Prosecution Insights
Last updated: October 02, 2026
Application No. 18/679,410

SYSTEMS AND METHODS FOR HIGH BANDWIDTH MEMORY CONFIGURATIONS

Non-Final OA §102
Filed
May 30, 2024
Priority
Dec 11, 2023 — provisional 63/608,822
Examiner
PHAM, LONG
Art Unit
Tech Center
Assignee
Samsung Electronics Co., Ltd.
OA Round
1 (Non-Final)
92%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
97%
With Interview

Examiner Intelligence

Grants 92% — above average
92%
Career Allowance Rate
1530 granted / 1671 resolved
+31.6% vs TC avg
Moderate +6% lift
Without
With
+5.5%
Interview Lift
resolved cases with interview
Typical timeline
2y 4m
Avg Prosecution
40 currently pending
Career history
1697
Total Applications
across all art units

Statute-Specific Performance

§101
0.1%
-39.9% vs TC avg
§103
42.7%
+2.7% vs TC avg
§102
39.7%
-0.3% vs TC avg
§112
10.3%
-29.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1671 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Election/Restrictions Applicant’s election without traverse of claims 12-20 in the reply filed on 7/13/26 is acknowledged. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 12-16 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Lanka et al. (US pub 20210225827). With respect to claim 12, Lanka et al. teach a memory package comprising (see figs. 1-11, particularly fig. 1A-1B and associated text): a first memory physical layer (PHY) interface (right HBM, third HBM from top) positioned on a surface of a compute die (right HBM, 4th HBM from top); a first memory (right HBM, second HBM from top) connected to the first memory PHY interface of the compute die via a first through-silicon via (TSV) connection (connectors through the HBM); a base die (left HBM, 4th HBM from top) coupled with the compute die and positioned on a silicon interposer (interposer, see para 0044), wherein the compute die is positioned on the silicon interposer and connected to the base die via the silicon interposer; and a second memory (left HBM, third from top) connected to the base die. With respect to claim 13, Lanka et al. teach the first memory comprises a first memory die (right HBM, third HBM from top) stacked on the first memory PHY interface and a second memory die (right HBM, top HBM) stacked on the first memory die. See figs. 1A-1B and associated text. With respect to claim 14, Lanka et al. teach the first memory die connects to the first memory PHY interface via the first TSV connection, and the second memory die connects to the first memory die via the first TSV connection. See figs. 1A-1B and associated text. With respect to claim 15, Lanka et al. teach the second memory comprises a third memory die (left HBM, third from top) stacked on the base die and a fourth memory die (left HBM, second from top) stacked on the third memory die. See figs. 1A-1B and associated text. With respect to claim 16, Lanka et al. teach the third memory die connects to the base die via a second TSV connection (vias from left HBM), and the fourth memory die connect to the third memory die via the second TSV connection. See figs. 1A-1B and associated text. Claim(s) 18-20 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Lanka et al. (US pub 20210225827). With respect to claim 18, Lanka et al. teach a system on chip (SoC) comprising (see figs. 1-11, particularly fig. 1A-1B and associated text): a compute die (right HBM, 4th HBM from top) positioned on a silicon interposer (interposer, see para 0044); a base die (left HBM, 4th HBM from top) coupled with the compute die and positioned on the silicon interposer; and a memory coupled with the compute die and the base die, the memory comprising: a first memory physical layer (PHY) interface (right HBM, third HBM from top) positioned on a surface of the compute die; a first memory (right HBM, second HBM from top) connected to the first memory PHY interface of the compute die via a first through-silicon via (TSV) connection (connectors through the HBM); and a second memory (left HBM, third from top) connected to the base die via a second TSV connection. With respect to claim 19, Lanka et al. teach the first memory comprises a first memory die (right HBM, third HBM from top) stacked on the first memory PHY interface and a second memory die (right HBM, top HBM) stacked on the first memory die. See figs. 1A-1B and associated text. With respect to claim 20, Lanka et al. teach the first memory die connects to the first memory PHY interface via the first TSV connection, and the second memory die connects to the first memory die via the first TSV connection. See figs. 1A-1B and associated text. Allowable Subject Matter Claim 17 is objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Examiner’s Cited References The cited references generally show the similar or related structure having a first memory stack and a second memory stack over an interposer and connected via the interposer, where a bottom die of the second memory stack having a memory layer connected to a top die, where a bottom die of the first memory stack connected to a top die as presently claimed by applicant. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to LONG PHAM whose telephone number is (571)272-1714. The examiner can normally be reached Mon-Friday. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Jacob Choi can be reached at 469-295-9060. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. LONG . PHAM Examiner Art Unit 2823 /LONG PHAM/Primary Examiner, Art Unit 2897
Read full office action

Prosecution Timeline

May 30, 2024
Application Filed
Sep 17, 2026
Non-Final Rejection mailed — §102 (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
92%
Grant Probability
97%
With Interview (+5.5%)
2y 4m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1671 resolved cases by this examiner. Grant probability derived from career allowance rate.

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