DETAILED ACTION
Notice of Pre-AIA or AIA Status
The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA .
Claim Objections
Claims 3 and 17 are objected to because of the following informalities: Applicant’s arguments indicate that these claims have been canceled, however they remain in the claim listing. The claims should be properly canceled or amended.
Claim Rejections - 35 USC § 103
In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status.
The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action:
A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made.
This application currently names joint inventors. In considering patentability of the claims the examiner presumes that the subject matter of the various claims was commonly owned as of the effective filing date of the claimed invention(s) absent any evidence to the contrary. Applicant is advised of the obligation under 37 CFR 1.56 to point out the inventor and effective filing dates of each claim that was not commonly owned as of the effective filing date of the later invention in order for the examiner to consider the applicability of 35 U.S.C. 102(b)(2)(C) for any potential 35 U.S.C. 102(a)(2) prior art against the later invention.
Claim(s) 11-14 and 16-18 is/are rejected under 35 U.S.C. 103 as being unpatentable over Jiang et al. (US 2003/0134426, hereafter Jiang) in view of Monteiro (US 9,562,430)
With respect to claim 1, Jiang teaches a method comprising: disposing a fluid sampling tool (testing apparatus 710) into a wellbore (714) wherein the fluid sampling tool comprises: at least one probe (sample probe 736) to fluidly connect the fluid sampling tool to a formation (742) in the wellbore; and at least one passageway (channel 722) that passes through the at least one probe and into the fluid sampling tool; drawing a formation fluid from a first sampling zone, as a fluid sample, through the at least one probe and through the at least one passageway; and passing the fluid sample over a thin film (hydrogen sulfide sensor 724) deposited on a measurement region, wherein the measurement region is part of the at least one passageway; analyzing the fluid sample in the fluid sampling tool for a target analyte. (par. 102-107, 114-116, Figs. 6A-7)
Jiang does not explicitly teach wherein the thin film comprises at least one metal selected from the group of metals consisting of a chromium, a tin, an indium, a silver and any combination thereof.
However, it is known to use these elements. For example, Monteiro teaches a fluid sample testing apparatus comprising passing the fluid sample over a thin film, wherein the thin film comprises at least one metal selected from the group of metals consisting of a chromium, a tin, an indium, a silver and any combination thereof. (col. 5, lines 31-58)
It would have been obvious to one having ordinary skill in the art at the time the invention was filed to use a thin film having a composition, as taught by Monteiro, in order to analyze the sample in an efficient and well-understood manner.
With respect to claim 2, Jiang, as modified by Monteiro, teaches wherein the target analyte is hydrogen sulfide, carbon dioxide, mercury, or any combination thereof. (par. 102-116, Figs. 6A-7)
With respect to claim 3, Jiang, as modified by Monteiro, teaches wherein the thin film comprises at least one metal selected from the group of metals consisting of silver, chromium, tin oxide, silver doped with tin oxide, indium tin oxide, and any combination thereof. (par. 10-11)
With respect to claim 4, Jiang, as modified by Monteiro, teaches wherein the thin film has a material change when the target analyte comes into contact with the thin film. (par. 102-116, Figs. 6A-7)
With respect to claim 5, Jiang, as modified by Monteiro, teaches wherein the target analyte is H2S and H2S changes the material property of the thin film in a concentration of more than 1%. (par. 102-116, Figs. 6A-7)
With respect to claim 6, Jiang, as modified by Monteiro, teaches wherein the change of one of the properties of thin film is proportional to the concentration of the target analyte. (par. 102-116, Figs. 6A-7)
With respect to claim 7, Jiang, as modified by Monteiro, teaches wherein the thin film changes optical properties when the target analyte comes into contact with the thin film. (par. 102-116, Figs. 6A-7)
With respect to claim 8, Jiang, as modified by Monteiro, teaches identifying the change in optical properties of the thin film with an optical measurement tool, wherein the change in optical properties is proportional to a concentration of the target analyte, and wherein the concentration of the target analyte can be determined from a linear, multivariate, or non-linear calibration model. (par. 102-116, Figs. 6A-7)
With respect to claim 9, Jiang, as modified by Monteiro, teaches wherein one or more electrical properties of the thin film changes when the target analyte contacts the thin film. (par. 24)
With respect to claim 10, Jiang, as modified by Monteiro, teaches wherein the one or more electrical properties comprise conductance, resistance, or inductance. (par. 24)
With respect to claim 11, Jiang, as modified by Monteiro, teaches passing the fluid sample over a plurality of thin films. (par. 102-116, Figs. 6A-7)
With respect to claim 12, Jiang, as modified by Monteiro, teaches wherein the plurality of thin films are disposed in an array or a pattern. (par. 102-116, Figs. 6A-7)
With respect to claim 13, Jiang, as modified by Monteiro, teaches selecting one or more of the thin films to be measured using a physical mask or a polarized mask. (par. 102-116, Figs. 6A-7)
With respect to claim 14, Jiang, as modified by Monteiro, teaches wherein the pattern is a four-quadrant circle or a unique pattern generated by the physical mask or the polarized mask. (par. 102-116, Figs. 6A-7)
With respect to claim 16, Jiang teaches a system comprising a fluid sampling tool (testing apparatus 710) comprising: at least one probe (sample probe 736) to fluidly connect the fluid sampling tool to a formation in a wellbore; at least one passageway (channel 722) that passes through the at least one probe and into the fluid sampling tool; a sensor section (62) comprising a measurement region in fluid communication with the at least one passageway; and a thin film (hydrogen sulfide sensor 724) deposited on the measurement region, wherein the thin film changes at least one of its physical properties upon exposure to a target analyte found in the at least one passageway. (par. 102-116, Figs. 6A-7)
Jiang does not explicitly teach wherein the thin film comprises at least one metal selected from the group of metals consisting of a chromium, a tin, an indium, a silver and any combination thereof.
However, it is known to use these elements. For example, Monteiro teaches a fluid sample testing apparatus comprising passing the fluid sample over a thin film, wherein the thin film comprises at least one metal selected from the group of metals consisting of a chromium, a tin, an indium, a silver and any combination thereof. (col. 5, lines 31-58)
It would have been obvious to one having ordinary skill in the art at the time the invention was filed to use a thin film having a composition, as taught by Monteiro, in order to analyze the sample in an efficient and well-understood manner.
With respect to claim 17, Jiang, as modified by Monteiro, teaches wherein the thin film comprises at least one metal selected from the group of metals consisting of silver, chromium, tin oxide, silver doped with tin oxide, indium tin oxide, and any combination thereof. (par. 10-11)
With respect to claim 18, Jiang, as modified by Monteiro, teaches wherein the change of the at least one of the physical properties of the thin film is proportional to a concentration of the target analyte. (par. 102-116, Figs. 6A-7)
Claim(s) 15 and 19-20 is/are rejected under 35 U.S.C. 103 as being unpatentable over Jiang in view of Monteiro, as in the above rejection, and further in view of Pelletier et al. (US 2020/0141874, hereafter Pelletier)
With respect to claim 15, Jiang, as modified by Monteiro, teaches all that is claimed, as in the above rejection, except for teaching further resetting the thin film after exposure to the target analyte by annealing the thin film under exposure to a gas transported downhole in a sample chamber.
Pelletier teaches a fluid sensor (backside reflectance sensor 100) having a reactive surface which can be reset after exposure by annealing the surface under exposure to a gas. (par. 37)
It would have been obvious to one having ordinary skill in the art at the time the invention was filed to further modify the invention of Jiang to include surface regeneration, as taught by Pelletier, in order to be able to easily reuse the sensor.
With respect to claim 19, Jiang, as modified by Monteiro, teaches all that is claimed, as in the above rejection, except for teaching at least one sampling chamber filled with a gas used to reset the thin film after exposure to the target analyte.
Pelletier teaches a fluid sensor (backside reflectance sensor 100) having a reactive surface which can be reset after exposure by exposure to a gas. (par. 37)
It would have been obvious to one having ordinary skill in the art at the time the invention was filed to further modify the invention of Jiang to include surface regeneration, as taught by Pelletier, in order to be able to easily reuse the sensor.
With respect to claim 20, Jiang, as modified by Monteiro, teaches all that is claimed, as in the above rejection, except for teaching an annealing system to heat the thin film to reset it after exposure to the target analyte.
Pelletier teaches a fluid sensor (backside reflectance sensor 100) having a reactive surface which can be reset after exposure by annealing the surface. (par. 37)
It would have been obvious to one having ordinary skill in the art at the time the invention was filed to further modify the invention of Jiang to include surface regeneration, as taught by Pelletier, in order to be able to easily reuse the sensor.
Response to Arguments
Applicant’s arguments, filed June 11, 2026 have been fully considered and are persuasive. Although Jiang discusses the use of silver in a hydrogen sulfide detector, the reference does not explicitly disclose all of the claimed elements. Therefore, the rejection has been withdrawn.
However, the claimed subject matter is rendered obvious by other prior art, in particular the teachings of Monteiro, as in the above newly applied rejection.
Conclusion
Any inquiry concerning this communication or earlier communications from the examiner should be directed to Jill E Culler whose telephone number is (571)272-2159. The examiner can normally be reached M-F 8:30-5:00.
Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice.
If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Stephen Meier can be reached at 571-272-2149. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300.
Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000.
/JILL E CULLER/Primary Examiner, Art Unit 2853
Prosecution Insights