Prosecution Insights
Last updated: April 19, 2026
Application No. 18/678,028

CIRCUIT BOARD

Non-Final OA §102§112
Filed
May 30, 2024
Examiner
WILLIS, TREMESHA S
Art Unit
2847
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Chipbond Technology Corporation
OA Round
1 (Non-Final)
78%
Grant Probability
Favorable
1-2
OA Rounds
2y 6m
To Grant
95%
With Interview

Examiner Intelligence

Grants 78% — above average
78%
Career Allow Rate
679 granted / 873 resolved
+9.8% vs TC avg
Strong +18% interview lift
Without
With
+17.5%
Interview Lift
resolved cases with interview
Typical timeline
2y 6m
Avg Prosecution
44 currently pending
Career history
917
Total Applications
across all art units

Statute-Specific Performance

§101
0.2%
-39.8% vs TC avg
§103
31.6%
-8.4% vs TC avg
§102
49.7%
+9.7% vs TC avg
§112
16.8%
-23.2% vs TC avg
Black line = Tech Center average estimate • Based on career data from 873 resolved cases

Office Action

§102 §112
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 112 The following is a quotation of 35 U.S.C. 112(b): (b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention. Claim 1 is rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention. In particular, regarding the recitation “the second conductive section is located between the first and third conductive sections and connected to the outer lead of the first conductive section and the third conductive section” on lines 7 – 9, it is unclear as to whether the second conductive section is connected to the outer lead of the third conductive section, or whether the second conductive section is connected to the third conductive section. There is no previous recitation of the third conductive section including an outer lead, thus Examiner is assuming that the second conductive section is merely conducted to the third conductive section (and not the outer lead of the third conductive section). Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1 – 14 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Ban et al. (U.S. Patent Publication No. 2008/0116546). Regarding claim 1, in Figure 11, Bang discloses a circuit board comprising: a substrate (100) having a surface, a first area (area right of die pad 10), a second area and (middle area containing the die pad 10) a third area (area left of die pad 10) are defined on the surface, and the second area is located between the first and third areas in a first direction for transporting the circuit board (Figure 11); a plurality of circuit lines each including a first conductive section (20, 30) arranged on the first area, a second conductive section (210) arranged on the second area and a third conductive section (20, 30, unlabeled) arranged on the third area, the first conductive section includes an inner lead (20) and an outer lead (30), the second conductive section is located between the first and third conductive sections (Figure 11) and connected to the outer lead of the first conductive section (via inner lead 20) and the third conductive section (Figure 11); and a protective layer (41, 51, 44, 54) configured to cover the first and third conductive sections, wherein the second conductive section, the inner lead and the outer lead of the first conductive section are not covered by the protective layer(Figure 11). Regarding claim 2, Bang discloses wherein the protective layer includes a first protective portion, at least one second protective portion and a hollow portion which is located between the first protective portion and the at least one second protective portion, the first protective portion is configured to cover the first conductive section, the inner lead and the outer lead of the first conductive section are not covered by the first protective portion, the at least one second protective portion is configured to cover the third conductive section, the hollow portion is configured to expose the outer lead of the first conductive section and the second conductive section, a predetermined cutting line is configured to run through the hollow portion and be located between the first protection portion and the at least one second protective portion to separate the circuit board into a part to be reserved and a part to be removed, the outer lead is located between the first protective portion and the predetermined cutting line, the first conductive section and the first protective portion covering the first conductive section are located on the part to be reserved, the second conductive section, the third conductive section and the at least one second protective portion covering the third conductive section are located on the part to be removed (Figure 11). Regarding claim 3, Bang discloses wherein a test pad of the third conductive section is not covered by the at least one second protective portion (Figure 11). Regarding claim 4, Bang discloses wherein the protective layer includes two second protective portions, and the first protective portion is located between the two protective portions (Figure 11). Regarding claim 5, Bang discloses wherein a first distance between the first protective portion and the at least one second protective portion along the first direction is greater than or equal to 0.5 µm and less than or equal to 2 µm (Figure 11). Regarding claim 6, Bang discloses wherein a test pad of the third conductive section is not covered by the at least one second protective portion, a second distance between the at least one second protective portion and an end of the test pad along the first direction is greater than or equal to 0.5 µm and less than or equal to 2 µm (Figure 11). Regarding claim 7, Bang discloses wherein the at least one second protective portion extends along a second direction intersecting the first direction (Figure 11). Regarding claim 8, Bang discloses wherein the at least one second protective portion includes a plurality of protrusions, a third distance between the adjacent protrusions along a second direction intersecting the first direction is greater than or equal to 0.5 µm and less than or equal to 158 mm (Figure 11). Regarding claim 9, Bang discloses wherein a fourth distance between the adjacent protrusions along the first direction is greater than or equal to 0.5 µm and less than or equal to 50 mm (Figure 11). Regarding claim 10, Bang discloses wherein the at least one second protective portion includes a plurality of protrusions, and a fourth distance between the adjacent protrusions along the first direction is greater than or equal to 0.5 µm and less than or equal to 50 mm (Figure 11). Regarding claim 11, Bang discloses wherein the at least one second protective portion includes a plurality of protrusions, and a fourth distance between the adjacent protrusions along the first direction is greater than or equal to 0.5 µm and less than or equal to 50 mm (Figure 11). Regarding claim 12, Bang discloses wherein a top surface and a lateral surface of the third conductive section are covered by the at least one second protective portion, the surface of the substrate where is between the third conductive sections of the adjacent circuit lines are covered by the at least one second protective portion, a thickness of the at least one second protective portion covering the top surface of the third conductive section is greater than or equal to 0.5 µm and less than or equal to 50 µm (Figure 11). Regarding claim 13, Bang discloses wherein each of the plurality of circuit lines includes a copper layer and a tin layer which is located between the copper layer and the at least one second protective portion (Figure 11). Regarding claim 14, Bang discloses wherein a first edge of the at least one second protective portion is closer to the first protective portion than a second edge of the at least one second protective portion, a fifth distance from the first edge to the second edge is greater than or equal to 0.5 µm and less than or equal to 50 mm (Figure 11). Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to TREMESHA W BURNS whose telephone number is (571)270-3391. The examiner can normally be reached Monday-Friday 8am - 4:30 pm EST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Timothy Thompson can be reached at (571) 272-2342. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. TREMESHA W. BURNS Primary Examiner Art Unit 2847 /TREMESHA W BURNS/Primary Examiner, Art Unit 2847
Read full office action

Prosecution Timeline

May 30, 2024
Application Filed
Feb 01, 2026
Non-Final Rejection — §102, §112 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

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COPPER CLAD LAMINATE AND METHOD FOR PRODUCING THE SAME
2y 5m to grant Granted Apr 14, 2026
Patent 12604446
INTEGRATED DEVICE PACKAGE WITH REDUCED THICKNESS
2y 5m to grant Granted Apr 14, 2026
Patent 12604410
ELECTRONIC COMPONENT
2y 5m to grant Granted Apr 14, 2026
Patent 12598702
PRINTED CIRCUIT BOARD
2y 5m to grant Granted Apr 07, 2026
Patent 12598826
IMAGE SENSOR ASSEMBLY
2y 5m to grant Granted Apr 07, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
78%
Grant Probability
95%
With Interview (+17.5%)
2y 6m
Median Time to Grant
Low
PTA Risk
Based on 873 resolved cases by this examiner. Grant probability derived from career allow rate.

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