Prosecution Insights
Last updated: October 02, 2026
Application No. 18/677,625

DISPLAY DEVICE

Non-Final OA §102
Filed
May 29, 2024
Priority
Jul 31, 2023 — RE 10-2023-0099347
Examiner
ABDELAZIEZ, YASSER A
Art Unit
Tech Center
Assignee
LG Display Co., Ltd.
OA Round
1 (Non-Final)
86%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
89%
With Interview

Examiner Intelligence

Grants 86% — above average
86%
Career Allowance Rate
722 granted / 837 resolved
+26.3% vs TC avg
Minimal +3% lift
Without
With
+3.0%
Interview Lift
resolved cases with interview
Fast prosecutor
2y 1m
Avg Prosecution
31 currently pending
Career history
851
Total Applications
across all art units

Statute-Specific Performance

§101
2.0%
-38.0% vs TC avg
§103
48.4%
+8.4% vs TC avg
§102
28.8%
-11.2% vs TC avg
§112
18.7%
-21.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 837 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Election/Restrictions Applicant election of group I “Claims 1-17”, species I “reading on Claims 1-5, 8-11 and 15-16”, without traverse, is acknowledged. Application points out the Species I, is reading on Claims 18, 19 and 21-24 of the non-elected group II “of Claims 18-24. Currently Claims 1-5, 8-11 and 15-16 are examined on the merit, while Claims 6, 7, 12-14 and 18-24 are withdrawn from consideration. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1, 2 and 17 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by LEE el. Al. (US 2021/0098551), (hereinafter, LEE). RE Claim 1, LEE discloses in FIGS. 1-13 a display device includes a first electrode of a first sub pixel of a first pixel, a first electrode of a second sub pixel of the first pixel, a first electrode of a first sub pixel of a second pixel, and a first electrode of a second sub pixel of the second pixel sequentially disposed along a first direction; a 1-1 welding electrode connected to the first electrode of the first sub pixel of the first pixel, a 1-2 welding electrode connected to the first electrode of the second sub pixel of the first pixel, a 2-1 welding electrode connected to the first electrode of the first sub pixel of the second pixel, and a 2-2 welding electrode connected to the first electrode of the second sub pixel of the second pixel; and a first vertical repair line overlapping the 1-1 welding electrode and the 2-1 welding electrode and a second vertical repair line overlapping the 1-2 welding electrode and the 2-2 welding electrode, wherein the first vertical repair line and the second vertical repair line include a transparent conductive material. LEE discloses a display device comprising: a substrate “SUB” having thereon a plurality of pixel areas “EA” and a plurality of transmissive areas “TA”, the plurality of pixel areas “EA” disposed to be spaced apart from each other, referring to FIG. 4, and the plurality of transmissive areas “TA” disposed between the plurality of pixel areas “EA”; a plurality of pixels disposed in the plurality of pixel areas, the plurality of pixels each including a plurality of sub pixels “PXL”, referring to FIG.; and a plurality of repair lines “RA; RA1/RA2/RA3/RA4”, disposed between the plurality of sub pixels “PXL” [0011 and 0119], the plurality of repair lines “RA; RA1/RA2/RA3/RA4” including a transparent conductive material [abstract], wherein the plurality of repair lines “RA; RA1/RA2/RA3/RA4” is disposed on a same layer and spaced apart from each other, referring to FIGS. 4, 6A, 6B, 7A and 7B [0080, 0088, 0090 and 0091]. Examiner notes that the repair lines RA1/RA2/RA3/RA4 are formed on the immediate layer above the buffer layer BUF and vertical overlap “OV” repair lines RA1/RA2/RA3/RA4 are formed in the same layer PAS and connected to the repair lines RA1/RA2/RA3/RA4, hence meeting the claimed limitation. RE Claim 2, LEE discloses display device, further comprising: at least some of the plurality of repair lines “RA; RA1/RA2/RA3/RA4” overlap the plurality of transmissive areas “TA” from a plan view, referring to FIG. 4. RE Claim 17, LEE discloses display device, further comprising: a plurality of data lines “130” DL extending in a column direction on the substrate SUB, referring to FIG. 1, wherein the plurality of pixel areas 150 overlaps an area in which the plurality of data lines is disposed, referring to FIG. 1. Allowable Subject Matter Claims 3-5, 8-11 and 15-16 are objected to as being dependent upon a rejected base claim but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. In the instant case, LEE et al. (US 2021/0098557) discloses a display device including a substrate on which reference lines extending in a first direction are disposed; first sub pixels which include a first circuit area disposed at one side of the reference lines and a first emission area disposed at another side of the reference lines; second sub pixels which include a second emission area disposed at one side of the reference lines and a second circuit area disposed at another side of the reference lines; first data lines which extend in the first direction and are disposed to be spaced apart from the reference lines; and second data lines which extend in the first direction and are disposed to be spaced apart from the reference lines. Accordingly, the reference line and the data line are disposed at both sides of the circuit area so that the reference line and the data line do not overlap and the ripple phenomenon and the dim phenomenon can be improved. Any inquiry concerning this communication or earlier communications from the examiner should be directed to YASSER ABDELAZIEZ whose telephone number is (571)270-5783. The examiner can normally be reached Monday - Friday 9 am - 6 pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Leonard Chang can be reached at (571)270-3691. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /YASSER A ABDELAZIEZ, PhD/Primary Examiner, Art Unit 2898
Read full office action

Prosecution Timeline

May 29, 2024
Application Filed
Sep 15, 2026
Non-Final Rejection mailed — §102 (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
86%
Grant Probability
89%
With Interview (+3.0%)
2y 1m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 837 resolved cases by this examiner. Grant probability derived from career allowance rate.

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