wherein the die pad (312, in the central area) is located in an area along a center region disposed between memory cell array areas of the memory array. Regarding claim 6, figure 3 of Song discloses a conductive signal line (132) coupled in series with the second redistribution layer structure (b). Regarding claim 7, figure 3 of Song discloses one or more bond pads (122) between the second redistribution layer structure (b) and the conductive signal line (132). Regarding claim 9, figure 3 of Song discloses the first redistribution layer structure (a) and the second redistribution layer structure (b) comprise respective first and second portions of a U-shaped structure. Regarding claim 11, figure 3 of Song discloses the plurality of bond pads (210) are exposed in an opening of a passivation layer (¶ 170). Regarding claim 12, figure 3 of Song discloses at least one of the first redistribution layer structure, the second redistribution layer structure, or the third redistribution layer structure is disposed in one or more insulating interlayers (170). Claims 1, 10, 13, 15, 16, 19 and 20 are rejected under 35 U.S.C. 102 as being anticipated by PARK (US PG Pub 2021/0217731, hereinafter Park). Regarding claim 1, figures 3 and 4 of Park disclose an apparatus, comprising: a volatile memory (bottom most chip of stack 200L, hereinafter chip1, ¶ 77); a first redistribution layer structure (within chip1 connected to pad 210) coupled. to the volatile memory; a second redistribution layer structure (within the second from the bottom chip of stack 200L, hereinafter chip2, connected to its pad 210) coupled to the volatile memory (chip1) and coupled to the first redistribution layer structure at a same node (pad 210 of chip1); and a third redistribution layer structure (within the third from the bottom chip of stack 200L, hereinafter chip3, connected to its pad 210) coupled in series with the first redistribution layer structure. Regarding claim 10, figures 3 and 4 of Park disclose second volatile memory (fourth from the bottom chip of stack 200L, hereinafter chip4) coupled to the third redistribution layer structure (of chip3); and a fourth redistribution layer (within chip4 connected to its pad 210) coupled to the second volatile memory and the third redistribution layer structure at a common node (pad 210 of chip3). Regarding claim 13, figures 3 and 4 of Park disclose a first memory device (second from the bottom chip of stack 200L, hereinafter chip2, ¶ 77); a second memory device (fourth from the bottom chip of stack 200L, hereinafter chip4); a first redistribution layer structure (within bottom most chip of stack 200L, hereinafter chip1 connected to pad 210) coupled to the first memory device at a first node (pad 210 of chip2); a second redistribution layer structure (within the third from the bottom chip of stack 200L, hereinafter chip3, connected to its pad 210) coupled to the first memory device at the first node (pad 210 of chip2); and a third redistribution layer structure (within chip2, connected to its pad 210) coupled to the second memory device at a second node (pad 210 of chip 4) and coupled in series with the second redistribution layer structure. Regarding claim 15, figures 3 and 4 of Park disclose a fourth redistribution layer structure (within chip4, connected to its pad 210) coupled to the second memory device (chip4) at the second node (pad 210 of chip4). Regarding claim 16, figure 3 of Park disclose a plurality of bond pads (210) located at an edge. Regarding claim 19, figures 3 and 4 of Park disclose a first die pad (210) coupled to the first memory device (chip2), wherein the first memory device is coupled to the first redistribution layer structure (within chip1) and the second redistribution layer structure (within chip3) via the first die pad; and a second die pad (210) coupled to the second memory device (chip4), wherein the second memory device is coupled to the third redistribution layer structure (within chip2) via the second die pad. Regarding claim 20, figure 3 of Park disclose the first die pad (210 in the central area) is located within a center region between memory cell array areas of the first memory device (chip2). Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim 8 is rejected under 35 U.S.C. 103 as being unpatentable over Song. Regarding claim 8, Song does not explicitly disclose a register clock driver circuit coupled to the conductive signal line. However, register clock driver circuits are well known in the art to be part of memory devices and it would have been obvious to include one coupled to the conductive signal line for form a functioning memory device. Claims 17 and 18 are rejected under 35 U.S.C. 103 as being unpatentable over Park in view of Lee et al. (US Pat 11,222,872, hereinafter Lee). Regarding claims 17 and 18, Park does not explicitly disclose the plurality of bond pads are exposed in an opening of a passivation layer, wherein at least one of the first redistribution layer structure, the second redistribution layer structure, or the third redistribution layer structure is disposed in one or more insulating interlayers. In the same field of endeavor, figure 1B of Lee discloses a redistribution structure includes a bond pad (123A) exposed in an opening of a passivation layer (125), wherein the redistribution layer structure is disposed in one or more insulating interlayers (121). In light of such teachings, it would have been obvious to one of ordinary skill in the art at the time the invention was made to form the distribution layers and bond pads with the claimed structure arrangement as taught by Lee for the purpose of providing input/output signals to/from each of the stacked die. Allowable Subject Matter Claim 14 is objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to YU-HSI DAVID SUN whose telephone number is (571)270-5773. The examiner can normally be reached Mon-Fri 8am-4pm ET. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Marlon Fletcher can be reached at 571-272-2063. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /YU-HSI D SUN/ Primary Examiner, Art Unit 2817
Read full office action

Prosecution Timeline

May 08, 2024
Application Filed
Jul 15, 2026
Non-Final Rejection mailed — §102, §103 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12707750
IMAGING ELEMENT AND ELECTRONIC APPARATUS
2y 8m to grant Granted Aug 11, 2026
Patent 12708051
SEMICONDUCTOR PACKAGE
2y 4m to grant Granted Aug 11, 2026
Patent 12702037
BONDING APPARATUS, BONDING METHOD, AND COMPUTER READABLE STORAGE MEDIUM
3y 2m to grant Granted Aug 04, 2026
Patent 12696762
POWER SEMICONDUCTOR MODULE COMPRISING AT LEAST ONE POWER SEMICONDUCTOR ELEMENT
3y 7m to grant Granted Jul 28, 2026
Patent 12690489
SEMICONDUCTOR DEVICE AND METHOD FOR PRODUCING SEMICONDUCTOR DEVICE
3y 11m to grant Granted Jul 21, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
77%
Grant Probability
86%
With Interview (+8.5%)
2y 8m (~4m remaining)
Median Time to Grant
Low
PTA Risk
Based on 871 resolved cases by this examiner. Grant probability derived from career allowance rate.

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