Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2812 2898
This examiner grants 86% of resolved cases
Yasser A. Abdelaziez is a high-volume examiner in Tech Center 2800 and Art Unit 2812, with 835 resolved cases. The allowance rate of 86.2 percent indicates a very favorable and consistent environment for applicants. The large number of cases provides high confidence in these performance metrics.
The median days to allowance is 786. This efficient timeline, combined with the 86.2 percent allowance rate, suggests that the examiner is both productive and inclined toward granting patents. The 835 resolved cases show a clear pattern of successful and timely outcomes.
The interview lift is 3.1 percent. While the benefit of an interview is statistically small, the overall probability of success is already high. Practitioners can rely on the 86.2 percent allowance rate and the 786-day median pendency as reliable indicators of the prosecution experience.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18677625 | DISPLAY DEVICE | Non-Final OA | LG Display Co., Ltd. |
| 17975379 | DISPLAY PANEL AND DISPLAY DEVICE INCLUDING THE SAME | Non-Final OA | LG Display Co., Ltd. |
| 18668786 | ELECTRONIC DEVICE | Non-Final OA | InnoLux Corporation |
| 18479966 | DEPOSITION MASK, AND METHOD FOR PRODUCING ORGANIC LIGHT-EMITTING ELEMENT | Non-Final OA | CANON KABUSHIKI KAISHA |
| 18039202 | METHOD OF FORMING A THIN FILM | Final Rejection | Microsoft Technology Licensing, LLC |
| 18045181 | FORMING SOURCE/DRAIN REGION IN STACKED FET STRUCTURE | Final Rejection | INTERNATIONAL BUSINESS MACHINES CORPORATION |
| 18471777 | SEMICONDUCTOR DEVICE AND METHOD OF PRODUCING THEREOF | Non-Final OA | Infineon Technologies AG |
| 18480195 | SEMICONDUCTOR DEVICE AND METHOD OF PRODUCING A CAVITY IN A TRENCH | Non-Final OA | Infineon Technologies Austria AG |
| 18642992 | Content Addressable Memory Cells | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18661935 | MICRO-ELECTROMECHANICAL SYSTEM DEVICE INCLUDING A PRECISION PROOF MASS ELEMENT AND METHODS FOR FORMING THE SAME | Non-Final OA | Taiwan Semiconductor Manufacturing Company Limited |
| 18888508 | SEMICONDUCTOR STRUCTURE AND METHOD OF MANUFACTURING THE SAME | Non-Final OA | NANYA TECHNOLOGY CORPORATION |
| 18752807 | RESISTIVE RANDOM ACCESS MEMORY DEVICE AND FABRICATION METHOD THEREOF | Non-Final OA | UNITED MICROELECTRONICS CORP. |
| 17953336 | SEMICONDUCTOR STRUCTURE AND FABRICATING METHOD OF THE SAME | Final Rejection | UNITED MICROELECTRONICS CORP. |
| 18602261 | IMAGE SENSOR PACKAGES AND RELATED METHODS | Non-Final OA | SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC |
| 18623233 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | Non-Final OA | Amkor Technology Singapore Holding Pte. Ltd. |
IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.
Build Your Strategy